JPH0717022Y2 - Ｉｃ試験装置 - Google Patents
Ｉｃ試験装置Info
- Publication number
- JPH0717022Y2 JPH0717022Y2 JP13027789U JP13027789U JPH0717022Y2 JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2 JP 13027789 U JP13027789 U JP 13027789U JP 13027789 U JP13027789 U JP 13027789U JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2
- Authority
- JP
- Japan
- Prior art keywords
- air
- spacing frame
- constant temperature
- temperature bath
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 13
- 230000005494 condensation Effects 0.000 description 4
- 238000009833 condensation Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 238000003745 diagnosis Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027789U JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ｉｃ試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027789U JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ｉｃ試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0369236U JPH0369236U (2) | 1991-07-09 |
| JPH0717022Y2 true JPH0717022Y2 (ja) | 1995-04-19 |
Family
ID=31677862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13027789U Expired - Lifetime JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ｉｃ試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0717022Y2 (2) |
-
1989
- 1989-11-08 JP JP13027789U patent/JPH0717022Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0369236U (2) | 1991-07-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |