JPH06258401A - Function tester - Google Patents

Abstract

PURPOSE:To eliminate the need for selecting a program for function tests when test boards change, by making a test means read, out of the storage means in which the program for function test is stared, a program. CONSTITUTION:With a test board 3 set at a fixture 2, a test for the test board 3 is begun, and a CPU 14 reads a test program stored in an EEPROM 30 of the test board 3, and stores the test program in a RAM 12. With this, the CPU 14, based upon the test program and the processing result, outputs an instruction 2 to a control unit 13, to control a synthesizer 17, a face unit 16 and an analogue unit 18, so as to activate the fixture 2, for testing the test board 3. The obtained resulting data is transferred to an output device 6, to be stored through printing, etc., and at the same time, it is fedback to the EEPROM 30 of the testboard 3, to be re-written as a new data.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a function tester for carrying out a function test of a printed board on which an electronic component such as an IC is mounted as a test board.

[0002]

2. Description of the Related Art A conventional function tester stores a plurality of test programs related to a function test for each type of test board, and an operator selects a test program corresponding to each type of test board. , Was doing that test. Therefore, not only is the program change work troublesome, but when a different test program is selected, there is the inconvenience of damaging the test board due to a malfunction.

On the other hand, Japanese Laid-Open Patent Publication No. 4-134730 discloses an information recording / reproducing apparatus using a pickup. This information recording / reproducing apparatus has an EEPROM in which characteristic data peculiar to the pickup is stored, and an EE
It comprises an adjusting means for automatically setting the operating characteristics for the pickup based on the characteristic data stored in the PROM, and a means for selectively rewriting the characteristic data stored in the EEPROM. Therefore, even if the type of recording medium changes, it is not necessary to replace the pickup in the apparatus.

[0004]

[Patent Document 1] Japanese Unexamined Patent Application Publication No.
The technology of Japanese Patent Publication No. 134730 does not store data for each test target such as a test board and a recording medium. Therefore, in the test for each different test board, the operator still needs to change the test program in the function tester. was there.

The present invention has been made in consideration of the above circumstances, and does not require the operator to change the test program even in the function test of different test boards or the function test of the upgraded test board. The purpose is to provide.

[0006]

In order to achieve the above object, a function tester of the present invention reads a test board provided with a storage means in which a test program relating to a function test is stored and a test program in the storage means. And a recording means for recording the result data of the function test execution of the test means in the storage means.

[0007]

In the above structure, the function test program is stored in the memory means of the test board, and the test means reads the program to perform the function test. Therefore, the function test program is changed every time the test board is changed. No need to choose.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an embodiment of the present invention, in which data is input and output between a function tester main body 1, an external input device 4 for inputting data etc. to the main body 1, and a main body 1. Is provided with an external storage device 5 such as a floppy disk, an output device 6 such as a printer, and a fixture 2 on which the test board 3 is set to test the test board 3. The function tester main body 1 is an RO that stores a control program for controlling the entire tester.
M11, RAM12 as a work area, control unit 13, and CPU that controls the entire tester
14 and an I / O port 15 are provided, and signals are input and output between them. Further, the function tester main body 1 includes an interface 16 for inputting / outputting a signal to / from the fixture 2, a synthesizer 17 for converting an oscillation sound of an oscillation circuit into a sound and outputting the sound, and an analog unit 18.
And a bus line 19 connecting these with the I / O port 15.

On the other hand, the test board 3 set on the fixture 2 is provided with an EEPROM 30 as a storage means. The EEPROM 30 is provided corresponding to each test board 3, and stores a test program relating to a function test of each test board 3.
The EEPROM 30 is an electrically erasable and writable ROM, and the stored test program is read every time it is set in the fixture 2.

In the above structure, when the test board 3 is set on the fixture 2 and the test of the test board is started,
The CPU 14 reads the test program stored in the EEPROM 30 of the test board 3 and stores the test program in the RAM 12. As a result, the CPU 14
Starts processing according to the read test program. That is, the CPU 14 outputs a command to the control unit 13 based on the test program and the processing result, and the synthesizer 17 and the interface unit 1
6, control the analog unit 18, the fixture 2
Is operated to test the test substrate 3. After completion of this test, the obtained result data is transferred to the output device 6 and recorded by printing or the like, and the E of the test board 3 is recorded.
It is fed back to the EPEOM 30 and rewritten as new data.

In this embodiment, since the function test program is read and the test is started for each different test board, the operator does not need to select the test program, and the test can be performed quickly and accurately. be able to. Further, since the program is rewritten after the test is completed, the rewriting work by the operator is unnecessary.

In the above embodiment, the EEPROM is used as the storage means of the function test program, but other storage means such as a flash ROM may be used.

[0013]

As described above, according to the present invention, since the storage means for storing the function test program is provided on the test board, it is not necessary to select the test program for each different test board. Further, since the data of the result of the function test is recorded in the storage means, the history of the test board can be read directly from the board, and it is not necessary to retrieve the history from the database.

[Brief description of drawings]

FIG. 1 is a block diagram of an embodiment of the present invention.

[Explanation of symbols]

 1 Function tester main body 2 Fixture 3 Test board 30 EEPROM

Claims (1)

[Claims] 1. A test board comprising a storage means in which a test program relating to a function test is stored,
A test means for reading a test program in the storage means to perform a function test of a test board; and a recording means for recording result data of the function test execution of the test means in the storage means. Function tester to do.