JPH0583181B2 - - Google Patents
Info
- Publication number
- JPH0583181B2 JPH0583181B2 JP2322687A JP2322687A JPH0583181B2 JP H0583181 B2 JPH0583181 B2 JP H0583181B2 JP 2322687 A JP2322687 A JP 2322687A JP 2322687 A JP2322687 A JP 2322687A JP H0583181 B2 JPH0583181 B2 JP H0583181B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probes
- tip
- center
- support ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 126
- 238000000034 method Methods 0.000 claims description 18
- 230000005484 gravity Effects 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 2
- 238000005452 bending Methods 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000000465 moulding Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 238000011990 functional testing Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2322687A JPS63192246A (ja) | 1987-02-03 | 1987-02-03 | プロ−ブ針の組立て方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2322687A JPS63192246A (ja) | 1987-02-03 | 1987-02-03 | プロ−ブ針の組立て方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63192246A JPS63192246A (ja) | 1988-08-09 |
| JPH0583181B2 true JPH0583181B2 ( ) | 1993-11-25 |
Family
ID=12104717
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2322687A Granted JPS63192246A (ja) | 1987-02-03 | 1987-02-03 | プロ−ブ針の組立て方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63192246A ( ) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10143173A1 (de) * | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafersonde |
-
1987
- 1987-02-03 JP JP2322687A patent/JPS63192246A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63192246A (ja) | 1988-08-09 |
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