JPS62199664U - - Google Patents

Info

Publication number
JPS62199664U
JPS62199664U JP8913786U JP8913786U JPS62199664U JP S62199664 U JPS62199664 U JP S62199664U JP 8913786 U JP8913786 U JP 8913786U JP 8913786 U JP8913786 U JP 8913786U JP S62199664 U JPS62199664 U JP S62199664U
Authority
JP
Japan
Prior art keywords
light
light beam
inspected
lens system
condensing lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8913786U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8913786U priority Critical patent/JPS62199664U/ja
Publication of JPS62199664U publication Critical patent/JPS62199664U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例である表面欠陥検
査装置の概略の正面図、第2図はその装置の概略
の斜視図、第3図および第4図はアルミ圧延板の
光学的特性についての説明図、第5図は正反射光
受光方式による従来例の概略の斜視図、第6図お
よび第7図は第5図の従来例による受光の状態を
示す説明図、第8図は正反射光・散乱光の両方を
受光する方式による従来例の概略の斜視図である
。 17…球面集光レンズ、17a…スリツト、1
8…レーザー発振器、19…回転ミラー、20…
ミラー、21…光電子増倍管。
Fig. 1 is a schematic front view of a surface defect inspection device that is an embodiment of this invention, Fig. 2 is a schematic perspective view of the device, and Figs. 3 and 4 show optical characteristics of a rolled aluminum plate. FIG. 5 is a schematic perspective view of a conventional example using the specular reflection light reception method, FIGS. 6 and 7 are explanatory diagrams showing the state of light reception by the conventional example of FIG. 5, and FIG. FIG. 2 is a schematic perspective view of a conventional example using a method of receiving both reflected light and scattered light. 17... Spherical condenser lens, 17a... Slit, 1
8... Laser oscillator, 19... Rotating mirror, 20...
Mirror, 21...photomultiplier tube.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検査体表面に対して垂直に光線を照射する投
光手段と、前記光線の通過を許容する隙間を一部
に有し被検査体表面での上記光線の散乱光を所定
位置に集光する集光レンズ系と、この集光レンズ
系により集光した光を受光して表面欠陥の有無を
検知する信号を出力する受光手段とを備えた表面
欠陥検査装置。
A light projecting means for irradiating a light beam perpendicularly to the surface of the object to be inspected, and a part having a gap that allows the light beam to pass through, condensing the scattered light of the light beam on the surface of the object to be inspected at a predetermined position. A surface defect inspection device comprising a condensing lens system and a light receiving means for receiving light condensed by the condensing lens system and outputting a signal for detecting the presence or absence of a surface defect.
JP8913786U 1986-06-10 1986-06-10 Pending JPS62199664U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8913786U JPS62199664U (en) 1986-06-10 1986-06-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8913786U JPS62199664U (en) 1986-06-10 1986-06-10

Publications (1)

Publication Number Publication Date
JPS62199664U true JPS62199664U (en) 1987-12-19

Family

ID=30947848

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8913786U Pending JPS62199664U (en) 1986-06-10 1986-06-10

Country Status (1)

Country Link
JP (1) JPS62199664U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007292770A (en) * 2006-04-26 2007-11-08 Siemens Ag Optical sensor for the detection of point, line or planar defects on a smooth surface

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007292770A (en) * 2006-04-26 2007-11-08 Siemens Ag Optical sensor for the detection of point, line or planar defects on a smooth surface

Similar Documents

Publication Publication Date Title
JPH0650903A (en) Apparatus and method for detecting surface particle
JPH08304050A (en) Magnetic film defect inspection system for magnetic disk
JPS62199664U (en)
JPS6427648U (en)
JPH0729452Y2 (en) Displacement measuring device
JPH0285310U (en)
JPS61105805U (en)
JPH0178938U (en)
JPS62140313U (en)
JPS63167246U (en)
JPS62195752U (en)
JPH0328363Y2 (en)
JPS60228908A (en) Inspection of surface defect
JPS58132810U (en) optical position measuring device
JPH0370178B2 (en)
JPS6253349U (en)
JPS6134117U (en) Light projection optical system in distance detection device
JPS58145507U (en) distance measuring device
JPH0252176U (en)
JPS60102605U (en) Light spot position measuring device
JPS60102606U (en) Light spot position measuring device
JPS5995205U (en) laser interferometer
JPS6448687U (en)
JPH0395907U (en)
JPS58180483U (en) Receiver for optical radar equipment