JPS593350U - 粒度分布測定装置 - Google Patents

粒度分布測定装置

Info

Publication number
JPS593350U
JPS593350U JP9842082U JP9842082U JPS593350U JP S593350 U JPS593350 U JP S593350U JP 9842082 U JP9842082 U JP 9842082U JP 9842082 U JP9842082 U JP 9842082U JP S593350 U JPS593350 U JP S593350U
Authority
JP
Japan
Prior art keywords
particle size
size distribution
concentration
sedimentation
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9842082U
Other languages
English (en)
Other versions
JPH025404Y2 (ja
Inventor
竹内　和
林田　和弘
石田　昇平
哲夫 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP9842082U priority Critical patent/JPS593350U/ja
Publication of JPS593350U publication Critical patent/JPS593350U/ja
Application granted granted Critical
Publication of JPH025404Y2 publication Critical patent/JPH025404Y2/ja
Granted legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第１図は本考案実施例の構成図、第２図はその回転円盤
の正面図である。 ｌａ、　　ｌｂ・・・第１および第２の沈降容器、３・
・・回転円盤、４・・・濃度検出用光源、５・・・濃度
検出用受光部、７・・・信号弁別スイッチ、８・・・容
器位置検出円盤、１２・・・２ペンレコーダ、１３・・
・引算回路、１４・・・レコーダ。

Claims (1)

    【実用新案登録請求の範囲】
  1. 媒溶液中に均一に分散させた供試粒体を沈降容器内に密
    封して遠心力下で沈降させ、一定の沈降距離のところに
    上記沈降容器内の媒溶液中供試粒体濃度を検出する手段
    を設け、その濃度の時間的変化によって供試粒体の粒度
    分布を測定する装置において、上記沈降容器を複数個有
    し、上記濃度検出手段からの検出信号を上記複数個の沈
    降容器それぞれの濃度信号に弁別する手段と、その弁別
    された複数個の濃度信号を人力とする引算回路を備え、
    上記複数個の沈降容器内の溶液液面位を異らしめること
    によって、同時に複数個の異る沈降距離についての濃度
    を検出し、その複数個の濃度を独立的に用いて同時に供
    試粒体の粒度分布を測定し得るとともに、上記複数個の
    濃度信号を上記引算回路に導入して微分形粒度分布曲線
    を求め得るよう構成したことを特徴とする粒度分布測定
    装置。
JP9842082U 1982-06-30 1982-06-30 粒度分布測定装置 Granted JPS593350U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9842082U JPS593350U (ja) 1982-06-30 1982-06-30 粒度分布測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9842082U JPS593350U (ja) 1982-06-30 1982-06-30 粒度分布測定装置

Publications (2)

Publication Number Publication Date
JPS593350U true JPS593350U (ja) 1984-01-10
JPH025404Y2 JPH025404Y2 (ja) 1990-02-08

Family

ID=30233677

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9842082U Granted JPS593350U (ja) 1982-06-30 1982-06-30 粒度分布測定装置

Country Status (1)

Country Link
JP (1) JPS593350U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276431A (ja) * 1985-09-30 1987-04-08 Shimadzu Corp 遠心沈降式粒度分布測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276431A (ja) * 1985-09-30 1987-04-08 Shimadzu Corp 遠心沈降式粒度分布測定方法

Also Published As

Publication number Publication date
JPH025404Y2 (ja) 1990-02-08

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