JPH08195363A - 流体軸受を有する半導体ウェーハポリシング装置 - Google Patents
流体軸受を有する半導体ウェーハポリシング装置Info
- Publication number
- JPH08195363A JPH08195363A JP26042795A JP26042795A JPH08195363A JP H08195363 A JPH08195363 A JP H08195363A JP 26042795 A JP26042795 A JP 26042795A JP 26042795 A JP26042795 A JP 26042795A JP H08195363 A JPH08195363 A JP H08195363A
- Authority
- JP
- Japan
- Prior art keywords
- fluid
- polishing pad
- support
- pad assembly
- bearings
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012530 fluid Substances 0.000 title claims abstract description 122
- 238000005498 polishing Methods 0.000 title claims abstract description 65
- 239000004065 semiconductor Substances 0.000 title claims description 9
- 238000004891 communication Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 2
- 239000007788 liquid Substances 0.000 abstract description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 5
- 235000012431 wafers Nutrition 0.000 description 25
- 239000000126 substance Substances 0.000 description 6
- 238000005461 lubrication Methods 0.000 description 4
- 230000002706 hydrostatic effect Effects 0.000 description 3
- 239000002002 slurry Substances 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B21/00—Machines or devices using grinding or polishing belts; Accessories therefor
- B24B21/04—Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces
- B24B21/06—Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces involving members with limited contact area pressing the belt against the work, e.g. shoes sweeping across the whole area to be ground
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/321085 | 1994-10-11 | ||
| US08/321,085 US5593344A (en) | 1994-10-11 | 1994-10-11 | Wafer polishing machine with fluid bearings and drive systems |
| US08/333463 | 1994-11-02 | ||
| US08/333,463 US5558568A (en) | 1994-10-11 | 1994-11-02 | Wafer polishing machine with fluid bearings |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH08195363A true JPH08195363A (ja) | 1996-07-30 |
Family
ID=26982813
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26042795A Pending JPH08195363A (ja) | 1994-10-11 | 1995-10-06 | 流体軸受を有する半導体ウェーハポリシング装置 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0706857B1 (de) |
| JP (1) | JPH08195363A (de) |
| AT (1) | ATE182103T1 (de) |
| DE (1) | DE69510745T2 (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001054856A (ja) * | 1999-07-09 | 2001-02-27 | Applied Materials Inc | 化学的機械研磨装置での使用のための溝付パターンを有する研磨パッド |
| KR100521538B1 (ko) * | 1997-11-12 | 2006-03-23 | 램 리서치 코포레이션 | 반도체 웨이퍼를 폴리싱 처리하기 위한 장치 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5961372A (en) * | 1995-12-05 | 1999-10-05 | Applied Materials, Inc. | Substrate belt polisher |
| US5886535A (en) * | 1996-11-08 | 1999-03-23 | W. L. Gore & Associates, Inc. | Wafer level burn-in base unit substrate and assembly |
| US6111634A (en) * | 1997-05-28 | 2000-08-29 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing |
| US6108091A (en) | 1997-05-28 | 2000-08-22 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing |
| US6146248A (en) * | 1997-05-28 | 2000-11-14 | Lam Research Corporation | Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher |
| US5980368A (en) * | 1997-11-05 | 1999-11-09 | Aplex Group | Polishing tool having a sealed fluid chamber for support of polishing pad |
| US6062959A (en) * | 1997-11-05 | 2000-05-16 | Aplex Group | Polishing system including a hydrostatic fluid bearing support |
| US6068539A (en) | 1998-03-10 | 2000-05-30 | Lam Research Corporation | Wafer polishing device with movable window |
| US6132289A (en) * | 1998-03-31 | 2000-10-17 | Lam Research Corporation | Apparatus and method for film thickness measurement integrated into a wafer load/unload unit |
| US7204924B2 (en) | 1998-12-01 | 2007-04-17 | Novellus Systems, Inc. | Method and apparatus to deposit layers with uniform properties |
| US6413388B1 (en) * | 2000-02-23 | 2002-07-02 | Nutool Inc. | Pad designs and structures for a versatile materials processing apparatus |
| US7141146B2 (en) | 2000-02-23 | 2006-11-28 | Asm Nutool, Inc. | Means to improve center to edge uniformity of electrochemical mechanical processing of workpiece surface |
| US6991512B2 (en) * | 2001-03-30 | 2006-01-31 | Lam Research Corporation | Apparatus for edge polishing uniformity control |
| US6729945B2 (en) | 2001-03-30 | 2004-05-04 | Lam Research Corporation | Apparatus for controlling leading edge and trailing edge polishing |
| US6939212B1 (en) | 2001-12-21 | 2005-09-06 | Lam Research Corporation | Porous material air bearing platen for chemical mechanical planarization |
| US6790128B1 (en) | 2002-03-29 | 2004-09-14 | Lam Research Corporation | Fluid conserving platen for optimizing edge polishing |
| US6769970B1 (en) | 2002-06-28 | 2004-08-03 | Lam Research Corporation | Fluid venting platen for optimizing wafer polishing |
| US7018273B1 (en) | 2003-06-27 | 2006-03-28 | Lam Research Corporation | Platen with diaphragm and method for optimizing wafer polishing |
| US6955588B1 (en) | 2004-03-31 | 2005-10-18 | Lam Research Corporation | Method of and platen for controlling removal rate characteristics in chemical mechanical planarization |
| CN112975721B (zh) * | 2021-03-10 | 2022-04-22 | 江苏特丽亮镀膜科技有限公司 | 金属件表面抛光系统及方法 |
| CN116160331B (zh) * | 2023-04-10 | 2025-08-05 | 合肥欢悦磁业科技有限公司 | 一种钕铁硼磁铁加工设备及其使用方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US529732A (en) | 1894-11-27 | Cravat | ||
| DE3411120A1 (de) * | 1983-03-26 | 1984-11-08 | TOTO Ltd., Kitakyushyu, Fukuoka | Laeppvorrichtung |
| JPS59232768A (ja) * | 1983-06-16 | 1984-12-27 | Kanebo Ltd | 平面研磨装置 |
| JPS63200965A (ja) * | 1987-02-12 | 1988-08-19 | Fujitsu Ltd | ウエ−ハ研磨装置 |
| US4811522A (en) | 1987-03-23 | 1989-03-14 | Gill Jr Gerald L | Counterbalanced polishing apparatus |
| JPS63251166A (ja) * | 1987-04-07 | 1988-10-18 | Hitachi Ltd | ウエハチヤツク |
| JPH0811356B2 (ja) * | 1989-04-06 | 1996-02-07 | ロデール・ニッタ株式会社 | ポリッシング方法およびポリッシング装置 |
| FR2677276B1 (fr) | 1991-06-06 | 1995-12-01 | Commissariat Energie Atomique | Machine de polissage a table porte-echantillon perfectionnee. |
| JPH05177523A (ja) | 1991-06-06 | 1993-07-20 | Commiss Energ Atom | 張設された微小研磨剤小板、および改良されたウエハー支持ヘッドを備えた研磨装置 |
| JP3334139B2 (ja) * | 1991-07-01 | 2002-10-15 | ソニー株式会社 | 研磨装置 |
| US5287663A (en) | 1992-01-21 | 1994-02-22 | National Semiconductor Corporation | Polishing pad and method for polishing semiconductor wafers |
-
1995
- 1995-10-06 JP JP26042795A patent/JPH08195363A/ja active Pending
- 1995-10-11 DE DE69510745T patent/DE69510745T2/de not_active Expired - Fee Related
- 1995-10-11 AT AT95307203T patent/ATE182103T1/de not_active IP Right Cessation
- 1995-10-11 EP EP95307203A patent/EP0706857B1/de not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100521538B1 (ko) * | 1997-11-12 | 2006-03-23 | 램 리서치 코포레이션 | 반도체 웨이퍼를 폴리싱 처리하기 위한 장치 |
| JP2001054856A (ja) * | 1999-07-09 | 2001-02-27 | Applied Materials Inc | 化学的機械研磨装置での使用のための溝付パターンを有する研磨パッド |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0706857A1 (de) | 1996-04-17 |
| ATE182103T1 (de) | 1999-07-15 |
| EP0706857B1 (de) | 1999-07-14 |
| DE69510745T2 (de) | 1999-12-09 |
| DE69510745D1 (de) | 1999-08-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH08195363A (ja) | 流体軸受を有する半導体ウェーハポリシング装置 | |
| US5558568A (en) | Wafer polishing machine with fluid bearings | |
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| KR20020018641A (ko) | 가변 연마력 웨이퍼 캐리어 헤드를 구비하는 반도체웨이퍼 연마 장치 | |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20040824 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20040906 |
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| A601 | Written request for extension of time |
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| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20041213 |
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| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20050404 |
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050802 |
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| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050914 |
|
| A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20050920 |
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| A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20051118 |