JPS5656664A - Hybrid integrated circuit - Google Patents
Hybrid integrated circuitInfo
- Publication number
- JPS5656664A JPS5656664A JP13324979A JP13324979A JPS5656664A JP S5656664 A JPS5656664 A JP S5656664A JP 13324979 A JP13324979 A JP 13324979A JP 13324979 A JP13324979 A JP 13324979A JP S5656664 A JPS5656664 A JP S5656664A
- Authority
- JP
- Japan
- Prior art keywords
- type region
- substrate
- film
- sio2
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To miniaturize a chip substantially and utilize a material for substrate effectively by a method wherein the semiconductor integrated circuit is formed on one surface of a sheet of Si substrate and a thin-film capacitor on the other, respectively, in preparing a hybrid integrated circuit. CONSTITUTION:On one surface of the P type Si substrate is formed a resistance 12 which is composed of a P<+> type region and an N type region positioned in the former and serves as a passive element, while in the same substrate 10, adjacently to the resistance, is formed a transistor 13, an active element, which is composed of an N type region, a P type region and N type region. Next, the whole surface is coated with an SiO2 film 11, an opening is made therein, an A wiring layer 14 contacting with the resistance 12 and the transistor 13 is fitted, and the whole surface is protected by another SiO2 film 15. After that, the other surface of the substrate 10 is coated with an SiO2 insulation film 16, whereon the capacitor 22 composed of a lower electrode 17 made of A, a dielectric film 18 made of SiO2, etc., an upper electrode 19 and others is formed, the electrodes 17 and 19 are provided respectively with bumps 21 of Pb-Su, etc., while the exposed side of the electrode 19 is protected by an SiO2 film 20.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13324979A JPS5656664A (en) | 1979-10-15 | 1979-10-15 | Hybrid integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13324979A JPS5656664A (en) | 1979-10-15 | 1979-10-15 | Hybrid integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5656664A true JPS5656664A (en) | 1981-05-18 |
Family
ID=15100186
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13324979A Pending JPS5656664A (en) | 1979-10-15 | 1979-10-15 | Hybrid integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5656664A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02275663A (en) * | 1989-01-24 | 1990-11-09 | Fujitsu Ltd | Semiconductor device and manufacture thereof |
-
1979
- 1979-10-15 JP JP13324979A patent/JPS5656664A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02275663A (en) * | 1989-01-24 | 1990-11-09 | Fujitsu Ltd | Semiconductor device and manufacture thereof |
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