JPS6065792A - Molecular beam crystal growth apparatus - Google Patents

Molecular beam crystal growth apparatus

Info

Publication number
JPS6065792A
JPS6065792A JP17245383A JP17245383A JPS6065792A JP S6065792 A JPS6065792 A JP S6065792A JP 17245383 A JP17245383 A JP 17245383A JP 17245383 A JP17245383 A JP 17245383A JP S6065792 A JPS6065792 A JP S6065792A
Authority
JP
Japan
Prior art keywords
source cell
molecular beam
liquid nitrogen
heater
irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17245383A
Other languages
Japanese (ja)
Inventor
Toshio Fujii
俊夫 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17245383A priority Critical patent/JPS6065792A/en
Publication of JPS6065792A publication Critical patent/JPS6065792A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • C30B23/02Epitaxial-layer growth
    • C30B23/06Heating of the deposition chamber, the substrate or the materials to be evaporated

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To enable the stable irradiation with molecular beam at a definite intensity until the irradiation source material is consumed, by using the titled apparatus furnished with a molecular beam source cell encircled with a liquid nitrogen shroud, wherein said source cell is heated at the opening end with a heater. CONSTITUTION:Liquid nitrogen is discharged from the liquid nitrogen shroud 2 to restore the beam source cell 1 to the room temperature. The shutter 3 is opened, the heater 5 is heated e.g. at 350 deg.C, and the state is maintained until e.g. to deposited As is consumed by evaporation. To prevent the contamination of the molecular beam source cell 1 with e.g. the evaporated and readsorbed As, the heater at the beam source cell is heated to e.g. about 250 deg.C. The mounting of the heater 12 at the inner surface of the liquid nitrogen shroud enables the prevention of the thermal adhesion of the beam source cell to the liquid nitrogen shroud by the attached deposit, the elimination of the lowering of the molecular beam intensity, and the irradiation with stable molecular beam having a definite intensity until the irradiation source material is consumed.

Description

【発明の詳細な説明】 (a)発明の技術分野 本発明は、半導体基板に分子線を照射し化合物半導体薄
膜等堆積させる分子線エピタキシアル成長装置に係り、
特に液体窒素シェラウドに堆積した分子線の除去を可能
とした分子線結晶成長装置に関する。
Detailed Description of the Invention (a) Technical Field of the Invention The present invention relates to a molecular beam epitaxial growth apparatus for irradiating a semiconductor substrate with a molecular beam to deposit a compound semiconductor thin film, etc.
In particular, the present invention relates to a molecular beam crystal growth apparatus capable of removing molecular beams deposited in a liquid nitrogen sheroud.

(b)従来技術の問題点 この種の分子線結晶成長装置は、超高真空のベルジャ装
置内に基板を保持し、これを数百度℃まで加熱出来る様
にし、又前記基板に対して分子線を発生ずる線源セルを
配置する。
(b) Problems with the prior art In this type of molecular beam crystal growth apparatus, a substrate is held in an ultra-high vacuum belljar apparatus, which can be heated to several hundred degrees Celsius, and the molecular beam crystal growth apparatus Place a source cell that generates radiation.

前記線源セル部分には、成膜加工中のヘルジャ真空度を
よくする為、液体窒素シュラウドを具え線源セルから発
生ずる不純物ガスあるいは、ベルジャ内の残留不純物ガ
スを吸着する様にされる。
The source cell portion is equipped with a liquid nitrogen shroud to adsorb impurity gas generated from the source cell or residual impurity gas within the bell jar in order to improve the degree of vacuum in the bell jar during film formation.

しかし、前記シュラウドは、不純物ガスだ番」でなく、
線源セルから射出する分子線も吸着する。
However, the shroud does not contain impurity gas,
The molecular beam emitted from the source cell is also adsorbed.

例えば、 GaAsやAlGaAsの成膜時は、多量の
砒素As分子線を発生(照射)するため、該線源セルを
囲む液体窒素シュラウド壁にはAsが多く吸着かつ堆積
して、線源セルとシュラウド壁の開口端面倒の隙間がな
くなり9両者が熱接触する状態となる。
For example, when forming a film of GaAs or AlGaAs, a large amount of arsenic As molecular beam is generated (irradiated), so a large amount of As is adsorbed and deposited on the wall of the liquid nitrogen shroud surrounding the source cell. There is no gap around the open end of the shroud wall 9 and the two are in thermal contact.

特に、前記Asや燐I)等の様な比較的低温度下で駆動
する分子線源セルでは、照射の分子線が堆積しやすい。
In particular, in a molecular beam source cell such as As or phosphorus (I) which is operated at a relatively low temperature, irradiated molecular beams tend to accumulate.

然し乍ら、前記熱接触状態になると線源セルを加熱して
もシェラウド壁に熱が逃げ、セル温度が所定温度になら
ず所望の分子線強度が得難いと云う問題がある。又、こ
れを修復するAs除去の作業には、 Asが周囲に飛散
して甚だ危険である。
However, in the thermal contact state, even if the radiation source cell is heated, heat escapes to the sheroud wall, and the cell temperature does not reach a predetermined temperature, making it difficult to obtain the desired molecular beam intensity. In addition, the work of removing As to repair this is extremely dangerous as As scatters into the surrounding area.

(C)発明の目的 本発明の目的は前記の問題点を解決することにある。(C) Purpose of the invention An object of the present invention is to solve the above-mentioned problems.

本発明では、線源セルと液体窒素シュラウド両者が熱接
触する状態となる前に、液体窒素シュラウドの一局部を
加熱して付着の堆積物を蒸発せしめる除去手段を提示す
るものである。
The present invention provides a removal means that heats a localized portion of the liquid nitrogen shroud to evaporate deposits before the source cell and the liquid nitrogen shroud come into thermal contact.

(d)発明の構成 前記目的は、液体窒素シュラウドで囲まれた分子線源セ
ルを具える分子線結晶成長装置において。
(d) Structure of the Invention The above object provides a molecular beam crystal growth apparatus comprising a molecular beam source cell surrounded by a liquid nitrogen shroud.

前記線源セルの開口端部を加熱せしめるヒータを設ける
ことにより達成される。
This is achieved by providing a heater that heats the open end of the radiation source cell.

(e)発明の実施例 以下9分子線結晶成長装置に於ける本発明の線源セル構
成実施例を第1図に従って詳細に説明する。
(e) Embodiments of the Invention An embodiment of the structure of the radiation source cell of the present invention in a nine-molecular beam crystal growth apparatus will be described in detail below with reference to FIG.

図は、セル軸に沿い切断した分子線源セルの簡略断面図
(イ)図と、 (イ)図のセル開口面側からみた正面図
(ロ)図である。
The figures are a simplified cross-sectional view (a) of the molecular beam source cell cut along the cell axis, and a front view (b) seen from the cell opening side in figure (a).

(イ)図に於いて、1は層状ボロンナイトライド(PB
N)で囲まれ照射源内蔵になる線源セル。
(a) In the figure, 1 is layered boron nitride (PB
A radiation source cell surrounded by N) and containing a built-in irradiation source.

2ば線源セル1を取り囲む液体窒素シュラウド。2. A liquid nitrogen shroud surrounding the source cell 1.

3は線源セル開口端側のシャッタ、4は線源セル1の背
後に導出する分子線発生用ヒータのリード線及び該ヒー
タの動作温度計測用熱電対のリード線、更に、5は線源
セル開口端側の液体窒素シュラウド内周面に設りる本発
明のヒータ配設部である。該配設のヒータ部はリード線
6により外部電源に接続される。又リード線7はヒータ
部5に対する計測用熱電対のリードである。
3 is a shutter on the open end side of the source cell; 4 is a lead wire of a heater for generating molecular beams led out behind the source cell 1; and a lead wire of a thermocouple for measuring the operating temperature of the heater; and 5 is a source of radiation. This is a heater installation portion of the present invention provided on the inner circumferential surface of the liquid nitrogen shroud on the cell opening end side. The arranged heater section is connected to an external power source through a lead wire 6. Further, the lead wire 7 is a lead of a measuring thermocouple to the heater section 5.

(1コ)図は線源セル開口部の正面図であり2図示の様
に液体窒素シュラウドの前記内周面に設ける本発明のヒ
ータ配設部が明示される。
(1) Figure 1 is a front view of the source cell opening, and as shown in Figure 2, the heater arrangement portion of the present invention provided on the inner circumferential surface of the liquid nitrogen shroud is clearly shown.

前記ヒータ5による開口部堆積物の除去力法を。A method of removing deposits from the opening using the heater 5.

As照射源セルの場合を例示して以下説明する。The case of an As irradiation source cell will be explained below as an example.

液体窒素シュラウドから液体窒素を抜き出し線源セルを
室温に戻す。シャッタを開放状態となした後、前記ヒー
タ部5を350℃まで加熱し、この状態を^S堆積物が
蒸発して無(なるまで保持する。
Extract liquid nitrogen from the liquid nitrogen shroud and return the source cell to room temperature. After opening the shutter, the heater section 5 is heated to 350° C., and this state is maintained until the ^S deposit evaporates and disappears.

併し、この間5分子線源セル側に前記蒸発のAsによる
再吸着がある。これを避ける為、線源セル側のヒータを
加熱して約250℃の温度に保持すれば。
However, during this time, the evaporated As is re-adsorbed on the 5-molecular beam source cell side. To avoid this, heat the heater on the radiation source cell side and maintain the temperature at about 250°C.

照射源の再吸着汚染を防ぎ得る(照射源は図示されない
)。
Re-adsorption contamination of the irradiation source can be prevented (irradiation source not shown).

この様な液体窒素シュラウド内周面のヒータ設置により
、付着した堆積物による線源セルと液体窒素シュラウド
との間の熱接触を防止することが出来る。
By installing such a heater on the inner peripheral surface of the liquid nitrogen shroud, it is possible to prevent thermal contact between the radiation source cell and the liquid nitrogen shroud due to attached deposits.

(f)発明の効果 以上、実施例図により詳細に説明した本発明の線源セル
構造を有する分子線結晶成長装置とすれば、従来問題に
なった液体窒素シェラウドとの接触による分子線強度の
劣化がなくなり、照射源材料がなくなる迄所定の強度で
安定な分子線照射がが出来る。
(f) Effects of the invention As described above, if a molecular beam crystal growth apparatus having the radiation source cell structure of the present invention, which is explained in detail with reference to the embodiment drawings, is used, the molecular beam intensity due to contact with the liquid nitrogen sheroud, which has been a problem in the past, can be reduced. Stable molecular beam irradiation can be performed at a predetermined intensity until no deterioration occurs and the irradiation source material is used up.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の線源セル構造実施例を示すセル断面図
(イ)図、及び線源セル開口面側の正面図(ロ)図であ
る。 図中、lは線源セル、2は液体窒素シュラウド。 3はシャッタ、4は線源セル1のヒータと該セル温度計
測用のリード線、及び5は本発明のし−タ(抵抗加熱線
)部である。 煕!酊 G)  2
FIG. 1 is a cell sectional view (A) and a front view (B) of the source cell opening side, showing an embodiment of the radiation source cell structure of the present invention. In the figure, l is a radiation source cell and 2 is a liquid nitrogen shroud. 3 is a shutter, 4 is a heater of the radiation source cell 1 and a lead wire for measuring the cell temperature, and 5 is a shield (resistance heating wire) portion of the present invention. Hee! Drunkenness G) 2

Claims (1)

【特許請求の範囲】[Claims] 液体窒素シュラウドで囲まれた分子線源セルを具える分
子線結晶成長装置において、前記線源セルの開口端部を
加熱せしめるヒータを設けたことを特徴とする分子線結
晶成長装置。
What is claimed is: 1. A molecular beam crystal growth apparatus comprising a molecular beam source cell surrounded by a liquid nitrogen shroud, further comprising a heater for heating an open end of the radiation source cell.
JP17245383A 1983-09-19 1983-09-19 Molecular beam crystal growth apparatus Pending JPS6065792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17245383A JPS6065792A (en) 1983-09-19 1983-09-19 Molecular beam crystal growth apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17245383A JPS6065792A (en) 1983-09-19 1983-09-19 Molecular beam crystal growth apparatus

Publications (1)

Publication Number Publication Date
JPS6065792A true JPS6065792A (en) 1985-04-15

Family

ID=15942263

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17245383A Pending JPS6065792A (en) 1983-09-19 1983-09-19 Molecular beam crystal growth apparatus

Country Status (1)

Country Link
JP (1) JPS6065792A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01177277U (en) * 1988-06-02 1989-12-18

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01177277U (en) * 1988-06-02 1989-12-18

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