JPH0476468A - Coil test method and device thereof - Google Patents
Coil test method and device thereofInfo
- Publication number
- JPH0476468A JPH0476468A JP19135290A JP19135290A JPH0476468A JP H0476468 A JPH0476468 A JP H0476468A JP 19135290 A JP19135290 A JP 19135290A JP 19135290 A JP19135290 A JP 19135290A JP H0476468 A JPH0476468 A JP H0476468A
- Authority
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- Japan
- Prior art keywords
- waveform
- voltage
- coil
- measured
- damped oscillating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010998 test method Methods 0.000 title 1
- 238000012360 testing method Methods 0.000 claims description 26
- 238000005259 measurement Methods 0.000 abstract description 7
- 230000000694 effects Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 206010047571 Visual impairment Diseases 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Description
【 産業上の利用分野 】
本発明は、コイルの電気的特性をインパルス電圧を加え
ることにより非破壊にて測定または試験するコイル試験
方法と装置に関する。[Field of Industrial Application] The present invention relates to a coil testing method and apparatus for non-destructively measuring or testing the electrical characteristics of a coil by applying an impulse voltage.
従来の、コイルの電気的特性をインパルス電圧を加える
ことにより非破壊にて測定または試験するコイル試験器
としては、基準コイルと被測定コイルの両方に高圧イン
パルス電圧を印加し、前記基準コイルにおいて発生した
自己減衰振動波形と被測定コイルにおいて発生した自己
減衰振動波形とを比較して当該コイルの特性を知るよう
に構成したコイル試験方法があった。
また、特願平１−２３４１１９の明細書に開示したよう
に、基準コイルの波形データを一旦メモリに記憶させ、
読みだす時に上下に所定の偏差を持った上限波形と下限
波形とを生成して、測定波形がその間に収まっているが
否かをコンパレータによって比較することもできる。Conventional coil testers non-destructively measure or test the electrical characteristics of a coil by applying an impulse voltage. There is a coil testing method in which the characteristics of the coil are determined by comparing the self-damped vibration waveform generated in the coil to be measured with the self-damped vibration waveform generated in the coil to be measured. Furthermore, as disclosed in the specification of Japanese Patent Application No. 1-234119, the waveform data of the reference coil is temporarily stored in a memory,
It is also possible to generate an upper limit waveform and a lower limit waveform with a predetermined vertical deviation when reading out, and to compare whether the measured waveform falls within the range or not using a comparator.
しかし、従来の方法では、基準コイルは、多数のコイル
を順次試験する度に高圧インパルス電圧が印加されるの
で劣化しゃすくなり、多数の被測定コイルの検査の途中
で基準コイルの特性が変化して正確な測定ができないと
いう問題がある。
加えて、劣化した基準コイルを新たな別の基準コイルに
取り替えると、い（ら特性の近い別のコイルを基準コイ
ルとして選定しても若干の相違があるので、同一仕様の
コイルの測定に異なる特性の基準コイルを使用すること
になり、正確な測定ができないという問題がある。However, in the conventional method, the reference coil is susceptible to deterioration because a high-voltage impulse voltage is applied each time a large number of coils are tested one after another, and the characteristics of the reference coil change during the test of a large number of coils under test. There is a problem that accurate measurements cannot be made. In addition, if you replace a deteriorated reference coil with a new reference coil, there will be some differences even if you select another coil with similar characteristics as the reference coil, so measurements of coils with the same specifications may differ. There is a problem in that accurate measurements cannot be made because a reference coil with different characteristics is used.
【 課題を解決するための手段 ］
そこで、本発明では、基準コイルにインパルス電圧を印
加して発生させた減衰振動電圧波形と、被測定コイルに
インパルス電圧を印加して発生させた減衰振動電圧波形
とを比較して、当該被測定コイルの良否を判断するコイ
ル試験方法において、前記基準コイルに印加するインパ
ルス電圧を被測定コイルに印加するインパルス電圧より
も低い電圧とするようにした。
また、基準コイルから得られた減衰振動電圧波形を振幅
軸方向の上方にンフト若しくは拡大して上限波形を得、
同減衰振動電圧波形を下方にシフト若しくは縮小して下
限波形を得、これらの両波形を被測定コイルから得られ
る減衰振動電圧波形と同一表示装置に表示するようにし
ても良い。
また、基準コイルから得られた減衰振動電圧波形を振幅
軸方向の上方にシフト若しくは拡大して上限波形を得、
同減衰振動電圧波形を下方にシフト若しくは縮小して下
限波形を得、被測定コイルから得られる減衰振動電圧波
形を前記両波形に同期させて発生させ、前記減衰振動電
圧波形が前記上限波形以下且つ前記下限波形以上である
とき前記測定コイルが良品であると判定するようにして
も良い。
そして、本発明にかかるコイル試験装置においては、高
圧インパルス電圧を発生する手段と、低圧インパルス電
圧を発生する手段と、被測定コイルに前記高圧インパル
ス電圧を印加して測定減衰振動電圧波形を取り出す手段
と、基準コイルに前記低圧インパルス電圧を印加して基
準減衰振動電圧波形を取り出す手段と、前記測定減衰振
動電圧波形を振幅軸方向に縮小もしくは前記基準減衰振
動電圧波形を振幅軸方向に拡大することによって両波形
の振幅を整合させる振幅整合手段とを備えるという手段
を講じた。
また、高圧インパルス電圧を発生する手段と、低圧イン
パルス電圧を発生する手段と、被測定コイルに前記高圧
インパルス電圧を印加して測定減衰振動電圧波形を取り
出す手段と、基準コイルに前記低圧インパルス電圧を印
加して基準減衰振動電圧波形を取り出す手段と、前記測
定減衰振動電圧波形を振幅軸方向に縮小もしくは前記基
準減衰振動電圧波形を振幅軸方向に拡大することによっ
て両波形の振幅を整合させる振幅整合手段と、振幅が整
合された基準減衰振動電圧波形を振幅軸の正の方向に所
定偏差だけシフトさせて上限波形を生成する上限波形生
成手段と、振幅が整合された基準減衰振動電圧波形を振
幅軸の負の方向に所定偏差だけシフトさせて下限波形を
生成する下限波形生成手段と、振幅が整合された測定減
衰振動電圧波形が前記上限波形と前記下限波形との間に
あるか否かを比較する比較手段とを備えるという手段を
講しても良い。
【 作用 】
本発明は、良好なコイルにおいては、そのコイルから得
られる減衰振動電圧波形は、印加したインパルス電圧の
高低によらず振幅方向に拡大／縮小すれば一致するとい
う現象を利用することによって、基準コイルには低圧の
インパルス電圧を印加して基準となる減衰振動電圧波形
を得るようにしたのである。
即ち、被測定コイルには高圧のインパルス電圧を加えて
測定波形となる減衰振動電圧波形を発生させるが、基準
コイルには低圧のインパルス電圧を加えて基準波形とな
る減衰振動電圧波形を発生させ、前記基準波形と前記測
定波形とを振幅軸方向に拡大／縮小して振幅を一致させ
ることにより、両波形を比較するのである。
そこで、測定波形にレアショートやコロナ放電による波
形の乱れがあれば発見されるのである。
また、基準コイルの減衰振動電圧波形と被測定コイルの
減衰振動電圧波形を振幅整合させるとともに、基準減衰
振動電圧波形を上下にシフトさせることによって上限波
形と下限波形にはさまれたウィンドウを生成するので、
被測定コイルから得られた減衰振動電圧波形が前記ウィ
ンドウの中に収まっていれば当該被測定コイルは良品と
判定できる。
そして、本発明によるコイル試験装置によれば、高圧イ
ンパルス電圧を発生させて被測定コイルに印加して測定
減衰振動電圧波形を発生させ、低圧インパルス電圧を発
生させて基準コイルに印加して基準減衰振動電圧波形を
発生させ、振幅整合手段によって前記測定減衰振動電圧
波形を振幅軸方向に縮小もしくは前記基準減衰振動電圧
波形を振幅軸方向に拡大することによって両波形の振幅
を整合させるので、測定減衰振動電圧波形にレアショー
トやコロナ放電による波形の乱れがあれば基準減衰振動
電圧波形と異なることで発見されるのである。
また、測定減衰振動電圧波形が上限波形と下限波形の間
にあることを比較手段によって検知できるので、被測定
コイルの良否を判定できるのである。[Means for Solving the Problems] Therefore, in the present invention, a damped oscillating voltage waveform generated by applying an impulse voltage to a reference coil and a damped oscillating voltage waveform generated by applying an impulse voltage to a coil to be measured are provided. In the coil testing method for determining the quality of the coil to be measured by comparing the coil to be measured, the impulse voltage applied to the reference coil is set to be lower than the impulse voltage applied to the coil to be measured. In addition, the damped oscillating voltage waveform obtained from the reference coil is expanded or expanded upward in the amplitude axis direction to obtain an upper limit waveform,
The same damped oscillating voltage waveform may be shifted or reduced downward to obtain a lower limit waveform, and both of these waveforms may be displayed on the same display device as the damped oscillating voltage waveform obtained from the coil to be measured. In addition, the damped oscillating voltage waveform obtained from the reference coil is shifted or expanded upward in the amplitude axis direction to obtain an upper limit waveform,
The damped oscillating voltage waveform is shifted or reduced downward to obtain a lower limit waveform, and a damped oscillating voltage waveform obtained from the coil to be measured is generated in synchronization with both of the waveforms, so that the damped oscillating voltage waveform is equal to or less than the upper limit waveform and It may be determined that the measuring coil is a good product when the waveform is equal to or higher than the lower limit waveform. The coil testing device according to the present invention includes means for generating a high-voltage impulse voltage, means for generating a low-voltage impulse voltage, and means for applying the high-voltage impulse voltage to the coil to be measured and extracting a measured damped oscillating voltage waveform. and means for extracting a reference damped oscillating voltage waveform by applying the low-voltage impulse voltage to a reference coil, and reducing the measured damped oscillating voltage waveform in the amplitude axis direction or expanding the reference damped oscillating voltage waveform in the amplitude axis direction. We have taken a measure to provide an amplitude matching means for matching the amplitudes of both waveforms. The invention also includes means for generating a high-voltage impulse voltage, means for generating a low-voltage impulse voltage, means for applying the high-voltage impulse voltage to a coil to be measured and extracting a measured damped oscillating voltage waveform, and applying the low-voltage impulse voltage to a reference coil. means for applying and extracting a reference damped oscillating voltage waveform; and amplitude matching for matching the amplitudes of both waveforms by reducing the measured damped oscillating voltage waveform in the amplitude axis direction or expanding the reference damped oscillating voltage waveform in the amplitude axis direction. means for generating an upper limit waveform by shifting the amplitude-matched reference damped oscillating voltage waveform by a predetermined deviation in the positive direction of the amplitude axis; a lower limit waveform generation means for generating a lower limit waveform by shifting the waveform by a predetermined deviation in the negative direction of the axis; and a lower limit waveform generating means for generating a lower limit waveform by shifting the waveform by a predetermined deviation in the negative direction of the axis; It is also possible to provide a comparison means for comparison. [Operation] The present invention utilizes the phenomenon that in a good coil, the damped oscillating voltage waveform obtained from the coil will match if it is expanded/reduced in the amplitude direction, regardless of the level of the applied impulse voltage. A low-voltage impulse voltage is applied to the reference coil to obtain a damped oscillating voltage waveform that serves as a reference. That is, a high-voltage impulse voltage is applied to the coil to be measured to generate a damped oscillating voltage waveform that becomes the measurement waveform, while a low-voltage impulse voltage is applied to the reference coil to generate a damped oscillating voltage waveform that becomes the reference waveform. By enlarging/reducing the reference waveform and the measurement waveform in the amplitude axis direction to match the amplitudes, the two waveforms are compared. Therefore, if there is any disturbance in the measured waveform due to layer short or corona discharge, it will be discovered. Also, by matching the amplitudes of the damped oscillating voltage waveform of the reference coil and the damped oscillating voltage waveform of the measured coil, and by shifting the reference damped oscillating voltage waveform up and down, a window sandwiched between the upper limit waveform and the lower limit waveform is generated. So,
If the damped oscillating voltage waveform obtained from the coil to be measured falls within the window, the coil to be measured can be determined to be a good product. According to the coil testing device according to the present invention, a high voltage impulse voltage is generated and applied to the coil to be measured to generate a measured damped oscillating voltage waveform, and a low voltage impulse voltage is generated and applied to the reference coil to generate a reference damped voltage waveform. An oscillating voltage waveform is generated, and the amplitude matching means reduces the measured damped oscillating voltage waveform in the amplitude axis direction or expands the reference damped oscillating voltage waveform in the amplitude axis direction, thereby matching the amplitudes of both waveforms. If there is any disturbance in the oscillating voltage waveform due to layer short or corona discharge, it will be discovered because it differs from the reference damped oscillating voltage waveform. Furthermore, since the comparing means can detect that the measured damped oscillating voltage waveform is between the upper limit waveform and the lower limit waveform, it is possible to determine whether the coil to be measured is good or bad.
以下に本発明にかかるコイル試験方法とその方法に用い
る装置の好適な実施例を図面に基づいて詳説する。
第１図は本発明のコイル試験装置の実施例のブロック構
成図である。
図面において、
ｌは高圧インパルス電圧発生回路、２は低圧インパルス
電圧発生回路、３は被測定コイル、４は基準コイル、５
は分圧回路（振幅整合手段）、６は切り換えスイッチ、
７は波形表示装置、８は制御部である。
前記高圧インパルス電圧発生回路１は、制御部８からの
タイミング信号Ｔｌに基づいて１０００ボルトの高圧イ
ンパルス電圧を発生させ、被測定コイル３に印加する。
被測定コイル３で発生した減衰振動電圧波形は分圧回路
５においてコンデンサによって１／１００に分圧されて
、切り換えスイッチ６の接点６１に接続される。
前記低圧インパルス電圧発生回路２は、制御部８からの
タイミング信号Ｔ１に続いて出力されるタイミング信号
Ｔ２に基づいて１０ボルトの低圧インパルス電圧を発生
させ、基準コイル４に印加する。基準コイル４で発生し
た減衰振動電圧波形は切り換えスイッチ６の接点６２に
接続される。
そして、タイミング信号ＴＩの入力で、切り換えスイッ
チ６を接点６１側に切り換えた状態で、高圧インパルス
電圧を被測定コイル３に印加して減衰振動電圧波形を得
てＣＲＴ表示装置７に表示させ、続くタイミング信号Ｔ
２の入力で、切り換えスイッチ６を接点６２側に切り換
えて、低圧インパルス電圧を基準コイル４に印加して減
衰振動電圧波形を得てＣＲＴ表示装置７に表示させる。
すると、両方の波形は極短時間で表示されるので、視覚
の残像現象によって同時に表示されるように見られる。
よって、両波形の相違は容易に発見できるのである。残
像時間の長いＣＲＴ表示管を用いても良い。
前記分圧回路５に代えて、基準波形の方を拡大してもよ
く、両波形の振幅を整合させて比較すればよいのである
。
このとき、前記基準波形を所定幅で上下にシフトさせて
所定幅のウィンドウを発生させ、このウィンドウの中に
前記測定波形が納まっているか否かを確認するようにし
てもよい。
このとき、被測定コイル３に高圧インパルス電圧を印加
した時の減衰振動電圧波形にコロナ放電やレアショート
が発生すれば、測定波形を分圧回路５で分圧して振幅を
整合させても基準波形とは一致しなくなるので、当該被
測定コイル３が不良品であることが判断できる。
更に、この装置に併せて抵抗測定装置を加えれば完璧な
コイル総合試験装置を提供できる。
第２図は、上限波形と下限波形とを生成して被測定コイ
ルの良否を判定するコイル試験装置の実施例のブロック
図である。
１１は高圧インパルス電圧発生回路、１２は低圧インパ
ルス電圧発生回路、１３は被測定コイル、１４は基準コ
イル、Ｉ５は分圧回路（振幅整合手段）、】７は波形表
示装置であり、上述の構成とほぼ同等の機能を備えてい
る。
そして、２１は基準減衰振動電圧波形を正の方向にシフ
トさせて上限波形を生成するシフトアップ回路、２２は
基準減衰振動電圧波形を負の方向にシフトさせて下限波
形を生成するシフトダウン回路、２３は測定減衰振動電
圧波形が前記上限波形と下限波形の範囲に収まっている
とき合格信号を出力し、上記範囲を逸脱したとき不合格
信号を出力するウィンドウコンパレータ、２４は該ウィ
ンドウコンパレータ２３からの信号に基ついて合格／不
合格の表示を行う判定表示装置である。
ここで、前記高圧インパルス電圧発生回路ＩＩと低圧イ
ンパルス電圧発生回路１２は、制御回路１８からのタイ
ミング信号に基づいて位相の揃ったインパルス電圧を出
力する。また、前記波形表示装置１７は３現象波形表示
機能を備えており、同一画面に前記上限波形と前記測定
減衰振動電圧波形と前記下限波形を同時に表示するので
、だれでもが容易に正確な良否判断をすることが可能で
ある。また、両インパルス電圧発生回路のチャージコン
デンサの特性を吟味して両インパルス電圧の位相が同期
するように設定する。また、上限波形と下限波形はシフ
ト操作でなく、振幅方向への拡大／縮小操作によって得
ることも可能である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of a coil testing method and an apparatus used in the method according to the present invention will be described below in detail with reference to the drawings. FIG. 1 is a block diagram of an embodiment of the coil testing device of the present invention. In the drawing, l is a high voltage impulse voltage generation circuit, 2 is a low voltage impulse voltage generation circuit, 3 is a coil to be measured, 4 is a reference coil, and 5 is a reference coil.
is a voltage divider circuit (amplitude matching means), 6 is a changeover switch,
7 is a waveform display device, and 8 is a control section. The high-voltage impulse voltage generation circuit 1 generates a high-voltage impulse voltage of 1000 volts based on the timing signal Tl from the control section 8 and applies it to the coil 3 to be measured. The damped oscillating voltage waveform generated by the coil 3 to be measured is divided into 1/100 by a capacitor in the voltage dividing circuit 5 and connected to the contact 61 of the changeover switch 6. The low-voltage impulse voltage generation circuit 2 generates a low-voltage impulse voltage of 10 volts based on a timing signal T2 outputted following the timing signal T1 from the control section 8, and applies it to the reference coil 4. The damped oscillating voltage waveform generated by the reference coil 4 is connected to the contact 62 of the changeover switch 6. Then, with the input of the timing signal TI, the changeover switch 6 is switched to the contact 61 side, and a high-voltage impulse voltage is applied to the coil 3 to be measured to obtain a damped oscillating voltage waveform, which is displayed on the CRT display device 7. timing signal T
2, the changeover switch 6 is switched to the contact 62 side, and a low-voltage impulse voltage is applied to the reference coil 4 to obtain a damped oscillating voltage waveform, which is displayed on the CRT display device 7. Then, since both waveforms are displayed for a very short time, they appear to be displayed simultaneously due to visual afterimage phenomenon. Therefore, the difference between the two waveforms can be easily discovered. A CRT display tube with a long afterimage time may also be used. Instead of the voltage dividing circuit 5, the reference waveform may be expanded, and the amplitudes of both waveforms may be matched and compared. At this time, the reference waveform may be shifted up and down by a predetermined width to generate a window of a predetermined width, and it may be confirmed whether or not the measurement waveform fits within this window. At this time, if corona discharge or layer short occurs in the damped oscillating voltage waveform when a high-voltage impulse voltage is applied to the coil 3 to be measured, even if the measured waveform is divided by the voltage dividing circuit 5 and the amplitude is matched, the reference waveform Since they no longer match, it can be determined that the coil 3 to be measured is a defective product. Furthermore, if a resistance measuring device is added to this device, a perfect comprehensive coil testing device can be provided. FIG. 2 is a block diagram of an embodiment of a coil testing device that generates an upper limit waveform and a lower limit waveform to determine the quality of a coil to be measured. 11 is a high-voltage impulse voltage generation circuit, 12 is a low-voltage impulse voltage generation circuit, 13 is a coil to be measured, 14 is a reference coil, I5 is a voltage dividing circuit (amplitude matching means), and ]7 is a waveform display device, which has the above-mentioned configuration. It has almost the same functionality. 21 is a shift up circuit that shifts the reference damped oscillating voltage waveform in the positive direction to generate an upper limit waveform; 22 is a shift down circuit that shifts the reference damped oscillating voltage waveform in the negative direction to generate a lower limit waveform; 23 is a window comparator which outputs a pass signal when the measured damped oscillating voltage waveform is within the range of the upper limit waveform and the lower limit waveform, and outputs a fail signal when it deviates from the above range; This is a judgment display device that displays pass/fail based on a signal. Here, the high-voltage impulse voltage generation circuit II and the low-voltage impulse voltage generation circuit 12 output phase-aligned impulse voltages based on a timing signal from the control circuit 18. In addition, the waveform display device 17 has a three-phenomenon waveform display function, and displays the upper limit waveform, the measured damped oscillation voltage waveform, and the lower limit waveform simultaneously on the same screen, so anyone can easily make accurate pass/fail judgments. It is possible to In addition, the characteristics of the charge capacitors of both impulse voltage generation circuits are carefully examined, and settings are made so that the phases of both impulse voltages are synchronized. Further, the upper limit waveform and the lower limit waveform can be obtained not by a shift operation but by an expansion/reduction operation in the amplitude direction.
本発明にかかるコイル試験方法によれば、基準コイルに
印加するインパルス電圧を低圧としたので基準コイルが
劣化しにくくなり、単一の基準コイルをもとにして多（
の被測定コイルを試験できる。よって、正確なコイル試
験ができるという効果が得られる。
また、このコイル試験装置によれば、基準コイルが劣化
しにくくなるので上記効果が得られる装置を提供でき、
コイル試験作業を正確且つ能率よくできるという効果も
得られる。
また、基準波形から上下限の波形を生成して所定幅のウ
ィンドウを生成し、測定波形とともに同一表示装置に表
示するので、前記ウィンドウからはみ出していないかど
うかた゛けをチエツクすればよいので、経験が浅くても
コイルの良否判断を容易且つ正確にでき、判断する人間
の個人差に影響を受けずに判断できるので、信頼性の高
い安定したコイルの良否判定が可能となるという効果が
得られる。
また、比較手段によって自動判定も可能となるので、コ
イル試験の作業効率と信頼性が極めて向上するという効
果も得られる。According to the coil testing method according to the present invention, since the impulse voltage applied to the reference coil is set to a low voltage, the reference coil is less susceptible to deterioration.
The coil to be measured can be tested. Therefore, it is possible to achieve the effect that accurate coil testing can be performed. In addition, according to this coil testing device, the reference coil is less likely to deteriorate, so it is possible to provide a device that achieves the above effects.
Another advantage is that the coil testing work can be done accurately and efficiently. In addition, since the upper and lower limit waveforms are generated from the reference waveform to create a window with a predetermined width and displayed on the same display device along with the measured waveform, you only have to check to see if it extends beyond the window. Even if the coil is shallow, it can be easily and accurately judged whether the coil is good or bad, and the judgment can be made without being affected by individual differences among the people making the judgment, so that the effect of making highly reliable and stable judgment of the quality of the coil possible can be obtained. Further, since automatic determination is also possible using the comparison means, it is possible to obtain the effect that the working efficiency and reliability of coil testing are greatly improved.
第１図、第２図は本発明のコイル試験装置の実施例のブ
ロック構成図である。
■、１１・・・高圧インパルス電圧発生回路、２，１２
・・・低圧インパルス電圧発生回路、３，１３・・・被
測定コイル、４，１４・・・基準コイル、５，１５・・
・分圧回路（振幅整合手段）、６・・・切り替え回路、
７．１７・・・波形表示装置、２１・・・シフトアップ
回路（上限波形生成手段）、２２・・・シフトダウン回
路（下限波形生成手段）、２３・・・ウィンドウコンパ
レータ（比較手段）。FIGS. 1 and 2 are block diagrams of an embodiment of the coil testing device of the present invention. ■, 11... High voltage impulse voltage generation circuit, 2, 12
...Low voltage impulse voltage generation circuit, 3, 13... Coil to be measured, 4, 14... Reference coil, 5, 15...
・Voltage dividing circuit (amplitude matching means), 6... switching circuit,
7.17... Waveform display device, 21... Shift up circuit (upper limit waveform generation means), 22... Shift down circuit (lower limit waveform generation means), 23... Window comparator (comparison means).
Claims (5)
た減衰振動電圧波形と、被測定コイルにインパルス電圧
を印加して発生させた減衰振動電圧波形とを比較して、
当該被測定コイルの良否を判断するコイル試験方法にお
いて、 前記基準コイルに印加するインパルス電圧を被測定コイ
ルに印加するインパルス電圧よりも低い電圧とすること
を特徴とするコイル試験方法。(1) Compare the damped oscillating voltage waveform generated by applying an impulse voltage to the reference coil and the damped oscillating voltage waveform generated by applying the impulse voltage to the coil to be measured,
A coil testing method for determining the quality of the coil under test, characterized in that the impulse voltage applied to the reference coil is lower than the impulse voltage applied to the coil under test.
軸方向の上方にシフト若しくは拡大して上限波形を得、
同減衰振動電圧波形を下方にシフト若しくは縮小して下
限波形を得、これらの両波形を被測定コイルから得られ
る減衰振動電圧波形と同一表示装置に表示することを特
徴とするコイル試験方法。(2) Obtaining an upper limit waveform by shifting or expanding the damped oscillating voltage waveform obtained from the reference coil upward in the amplitude axis direction,
A coil testing method characterized by shifting or reducing the damped oscillating voltage waveform downward to obtain a lower limit waveform, and displaying both of these waveforms on the same display device as the damped oscillating voltage waveform obtained from the coil to be measured.
軸方向の上方にシフト若しくは拡大して上限波形を得、
同減衰振動電圧波形を下方にシフト若しくは縮小して下
限波形を得、被測定コイルから得られる減衰振動電圧波
形を前記両波形に同期させて発生させ、前記減衰振動電
圧波形が前記上限波形以下且つ前記下限波形以上である
とき前記測定コイルが良品であると判定することを特徴
とするコイル試験方法。(3) Obtaining an upper limit waveform by shifting or expanding the damped oscillating voltage waveform obtained from the reference coil upward in the amplitude axis direction,
The damped oscillating voltage waveform is shifted or reduced downward to obtain a lower limit waveform, and a damped oscillating voltage waveform obtained from the coil to be measured is generated in synchronization with both of the waveforms, so that the damped oscillating voltage waveform is equal to or less than the upper limit waveform and A coil testing method characterized in that the measuring coil is determined to be a good product when the waveform is equal to or higher than the lower limit waveform.
パルス電圧を発生する手段と、被測定コイルに前記高圧
インパルス電圧を印加して測定減衰振動電圧波形を取り
出す手段と、基準コイルに前記低圧インパルス電圧を印
加して基準減衰振動電圧波形を取り出す手段と、前記測
定減衰振動電圧波形を振幅軸方向に縮小もしくは前記基
準減衰振動電圧波形を振幅軸方向に拡大することによっ
て両波形の振幅を整合させる振幅整合手段とを備えてい
ることを特徴とするコイル試験装置。(4) means for generating a high-voltage impulse voltage, means for generating a low-voltage impulse voltage, means for applying the high-voltage impulse voltage to a coil to be measured and extracting a measured damped oscillating voltage waveform, and applying the low-voltage impulse voltage to a reference coil. and an amplitude for matching the amplitudes of both waveforms by reducing the measured damped oscillating voltage waveform in the amplitude axis direction or expanding the reference damped oscillating voltage waveform in the amplitude axis direction. A coil testing device comprising: matching means.
パルス電圧を発生する手段と、被測定コイルに前記高圧
インパルス電圧を印加して測定減衰振動電圧波形を取り
出す手段と、基準コイルに前記低圧インパルス電圧を印
加して基準減衰振動電圧波形を取り出す手段と、前記測
定減衰振動電圧波形を振幅軸方向に縮小もしくは前記基
準減衰振動電圧波形を振幅軸方向に拡大することによっ
て両波形の振幅を整合させる振幅整合手段と、振幅が整
合された基準減衰振動電圧波形を振幅軸の正の方向に所
定偏差だけシフトさせて上限波形を生成する上限波形生
成手段と、振幅が整合された基準減衰振動電圧波形を振
幅軸の負の方向に所定偏差だけシフトさせて下限波形を
生成する下限波形生成手段と、振幅が整合された測定減
衰振動電圧波形が前記上限波形と前記下限波形との間に
あるか否かを比較する比較手段とを備えていることを特
徴とするコイル試験装置。(5) means for generating a high-voltage impulse voltage, means for generating a low-voltage impulse voltage, means for applying the high-voltage impulse voltage to a coil to be measured and extracting a measured damped oscillating voltage waveform, and applying the low-voltage impulse voltage to a reference coil. and an amplitude for matching the amplitudes of both waveforms by reducing the measured damped oscillating voltage waveform in the amplitude axis direction or expanding the reference damped oscillating voltage waveform in the amplitude axis direction. a matching means; an upper limit waveform generating means for generating an upper limit waveform by shifting the amplitude-matched reference damped oscillating voltage waveform by a predetermined deviation in the positive direction of the amplitude axis; A lower limit waveform generating means for generating a lower limit waveform by shifting the amplitude axis by a predetermined deviation in the negative direction, and whether or not a measured damped oscillating voltage waveform whose amplitude is matched is between the upper limit waveform and the lower limit waveform. A coil testing device characterized by comprising a comparison means for comparing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19135290A JPH0476468A (en) | 1990-07-18 | 1990-07-18 | Coil test method and device thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19135290A JPH0476468A (en) | 1990-07-18 | 1990-07-18 | Coil test method and device thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0476468A true JPH0476468A (en) | 1992-03-11 |
Family
ID=16273151
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19135290A Pending JPH0476468A (en) | 1990-07-18 | 1990-07-18 | Coil test method and device thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0476468A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0843477A (en) * | 1994-07-27 | 1996-02-16 | Haruyoshi Matsubara | Impulse generation circuit of coil withstand voltage tester and coil withstand voltage tester |
| JP2017040629A (en) * | 2015-08-21 | 2017-02-23 | 学校法人 芝浦工業大学 | Electronic component testing device, electronic component testing method |
-
1990
- 1990-07-18 JP JP19135290A patent/JPH0476468A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0843477A (en) * | 1994-07-27 | 1996-02-16 | Haruyoshi Matsubara | Impulse generation circuit of coil withstand voltage tester and coil withstand voltage tester |
| JP2017040629A (en) * | 2015-08-21 | 2017-02-23 | 学校法人 芝浦工業大学 | Electronic component testing device, electronic component testing method |
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