JPS5688366A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5688366A JPS5688366A JP16659479A JP16659479A JPS5688366A JP S5688366 A JPS5688366 A JP S5688366A JP 16659479 A JP16659479 A JP 16659479A JP 16659479 A JP16659479 A JP 16659479A JP S5688366 A JPS5688366 A JP S5688366A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- silicide
- polycrystalline
- substrate
- gate electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/661—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation
- H10D64/662—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation the conductor further comprising additional layers, e.g. multiple silicon layers having different crystal structures
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To obtain an MIS transistor having no signal delay by forming the gate electrode thereof in two-layer architecture of metallic silicide underlain with a polycrystalline Si layer and forming a wire on a gate dielectric film of a single metallic silicide layer. CONSTITUTION:A thick field SiO2 film 4 is formed on the periphery of a p type Si substrate 2, and n<+> type source and drain regions 6 and 8 are diffused in the substrate 2 surrounded thereby. Then, a gate SiO2 film 10 is formed on the surface of the substrate 2 exposed between the regions 6 and 8, and when a gate electrode is mounted thereon, a laminate of a polycrystalline Si layer 12 and an Mo silicide layer 14 are formed as a gate electrode with the layer 12 underlaid. When a wiring layer (not shown) is formed on the insulating film, single Mo silicide layer is used. Thus, it can overcome the demerits without losing the advantages of both the polycrystalline Si and the Mo silicide and can accelerate the operation of the device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16659479A JPS5688366A (en) | 1979-12-21 | 1979-12-21 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16659479A JPS5688366A (en) | 1979-12-21 | 1979-12-21 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5688366A true JPS5688366A (en) | 1981-07-17 |
Family
ID=15834171
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16659479A Pending JPS5688366A (en) | 1979-12-21 | 1979-12-21 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5688366A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62139343A (en) * | 1985-12-13 | 1987-06-23 | Nec Corp | Manufacture of semiconductor device |
| US5223456A (en) * | 1990-05-02 | 1993-06-29 | Quality Semiconductor Inc. | High density local interconnect in an integrated circit using metal silicide |
| US5254874A (en) * | 1990-05-02 | 1993-10-19 | Quality Semiconductor Inc. | High density local interconnect in a semiconductor circuit using metal silicide |
-
1979
- 1979-12-21 JP JP16659479A patent/JPS5688366A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62139343A (en) * | 1985-12-13 | 1987-06-23 | Nec Corp | Manufacture of semiconductor device |
| US5223456A (en) * | 1990-05-02 | 1993-06-29 | Quality Semiconductor Inc. | High density local interconnect in an integrated circit using metal silicide |
| US5254874A (en) * | 1990-05-02 | 1993-10-19 | Quality Semiconductor Inc. | High density local interconnect in a semiconductor circuit using metal silicide |
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