JPS58210632A - パタ−ンエツジ検出回路 - Google Patents

パタ−ンエツジ検出回路

Info

Publication number
JPS58210632A
JPS58210632A JP57093049A JP9304982A JPS58210632A JP S58210632 A JPS58210632 A JP S58210632A JP 57093049 A JP57093049 A JP 57093049A JP 9304982 A JP9304982 A JP 9304982A JP S58210632 A JPS58210632 A JP S58210632A
Authority
JP
Japan
Prior art keywords
data
rising
circuit
falling
edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57093049A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0316780B2 (cs
Inventor
Hiroshige Sakahara
坂原 広重
Wataru Takahashi
渉 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57093049A priority Critical patent/JPS58210632A/ja
Publication of JPS58210632A publication Critical patent/JPS58210632A/ja
Publication of JPH0316780B2 publication Critical patent/JPH0316780B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
JP57093049A 1982-06-02 1982-06-02 パタ−ンエツジ検出回路 Granted JPS58210632A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57093049A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57093049A JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Publications (2)

Publication Number Publication Date
JPS58210632A true JPS58210632A (ja) 1983-12-07
JPH0316780B2 JPH0316780B2 (cs) 1991-03-06

Family

ID=14071649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57093049A Granted JPS58210632A (ja) 1982-06-02 1982-06-02 パタ−ンエツジ検出回路

Country Status (1)

Country Link
JP (1) JPS58210632A (cs)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102837A (en) * 1978-01-28 1979-08-13 Nippon Telegr & Teleph Corp <Ntt> Pattern check system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102837A (en) * 1978-01-28 1979-08-13 Nippon Telegr & Teleph Corp <Ntt> Pattern check system

Also Published As

Publication number Publication date
JPH0316780B2 (cs) 1991-03-06

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