JPH0464714U - - Google Patents

Info

Publication number
JPH0464714U
JPH0464714U JP10884890U JP10884890U JPH0464714U JP H0464714 U JPH0464714 U JP H0464714U JP 10884890 U JP10884890 U JP 10884890U JP 10884890 U JP10884890 U JP 10884890U JP H0464714 U JPH0464714 U JP H0464714U
Authority
JP
Japan
Prior art keywords
target object
speckle
laser beam
casing
image signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10884890U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10884890U priority Critical patent/JPH0464714U/ja
Publication of JPH0464714U publication Critical patent/JPH0464714U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係る測定ヘツドの一部破断分
解斜視図、第2図は半導体レーザユニツトの分解
斜視図、第3図は半導体レーザとコリメータレン
ズの位置関係を説明する側面図、第4図は窓の傾
斜状態を説明する側面図、第5図は一次元イメー
ジセンサーの位置を説明する正面図、第6図は電
子冷却装置の断面図、第7図は外部回路のブロツ
ク図、第8図は一次元イメージセンサー上の光強
度分布を示すグラフ、第9図は本考案の作用効果
を説明する図、第10図は対象物体の移動量とイ
メージセンサー上でのスペツクルパターンの移動
量の一般的関係を説明する図である。 1……測定ヘツド、10……ケーシング、14
……窓、21……半導体レーザ、25……コリメ
ータレンズ、16……偏光フイルター、4……イ
メージセンサー。
FIG. 1 is a partially cutaway exploded perspective view of a measurement head according to the present invention, FIG. 2 is an exploded perspective view of a semiconductor laser unit, FIG. 3 is a side view illustrating the positional relationship between the semiconductor laser and the collimator lens, and FIG. 5 is a front view illustrating the position of the one-dimensional image sensor; FIG. 6 is a sectional view of the electronic cooling device; FIG. 7 is a block diagram of the external circuit; Figure 8 is a graph showing the light intensity distribution on the one-dimensional image sensor, Figure 9 is a diagram explaining the effects of the present invention, and Figure 10 is the amount of movement of the target object and the movement of the speckle pattern on the image sensor. It is a figure explaining the general relationship of quantity. 1...Measuring head, 10...Casing, 14
... window, 21 ... semiconductor laser, 25 ... collimator lens, 16 ... polarizing filter, 4 ... image sensor.

Claims (1)

【実用新案登録請求の範囲】 測定の対象となる物体の表面に直線偏光レー
ザビームを照射し、該対象物体のレーザ照射面に
対向した観測面に表われるスペツクルパターンを
受光してイメージ信号に光電変換し、対象物体の
移動に伴う前記イメージ信号の変化に基づいて対
象物体の移動量を測定するスペツクル測長計に於
いて、ケーシング10内の所定位置に、半導体レ
ーザ21と、該半導体レーザ21からのレーザ光
を集光してレーザビームを形成するコリメータレ
ンズ25と、対象物体からの反射光を受光してス
ペツクルパターンをイメージ信号に変換するイメ
ージセンサー4とを収容して測定ヘツド1を構成
し、ケーシング10には、コリメータレンズ25
からのレーザビーム8を出射すべく窓14を設け
ると共に、対象物体7からイメージセンサー4へ
至る反射光81の光路中に、出射レーザビーム8
の偏光方向とは直交或いは略直交する偏光方向を
有する偏光フイルター16を配置したことを特徴
とするスペツクル測長計の測定ヘツド構造。 偏光フイルター16はケーシング10に対し
て着脱可能に取り付けられている請求項1に記載
のスペツクル測長計の測定ヘツド構造。
[Claim for Utility Model Registration] A linearly polarized laser beam is irradiated onto the surface of an object to be measured, and a speckle pattern appearing on an observation surface opposite to the laser irradiation surface of the object is received and converted into an image signal. In a speckle length measuring meter that performs photoelectric conversion and measures the amount of movement of a target object based on a change in the image signal accompanying the movement of the target object, a semiconductor laser 21 is disposed at a predetermined position within the casing 10; The measuring head 1 is constructed by accommodating a collimator lens 25 that condenses laser light from a target object to form a laser beam, and an image sensor 4 that receives reflected light from a target object and converts the speckle pattern into an image signal. The casing 10 includes a collimator lens 25.
A window 14 is provided to emit the laser beam 8 from the target object 7, and the emitted laser beam 8 is provided in the optical path of the reflected light 81 from the target object 7 to the image sensor 4.
A measurement head structure of a speckle length measuring meter, characterized in that a polarizing filter 16 having a polarization direction perpendicular or substantially perpendicular to the polarization direction of the speckle length meter is disposed. The measuring head structure of a speckle length measuring meter according to claim 1, wherein the polarizing filter (16) is detachably attached to the casing (10).
JP10884890U 1990-10-16 1990-10-16 Pending JPH0464714U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10884890U JPH0464714U (en) 1990-10-16 1990-10-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10884890U JPH0464714U (en) 1990-10-16 1990-10-16

Publications (1)

Publication Number Publication Date
JPH0464714U true JPH0464714U (en) 1992-06-03

Family

ID=31855990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10884890U Pending JPH0464714U (en) 1990-10-16 1990-10-16

Country Status (1)

Country Link
JP (1) JPH0464714U (en)

Similar Documents

Publication Publication Date Title
JPS6262908U (en)
JPH0464714U (en)
JPH0464713U (en)
JPH0352606U (en)
WO1992019931A1 (en) An optoelectronic measuring scale
JP3327002B2 (en) Method for measuring resin content of electronic components
JPH01144809U (en)
JPH03237303A (en) Measuring head structure for speckle length measuring instrument
JPH03109123U (en)
JPH01144808U (en)
JPH0447611U (en)
JPH0316630U (en)
JPS645108U (en)
JPS6466502A (en) Length measurement by reflected light
JPH01144810U (en)
JPS63122211U (en)
JPH0325106U (en)
JPH0413911U (en)
JPH022686U (en)
JPS637305U (en)
JPH0291908U (en)
JPH0216010U (en)
JPS57153206A (en) Light interference measuring device
JPH01105804U (en)
JPH0424541U (en)