JPS5749231A - Forming method for electrode and wiring layer - Google Patents
Forming method for electrode and wiring layerInfo
- Publication number
- JPS5749231A JPS5749231A JP55125594A JP12559480A JPS5749231A JP S5749231 A JPS5749231 A JP S5749231A JP 55125594 A JP55125594 A JP 55125594A JP 12559480 A JP12559480 A JP 12559480A JP S5749231 A JPS5749231 A JP S5749231A
- Authority
- JP
- Japan
- Prior art keywords
- film
- plasma
- aluminum
- formation
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
- H10P50/26—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials
- H10P50/264—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means
- H10P50/266—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only
- H10P50/267—Dry etching; Plasma etching; Reactive-ion etching of conductive or resistive materials by chemical means by vapour etching only using plasmas
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To facilitate the formation of an electrode wiring layer by forming the second metallic film readily bromided with Ti or the like on an aluminum layer, selectively etching the second metallic film with bromine gas plasma and removing the aluminum layer with chlorine gas plasma. CONSTITUTION:A hole is opened at the oxidized film 2 on the surface of a substrate 1 formed with an active region 4 to expose the region 4, and aluminum film 3 is formed on the overall surface. A Ti film 5 (or Nb, Ta, Au, Mo bromide is readily formed as a metallic layer) is, for example, formed thinly consecutively onto the film 3. With the resist pattern 5 as a mask it is etched with plasma with Br2 gas to etch the film 5, and then the film 3 is etched with plasma with CCl4 gas of diluted Ar. Thus, it can prevent the formation of alumina on the film 3, thereby facilitating the formation of aluminum electrode wire by plasma etching.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55125594A JPS5749231A (en) | 1980-09-09 | 1980-09-09 | Forming method for electrode and wiring layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55125594A JPS5749231A (en) | 1980-09-09 | 1980-09-09 | Forming method for electrode and wiring layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5749231A true JPS5749231A (en) | 1982-03-23 |
Family
ID=14914009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55125594A Pending JPS5749231A (en) | 1980-09-09 | 1980-09-09 | Forming method for electrode and wiring layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5749231A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS556844A (en) * | 1978-06-28 | 1980-01-18 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Method of formating wiring pattern |
-
1980
- 1980-09-09 JP JP55125594A patent/JPS5749231A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS556844A (en) * | 1978-06-28 | 1980-01-18 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Method of formating wiring pattern |
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