JPS6060748A - 半導体装置の製造方法 - Google Patents

半導体装置の製造方法

Info

Publication number
JPS6060748A
JPS6060748A JP58170159A JP17015983A JPS6060748A JP S6060748 A JPS6060748 A JP S6060748A JP 58170159 A JP58170159 A JP 58170159A JP 17015983 A JP17015983 A JP 17015983A JP S6060748 A JPS6060748 A JP S6060748A
Authority
JP
Japan
Prior art keywords
layer
single crystal
substrate
type impurity
impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58170159A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0410748B2 (2
Inventor
Junji Sakurai
桜井 潤治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58170159A priority Critical patent/JPS6060748A/ja
Publication of JPS6060748A publication Critical patent/JPS6060748A/ja
Publication of JPH0410748B2 publication Critical patent/JPH0410748B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202Materials thereof
    • H10P14/3238Materials thereof being insulating materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/38Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done after the formation of the materials
    • H10P14/3802Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2902Materials being Group IVA materials
    • H10P14/2905Silicon, silicon germanium or germanium
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3242Structure
    • H10P14/3244Layer structure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3451Structure
    • H10P14/3452Microstructure
    • H10P14/3458Monocrystalline
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3466Crystal orientation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/38Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by treatments done after the formation of the materials
    • H10P14/3802Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
    • H10P14/382Scanning of a beam

Landscapes

  • Element Separation (AREA)
  • Recrystallisation Techniques (AREA)
JP58170159A 1983-09-13 1983-09-13 半導体装置の製造方法 Granted JPS6060748A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58170159A JPS6060748A (ja) 1983-09-13 1983-09-13 半導体装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58170159A JPS6060748A (ja) 1983-09-13 1983-09-13 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPS6060748A true JPS6060748A (ja) 1985-04-08
JPH0410748B2 JPH0410748B2 (2) 1992-02-26

Family

ID=15899772

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58170159A Granted JPS6060748A (ja) 1983-09-13 1983-09-13 半導体装置の製造方法

Country Status (1)

Country Link
JP (1) JPS6060748A (2)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7074061B1 (en) 1993-11-12 2006-07-11 Intel Corporation Versatile communications connectors

Also Published As

Publication number Publication date
JPH0410748B2 (2) 1992-02-26

Similar Documents

Publication Publication Date Title
EP0036137B1 (en) Method for production of semiconductor devices
EP0041776B2 (en) Method of manufacturing a semiconductor device comprising an isolation structure
JPS6037775A (ja) 集積回路構成体の製造方法
JPS6359251B2 (2)
EP0038178A1 (en) Method of manufacturing a semiconductor device containing a Schottky barrier, and device
JPS59920A (ja) 半導体装置の製造方法
JPS6060748A (ja) 半導体装置の製造方法
JP2783410B2 (ja) 半導体装置の製造方法および製造装置
JPH0467336B2 (2)
US5556793A (en) Method of making a structure for top surface gettering of metallic impurities
JPS5984435A (ja) 半導体集積回路及びその製造方法
JPH0345530B2 (2)
JPS5897863A (ja) 半導体装置の製造方法
JPS5885520A (ja) 半導体装置の製造方法
JPH0418460B2 (2)
JPS60245131A (ja) 半導体装置の製造方法
JPS5892209A (ja) 半導体装置の製造方法
JPS60154609A (ja) 半導体装置の製造方法
JPH01173712A (ja) 半導体装置の製造方法
JPS60116164A (ja) 半導体装置の製造方法
JPS5954222A (ja) 半導体装置の製造方法
JPS58218137A (ja) 半導体装置の製造方法
JPS59232439A (ja) 半導体装置の製造方法
JPH0748514B2 (ja) デバイスの製造方法
JPS59165435A (ja) 半導体装置の製造方法