JPH0747749Y2 - Ｉｃの温度試験用ケース - Google Patents

Ｉｃの温度試験用ケース

Info

Publication number: JPH0747749Y2
Authority: JP; Japan
Prior art keywords: case; lid; socket; test; gas
Prior art date: 1989-11-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

JP1989137062U

Other languages

English (en)

Japanese (ja)

Other versions

JPH0376182U (2

Inventor

貢栗原

Original Assignee

株式会社ダイトー

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1989-11-27

Filing date

1989-11-27

Publication date

1995-11-01

1989-11-27 Application filed by 株式会社ダイトー filed Critical 株式会社ダイトー

1989-11-27 Priority to JP1989137062U priority Critical patent/JPH0747749Y2/ja

1991-07-30 Publication of JPH0376182U publication Critical patent/JPH0376182U/ja

1995-11-01 Application granted granted Critical

1995-11-01 Publication of JPH0747749Y2 publication Critical patent/JPH0747749Y2/ja

2004-11-27 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

238000011084 recovery Methods 0.000 claims description 15
238000002347 injection Methods 0.000 claims description 12
239000007924 injection Substances 0.000 claims description 12
239000007789 gas Substances 0.000 description 21
238000005259 measurement Methods 0.000 description 5
230000000694 effects Effects 0.000 description 3
IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
230000001133 acceleration Effects 0.000 description 2
230000015572 biosynthetic process Effects 0.000 description 2
229910001873 dinitrogen Inorganic materials 0.000 description 2
230000002411 adverse Effects 0.000 description 1
230000032683 aging Effects 0.000 description 1
210000000078 claw Anatomy 0.000 description 1
230000002950 deficient Effects 0.000 description 1
239000000284 extract Substances 0.000 description 1
238000007689 inspection Methods 0.000 description 1
238000000034 method Methods 0.000 description 1
238000003756 stirring Methods 0.000 description 1
XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1

Landscapes

Testing Of Individual Semiconductor Devices (AREA)

JP1989137062U 1989-11-27 1989-11-27 Ｉｃの温度試験用ケース Expired - Fee Related JPH0747749Y2 (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP1989137062U JPH0747749Y2 (ja)	1989-11-27	1989-11-27	Ｉｃの温度試験用ケース

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1989137062U JPH0747749Y2 (ja)	1989-11-27	1989-11-27	Ｉｃの温度試験用ケース

Publications (2)

Publication Number	Publication Date
JPH0376182U JPH0376182U (2)	1991-07-30
JPH0747749Y2 true JPH0747749Y2 (ja)	1995-11-01

Family

ID=31684238

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1989137062U Expired - Fee Related JPH0747749Y2 (ja)	1989-11-27	1989-11-27	Ｉｃの温度試験用ケース

Country Status (1)

Country	Link
JP (1)	JPH0747749Y2 (2)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS60253884A (ja) *	1984-05-30	1985-12-14	Mitsubishi Electric Corp	恒温装置

1989
- 1989-11-27 JP JP1989137062U patent/JPH0747749Y2/ja not_active Expired - Fee Related

Also Published As

Publication number	Publication date
JPH0376182U (2)	1991-07-30

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Legal Events

Date	Code	Title	Description
2004-11-01	LAPS	Cancellation because of no payment of annual fees