JPS5676004A - Measuring device of flatness - Google Patents

Measuring device of flatness

Info

Publication number
JPS5676004A
JPS5676004A JP15317079A JP15317079A JPS5676004A JP S5676004 A JPS5676004 A JP S5676004A JP 15317079 A JP15317079 A JP 15317079A JP 15317079 A JP15317079 A JP 15317079A JP S5676004 A JPS5676004 A JP S5676004A
Authority
JP
Japan
Prior art keywords
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sample
distortion
image
grid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15317079A
Other languages
English (en)
Other versions
JPH0211085B2 (ja
Inventor
Morihiro Matsuda
Kanji Kito
Takeshi Kubota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP15317079A priority Critical patent/JPS5676004A/ja
Publication of JPS5676004A publication Critical patent/JPS5676004A/ja
Publication of JPH0211085B2 publication Critical patent/JPH0211085B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP15317079A 1979-11-26 1979-11-26 Measuring device of flatness Granted JPS5676004A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15317079A JPS5676004A (en) 1979-11-26 1979-11-26 Measuring device of flatness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15317079A JPS5676004A (en) 1979-11-26 1979-11-26 Measuring device of flatness

Publications (2)

Publication Number Publication Date
JPS5676004A true JPS5676004A (en) 1981-06-23
JPH0211085B2 JPH0211085B2 (ja) 1990-03-12

Family

ID=15556577

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15317079A Granted JPS5676004A (en) 1979-11-26 1979-11-26 Measuring device of flatness

Country Status (1)

Country Link
JP (1) JPS5676004A (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833155A (ja) * 1981-08-22 1983-02-26 Datsuku Eng Kk 記録用磁気テ−プの疵検査装置
JPS60119404A (ja) * 1983-12-01 1985-06-26 Nippon Sheet Glass Co Ltd 板ガラスの歪検査装置
WO1990006505A1 (en) * 1988-11-28 1990-06-14 Matsushita Electric Industrial Co., Ltd. Method of and apparatus for detecting wrinkles in tapes
WO1992003699A1 (en) * 1990-08-14 1992-03-05 Autospect, Inc. Machine vision surface characterization system
JPH04109263U (ja) * 1991-03-08 1992-09-22 日本精工株式会社 シール装置
US5309222A (en) * 1991-07-16 1994-05-03 Mitsubishi Denki Kabushiki Kaisha Surface undulation inspection apparatus
CN110044292A (zh) * 2018-01-16 2019-07-23 郑州宇通客车股份有限公司 一种基于线结构光的三维测量方法和系统
JP2023059540A (ja) * 2021-10-15 2023-04-27 大日本印刷株式会社 表面性状測定装置および表面性状測定方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5833155A (ja) * 1981-08-22 1983-02-26 Datsuku Eng Kk 記録用磁気テ−プの疵検査装置
JPS60119404A (ja) * 1983-12-01 1985-06-26 Nippon Sheet Glass Co Ltd 板ガラスの歪検査装置
WO1990006505A1 (en) * 1988-11-28 1990-06-14 Matsushita Electric Industrial Co., Ltd. Method of and apparatus for detecting wrinkles in tapes
WO1992003699A1 (en) * 1990-08-14 1992-03-05 Autospect, Inc. Machine vision surface characterization system
EP0543900B1 (en) * 1990-08-14 1995-10-11 Autospect, Inc. Machine vision surface characterization system
JPH04109263U (ja) * 1991-03-08 1992-09-22 日本精工株式会社 シール装置
US5309222A (en) * 1991-07-16 1994-05-03 Mitsubishi Denki Kabushiki Kaisha Surface undulation inspection apparatus
CN110044292A (zh) * 2018-01-16 2019-07-23 郑州宇通客车股份有限公司 一种基于线结构光的三维测量方法和系统
JP2023059540A (ja) * 2021-10-15 2023-04-27 大日本印刷株式会社 表面性状測定装置および表面性状測定方法

Also Published As

Publication number Publication date
JPH0211085B2 (ja) 1990-03-12

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