JPS5374385A - Manufacture of field effect semiconductor device - Google Patents
Manufacture of field effect semiconductor deviceInfo
- Publication number
- JPS5374385A JPS5374385A JP14971776A JP14971776A JPS5374385A JP S5374385 A JPS5374385 A JP S5374385A JP 14971776 A JP14971776 A JP 14971776A JP 14971776 A JP14971776 A JP 14971776A JP S5374385 A JPS5374385 A JP S5374385A
- Authority
- JP
- Japan
- Prior art keywords
- manufacture
- semiconductor device
- field effect
- effect semiconductor
- dielectric strength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005669 field effect Effects 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
- H10D30/66—Vertical DMOS [VDMOS] FETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/028—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs
- H10D30/0291—Manufacture or treatment of FETs having insulated gates [IGFET] of double-diffused metal oxide semiconductor [DMOS] FETs of vertical DMOS [VDMOS] FETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
- H10D30/66—Vertical DMOS [VDMOS] FETs
- H10D30/662—Vertical DMOS [VDMOS] FETs having a drift region having a doping concentration that is higher between adjacent body regions relative to other parts of the drift region
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/149—Source or drain regions of field-effect devices
- H10D62/151—Source or drain regions of field-effect devices of IGFETs
Abstract
PURPOSE:To obtain a high dielectric strength as well as a high output by forming a depletion layer to enhance the drain dielectric strength inside the substrate and connecting in series the input MOSFET and the output junction type FET.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14971776A JPS5374385A (en) | 1976-12-15 | 1976-12-15 | Manufacture of field effect semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14971776A JPS5374385A (en) | 1976-12-15 | 1976-12-15 | Manufacture of field effect semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5374385A true JPS5374385A (en) | 1978-07-01 |
Family
ID=15481272
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14971776A Pending JPS5374385A (en) | 1976-12-15 | 1976-12-15 | Manufacture of field effect semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5374385A (en) |
Cited By (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5563876A (en) * | 1978-11-08 | 1980-05-14 | Sony Corp | Field-effect semiconductor device |
| JPS57103361A (en) * | 1980-10-29 | 1982-06-26 | Siemens Ag | Mis controlled semiconductor element |
| WO1982002981A1 (en) * | 1981-02-23 | 1982-09-02 | Inc Motorola | Mos power transistor |
| US4376286A (en) * | 1978-10-13 | 1983-03-08 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US4455565A (en) * | 1980-02-22 | 1984-06-19 | Rca Corporation | Vertical MOSFET with an aligned gate electrode and aligned drain shield electrode |
| US4593302A (en) * | 1980-08-18 | 1986-06-03 | International Rectifier Corporation | Process for manufacture of high power MOSFET with laterally distributed high carrier density beneath the gate oxide |
| US4680853A (en) * | 1980-08-18 | 1987-07-21 | International Rectifier Corporation | Process for manufacture of high power MOSFET with laterally distributed high carrier density beneath the gate oxide |
| US4705759A (en) * | 1978-10-13 | 1987-11-10 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| JPS6323365A (en) * | 1978-10-13 | 1988-01-30 | インターナショナル・レクチファイヤー・コーポレーション | Mosfet device |
| JPS6387771A (en) * | 1987-07-17 | 1988-04-19 | Nec Corp | Field effect transistor |
| US4959699A (en) * | 1978-10-13 | 1990-09-25 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US4974059A (en) * | 1982-12-21 | 1990-11-27 | International Rectifier Corporation | Semiconductor high-power mosfet device |
| US5519244A (en) * | 1979-05-25 | 1996-05-21 | Hitachi, Ltd. | Semiconductor device having aligned semiconductor regions and a plurality of MISFETs |
| US5663080A (en) * | 1991-11-29 | 1997-09-02 | Sgs-Thomson Microelectronics, S.R.L. | Process for manufacturing MOS-type integrated circuits |
| US5798554A (en) * | 1995-02-24 | 1998-08-25 | Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno | MOS-technology power device integrated structure and manufacturing process thereof |
| US5841167A (en) * | 1995-12-28 | 1998-11-24 | Sgs-Thomson Microelectronics S.R.L. | MOS-technology power device integrated structure |
| US5869371A (en) * | 1995-06-07 | 1999-02-09 | Stmicroelectronics, Inc. | Structure and process for reducing the on-resistance of mos-gated power devices |
| US5981343A (en) * | 1995-10-30 | 1999-11-09 | Sgs-Thomas Microelectronics, S.R.L. | Single feature size mos technology power device |
| US6030870A (en) * | 1995-10-30 | 2000-02-29 | Sgs-Thomson Microelectronics, S.R.L. | High density MOS technology power device |
| US6228719B1 (en) | 1995-11-06 | 2001-05-08 | Stmicroelectronics S.R.L. | MOS technology power device with low output resistance and low capacitance, and related manufacturing process |
| US6492691B2 (en) | 1998-05-26 | 2002-12-10 | Stmicroelectronics S.R.L. | High integration density MOS technology power device structure |
| JP2014140082A (en) * | 2014-05-07 | 2014-07-31 | Rohm Co Ltd | Semiconductor device and method for manufacturing the same |
-
1976
- 1976-12-15 JP JP14971776A patent/JPS5374385A/en active Pending
Cited By (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5191396A (en) * | 1978-10-13 | 1993-03-02 | International Rectifier Corp. | High power mosfet with low on-resistance and high breakdown voltage |
| US5742087A (en) * | 1978-10-13 | 1998-04-21 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US4376286A (en) * | 1978-10-13 | 1983-03-08 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US4959699A (en) * | 1978-10-13 | 1990-09-25 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US5598018A (en) * | 1978-10-13 | 1997-01-28 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US4705759A (en) * | 1978-10-13 | 1987-11-10 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| US5338961A (en) * | 1978-10-13 | 1994-08-16 | International Rectifier Corporation | High power MOSFET with low on-resistance and high breakdown voltage |
| JPS6323365A (en) * | 1978-10-13 | 1988-01-30 | インターナショナル・レクチファイヤー・コーポレーション | Mosfet device |
| JPS5563876A (en) * | 1978-11-08 | 1980-05-14 | Sony Corp | Field-effect semiconductor device |
| US5519244A (en) * | 1979-05-25 | 1996-05-21 | Hitachi, Ltd. | Semiconductor device having aligned semiconductor regions and a plurality of MISFETs |
| US4455565A (en) * | 1980-02-22 | 1984-06-19 | Rca Corporation | Vertical MOSFET with an aligned gate electrode and aligned drain shield electrode |
| US4593302A (en) * | 1980-08-18 | 1986-06-03 | International Rectifier Corporation | Process for manufacture of high power MOSFET with laterally distributed high carrier density beneath the gate oxide |
| US4680853A (en) * | 1980-08-18 | 1987-07-21 | International Rectifier Corporation | Process for manufacture of high power MOSFET with laterally distributed high carrier density beneath the gate oxide |
| JPS57103361A (en) * | 1980-10-29 | 1982-06-26 | Siemens Ag | Mis controlled semiconductor element |
| WO1982002981A1 (en) * | 1981-02-23 | 1982-09-02 | Inc Motorola | Mos power transistor |
| US4974059A (en) * | 1982-12-21 | 1990-11-27 | International Rectifier Corporation | Semiconductor high-power mosfet device |
| JPS6387771A (en) * | 1987-07-17 | 1988-04-19 | Nec Corp | Field effect transistor |
| US5663080A (en) * | 1991-11-29 | 1997-09-02 | Sgs-Thomson Microelectronics, S.R.L. | Process for manufacturing MOS-type integrated circuits |
| US5696399A (en) * | 1991-11-29 | 1997-12-09 | Sgs-Thomson Microelectronics S.R.L. | Process for manufacturing MOS-type integrated circuits |
| US5798554A (en) * | 1995-02-24 | 1998-08-25 | Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno | MOS-technology power device integrated structure and manufacturing process thereof |
| US6111297A (en) * | 1995-02-24 | 2000-08-29 | Consorzio Per La Ricerca Sulla Microelettronica Nel Mezzogiorno | MOS-technology power device integrated structure and manufacturing process thereof |
| US5869371A (en) * | 1995-06-07 | 1999-02-09 | Stmicroelectronics, Inc. | Structure and process for reducing the on-resistance of mos-gated power devices |
| US6046473A (en) * | 1995-06-07 | 2000-04-04 | Stmicroelectronics, Inc. | Structure and process for reducing the on-resistance of MOS-gated power devices |
| US6030870A (en) * | 1995-10-30 | 2000-02-29 | Sgs-Thomson Microelectronics, S.R.L. | High density MOS technology power device |
| US5985721A (en) * | 1995-10-30 | 1999-11-16 | Sgs-Thomson Microelectronics, S.R.L. | Single feature size MOS technology power device |
| US5981343A (en) * | 1995-10-30 | 1999-11-09 | Sgs-Thomas Microelectronics, S.R.L. | Single feature size mos technology power device |
| US6054737A (en) * | 1995-10-30 | 2000-04-25 | Sgs-Thomson Microelectronics S.R.L. | High density MOS technology power device |
| US6064087A (en) * | 1995-10-30 | 2000-05-16 | Sgs-Thomson Microelectronics, S.R.L. | Single feature size MOS technology power device |
| US6228719B1 (en) | 1995-11-06 | 2001-05-08 | Stmicroelectronics S.R.L. | MOS technology power device with low output resistance and low capacitance, and related manufacturing process |
| US6051862A (en) * | 1995-12-28 | 2000-04-18 | Sgs-Thomson Microelectronics S.R.L. | MOS-technology power device integrated structure |
| US5841167A (en) * | 1995-12-28 | 1998-11-24 | Sgs-Thomson Microelectronics S.R.L. | MOS-technology power device integrated structure |
| US6492691B2 (en) | 1998-05-26 | 2002-12-10 | Stmicroelectronics S.R.L. | High integration density MOS technology power device structure |
| JP2014140082A (en) * | 2014-05-07 | 2014-07-31 | Rohm Co Ltd | Semiconductor device and method for manufacturing the same |
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