JPS5326569A - Layer thickness control me thod of epitaxial growth layer - Google Patents
Layer thickness control me thod of epitaxial growth layerInfo
- Publication number
- JPS5326569A JPS5326569A JP10056776A JP10056776A JPS5326569A JP S5326569 A JPS5326569 A JP S5326569A JP 10056776 A JP10056776 A JP 10056776A JP 10056776 A JP10056776 A JP 10056776A JP S5326569 A JPS5326569 A JP S5326569A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- epitaxial growth
- layer thickness
- thod
- thickness control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 abstract 4
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
PURPOSE:In case of epitaxial growth of a Si layer on a Si bustrate in a quartz cylindrical pipe, a dummy substrate of sapphier, etc., where Si monocrystal adheres on the surface is enclosed, and a growth speed where Si layer grows on the Si substrate and the dummy substrate are made equivalent. As a reuslt, a layer thickness on the dummy substrate is notified by interference light, thereby controlling the layer thickness accurately.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10056776A JPS5326569A (en) | 1976-08-25 | 1976-08-25 | Layer thickness control me thod of epitaxial growth layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10056776A JPS5326569A (en) | 1976-08-25 | 1976-08-25 | Layer thickness control me thod of epitaxial growth layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5326569A true JPS5326569A (en) | 1978-03-11 |
Family
ID=14277478
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10056776A Pending JPS5326569A (en) | 1976-08-25 | 1976-08-25 | Layer thickness control me thod of epitaxial growth layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5326569A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5453684A (en) * | 1977-09-16 | 1979-04-27 | Philips Nv | Treatment of single crystal |
| JPS60231599A (en) * | 1984-04-27 | 1985-11-18 | Matsushita Electric Ind Co Ltd | Gas shield arc welding wire |
| JPH01249291A (en) * | 1988-03-31 | 1989-10-04 | Nippon Steel Weld Prod & Eng Co Ltd | Plated wire for arc welding |
| JPH03124391A (en) * | 1989-10-03 | 1991-05-27 | Nippon Steel Weld Prod & Eng Co Ltd | Copper plated steel wire for gas shielded arc welding |
| JPH03174739A (en) * | 1989-09-01 | 1991-07-29 | Nippon Telegr & Teleph Corp <Ntt> | Measurement of growth situation of epitaxial growth layer |
| US5229303A (en) * | 1989-08-29 | 1993-07-20 | At&T Bell Laboratories | Device processing involving an optical interferometric thermometry using the change in refractive index to measure semiconductor wafer temperature |
| JP2009054770A (en) * | 2007-08-27 | 2009-03-12 | Sumitomo Electric Ind Ltd | Epitaxial substrate manufacturing method and manufacturing apparatus |
-
1976
- 1976-08-25 JP JP10056776A patent/JPS5326569A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5453684A (en) * | 1977-09-16 | 1979-04-27 | Philips Nv | Treatment of single crystal |
| JPS60231599A (en) * | 1984-04-27 | 1985-11-18 | Matsushita Electric Ind Co Ltd | Gas shield arc welding wire |
| JPH01249291A (en) * | 1988-03-31 | 1989-10-04 | Nippon Steel Weld Prod & Eng Co Ltd | Plated wire for arc welding |
| US5229303A (en) * | 1989-08-29 | 1993-07-20 | At&T Bell Laboratories | Device processing involving an optical interferometric thermometry using the change in refractive index to measure semiconductor wafer temperature |
| JPH03174739A (en) * | 1989-09-01 | 1991-07-29 | Nippon Telegr & Teleph Corp <Ntt> | Measurement of growth situation of epitaxial growth layer |
| JPH03124391A (en) * | 1989-10-03 | 1991-05-27 | Nippon Steel Weld Prod & Eng Co Ltd | Copper plated steel wire for gas shielded arc welding |
| JP2009054770A (en) * | 2007-08-27 | 2009-03-12 | Sumitomo Electric Ind Ltd | Epitaxial substrate manufacturing method and manufacturing apparatus |
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