JPS55146059A - Measuring method of dielectric constant and its unit - Google Patents
Measuring method of dielectric constant and its unitInfo
- Publication number
- JPS55146059A JPS55146059A JP5440079A JP5440079A JPS55146059A JP S55146059 A JPS55146059 A JP S55146059A JP 5440079 A JP5440079 A JP 5440079A JP 5440079 A JP5440079 A JP 5440079A JP S55146059 A JPS55146059 A JP S55146059A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- dielectric constant
- dielectric substance
- coaxial
- waveguide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000126 substance Substances 0.000 abstract 5
- 239000003990 capacitor Substances 0.000 abstract 2
- 239000004020 conductor Substances 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 2
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5440079A JPS6035030B2 (ja) | 1979-05-02 | 1979-05-02 | 誘電率の測定方法とその装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5440079A JPS6035030B2 (ja) | 1979-05-02 | 1979-05-02 | 誘電率の測定方法とその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55146059A true JPS55146059A (en) | 1980-11-14 |
| JPS6035030B2 JPS6035030B2 (ja) | 1985-08-12 |
Family
ID=12969634
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5440079A Expired JPS6035030B2 (ja) | 1979-05-02 | 1979-05-02 | 誘電率の測定方法とその装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6035030B2 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102508042A (zh) * | 2011-10-19 | 2012-06-20 | 中国人民解放军第四军医大学 | 测量生物组织介电谱特性的终端开路同轴探头及方法 |
| CN107962579A (zh) * | 2017-11-20 | 2018-04-27 | 西安交通大学 | 一种机器人灵巧手及材质检测识别系统 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6117032U (ja) * | 1984-07-06 | 1986-01-31 | 東洋製罐株式会社 | 容器 |
| JPS63123434U (ja) * | 1987-02-04 | 1988-08-11 |
-
1979
- 1979-05-02 JP JP5440079A patent/JPS6035030B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102508042A (zh) * | 2011-10-19 | 2012-06-20 | 中国人民解放军第四军医大学 | 测量生物组织介电谱特性的终端开路同轴探头及方法 |
| CN107962579A (zh) * | 2017-11-20 | 2018-04-27 | 西安交通大学 | 一种机器人灵巧手及材质检测识别系统 |
| CN107962579B (zh) * | 2017-11-20 | 2019-10-11 | 西安交通大学 | 一种机器人灵巧手及材质检测识别系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6035030B2 (ja) | 1985-08-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| FR2309833A1 (fr) | Jauge capacitive pour le controle d'une dimension interieure d'un tube | |
| JPS55146059A (en) | Measuring method of dielectric constant and its unit | |
| JPS5437582A (en) | Measuring method for capacity of three-terminal semiconductor element | |
| JPS54118520A (en) | Device for measuring transformation ratio of transformer for dc measuring instrument | |
| JPS57106804A (en) | Measuring device for thickness of film | |
| JPS5494222A (en) | Input impefance measuring method for facsimile transceiver | |
| JPS5649962A (en) | Measuring method for dielectric loss tangent | |
| JPS5313967A (en) | Measuring method for characteristic of vibration gauge | |
| JPS5624551A (en) | Device for measuring corrosion speed of metal | |
| JPS5425775A (en) | Easy measuring method of dielectric characteristics | |
| JPS5560804A (en) | Measuring method for film thickness | |
| JPS55128163A (en) | Method for measurement of resistance of conductive cover | |
| JPS55114964A (en) | Impedance measuring method | |
| JPS54135584A (en) | Electrostatic capacity type measuring apparatus | |
| JPS5580001A (en) | Detecting method of uneven thickness of conductive thin film | |
| JPS5510562A (en) | Measuring device for loss angle | |
| SU561897A1 (ru) | Высокочастотный кондуктометрический датчик с переменной константой | |
| JPS55112573A (en) | Conductivity measuring method | |
| JPS5376860A (en) | Inclination measuring system | |
| JPS5412840A (en) | Measuring method for surface potential of electrophotographic photoreceptor by time series | |
| JPS5710464A (en) | Conduction meter | |
| JPS54128774A (en) | Measurment of insulation-resistance of coils for electric device | |
| JPS5572051A (en) | Measuring device for semiconductor element | |
| PETERSONS | A wide range high voltage capacitance bridge with one ppm accuracy[Ph. D. Thesis] | |
| JPS5570752A (en) | Balancing type partial discharge test circuit |