JPS6242516A - Organic metal thermal decomposition vapor growth device - Google Patents
Organic metal thermal decomposition vapor growth deviceInfo
- Publication number
- JPS6242516A JPS6242516A JP18226485A JP18226485A JPS6242516A JP S6242516 A JPS6242516 A JP S6242516A JP 18226485 A JP18226485 A JP 18226485A JP 18226485 A JP18226485 A JP 18226485A JP S6242516 A JPS6242516 A JP S6242516A
- Authority
- JP
- Japan
- Prior art keywords
- susceptor
- gas
- compound
- supply opening
- phosphorus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【発明の詳細な説明】
〔概要〕
りんの如き可燃性の物質が気相処理装置の排ガス部に析
出蓄積する装置において、当該装置を大気中にさらした
場合に、直接大気とりんが接触することのないように砒
素(As)またはAs化合物の析出を利用する装置であ
る。[Detailed Description of the Invention] [Summary] In a device in which flammable substances such as phosphorus are deposited and accumulated in the exhaust gas section of a gas phase treatment device, when the device is exposed to the atmosphere, the atmosphere and phosphorus come into direct contact. This is a device that utilizes the precipitation of arsenic (As) or an As compound to prevent this from occurring.
本発明は有機金属熱分解気相成長(MO−CVD)装置
に関するもので、さらに詳しく言えば、りんを含む化合
物半導体を成長するMO−CVD装置の改良に関するも
のである。The present invention relates to a metal organic pyrolytic vapor deposition (MO-CVD) apparatus, and more specifically, to an improvement of an MO-CVD apparatus for growing a compound semiconductor containing phosphorus.
従来用いられたMO−CVD装置は第3図の断面図に示
され、同図において、11は石英で作られた反応管、1
2は矢印方向に回転するサセプタ13上に載置された基
鈑、14はRFコイル(ヒータ)、15は排ガス処理装
置、16.17.18.19.20はTEiG、 TE
In。A conventionally used MO-CVD apparatus is shown in the cross-sectional view of FIG. 3, in which 11 is a reaction tube made of quartz;
2 is a base plate placed on a susceptor 13 rotating in the direction of the arrow, 14 is an RF coil (heater), 15 is an exhaust gas treatment device, 16.17.18.19.20 is TEiG, TE
In.
DEZn、 t’l13 、 Ast13ガスのボン
ベ、21はマスフローコントローラ(MFC)をそれぞ
れ示す。これらの気相反応ガスをMFC21で適宜コン
トロールして反応室11に送り、RFコイル14で加熱
しつつ基板12上に所望の化合物半導体を堆積させる。DEZn, t'l13, and Ast13 gas cylinders, and 21 indicate mass flow controllers (MFC), respectively. These gas phase reaction gases are appropriately controlled by the MFC 21 and sent to the reaction chamber 11, and a desired compound semiconductor is deposited on the substrate 12 while being heated by the RF coil 14.
上記した従来の装置においては、基板12以外のところ
、すなわちサセプタ13の周囲の反応管内壁、マニホー
ルド、排ガス管内などに気相反応ガスの残留成分が付着
N積される。この付着する物質にりんが含まれる場合、
反応管を酸素を含む雰囲気(大気)に開放した場合に発
火する危険があり、反応管を開放するについては細心の
注意が必要であった。また、サセプタに付着したりんの
化合物が加熱された場合に蒸発し、エピタキシャル結晶
の特性を劣化させる原因となっていた。さらには、りん
が燃えた後にはP2175やりん酸が反応管内壁に吸着
し内壁を汚染する問題もある。In the conventional apparatus described above, residual components of the gas phase reaction gas are deposited on areas other than the substrate 12, that is, on the inner wall of the reaction tube around the susceptor 13, the manifold, the exhaust gas pipe, etc. If this attached substance contains phosphorus,
There is a risk of ignition if the reaction tube is exposed to an oxygen-containing atmosphere (atmosphere), and great care must be taken when opening the reaction tube. Furthermore, phosphorus compounds adhering to the susceptor evaporate when heated, causing deterioration of the properties of the epitaxial crystal. Furthermore, after the phosphorus is burned, P2175 and phosphoric acid are adsorbed onto the inner wall of the reaction tube, contaminating the inner wall.
本発明はこのような点に鑑みて創作されたもので、反応
管を大気に開放したときにりんの発火が発生しないMO
−CVD装置を提供することを目的とする。The present invention was created in view of these points, and is an MO that does not cause phosphorus ignition when the reaction tube is opened to the atmosphere.
- The purpose is to provide a CVD device.
〔問題点を解決するための手段〕 第1図は本発明実施例の断面図である。[Means for solving problems] FIG. 1 is a sectional view of an embodiment of the present invention.
第1図のりんを含む化合物半導体の?l0−Cシυ用の
装置において、高周波誘導加熱のサセプタ13の上流部
から有機金属および■族元素水素化合物等のガスを供給
するに加え、サセプタ13の下流部から有機金属もしく
はアルシンガス、またはアルシンガスと有機金属ガスを
供給する構成とする。What about the compound semiconductor containing phosphorus in Figure 1? In the device for 10-C Siυ, in addition to supplying gases such as organometallic and group II element hydrogen compounds from the upstream part of the high-frequency induction heating susceptor 13, organometallic or arsine gas, or arsine gas is supplied from the downstream part of the susceptor 13. and an organometallic gas.
上記装置においては、基板以外の部分に付着したりん、
りん化合物等酸化し易い析出物が、反応管が大気にさら
された場合に直接大気に接触しないようにするため、り
んを含む析出物の上にAsを含む析出物で被覆(カバー
)する装置を設け、サセプタの上流部、下流部に析出蓄
積したりん化合物およびりんの上をAs化合物とAsの
析出物でカバーする。そのために、基板上へのエピタキ
シャル成長の目的のためのガス供給口以外に、Asおよ
びAs化合物を析出させるためのガス供給口を設け、さ
らにはAsおよびAs化合物の析出を促進させるための
加熱手段をサセプタ以外のところに設けるものである。In the above device, phosphorus attached to parts other than the substrate,
A device that covers phosphorus-containing precipitates with As-containing precipitates to prevent precipitates that are easily oxidized, such as phosphorus compounds, from coming into direct contact with the atmosphere when the reaction tube is exposed to the atmosphere. are provided, and the phosphorus compounds and phosphorus deposited and accumulated in the upstream and downstream parts of the susceptor are covered with As compounds and As precipitates. For this purpose, in addition to the gas supply port for the purpose of epitaxial growth on the substrate, a gas supply port for depositing As and As compounds is provided, and furthermore, a heating means is provided to promote the precipitation of As and As compounds. It is provided somewhere other than the susceptor.
以下、図面を参照して本発明の実施例を詳細に説明する
。Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図は本発明によるMO−CVD装置の断面図で、2
2はTMGガスボンベである。第3図に示した従来のM
O−CVD装置と異なるところは、As)I 3とTM
Gの供給ライン23と、サセフ1夕13を加熱するRF
コイル14以外に電気抵抗式のヒータ24、サセプタ下
流部のガスが基板の方に逆流することを防止する治具2
6が設けられていることである。なお第1図において、
25はヒータ24のための電源である。FIG. 1 is a cross-sectional view of the MO-CVD apparatus according to the present invention.
2 is a TMG gas cylinder. Conventional M shown in Figure 3
The difference from O-CVD equipment is As) I 3 and TM
G supply line 23 and RF heating the SASSEF 13
In addition to the coil 14, there is an electric resistance heater 24, and a jig 2 that prevents the gas downstream of the susceptor from flowing back toward the substrate.
6 is provided. In addition, in Figure 1,
25 is a power source for the heater 24.
InPの成長を行う場合には、InPの成長が終了する
約20分前からAs113とTMGを含むガスをライン
23、第2ガス供給口28から供給しく成長用ガスは従
来と同じく第1ガス供給口27から供給される)、ヒー
タ24の温度を、基板12へ影響することのないよう、
サセプタ13の温度より低い50℃〜100℃に保ち、
それによってガスの対流などが発生することな(一方向
に流れるようにする。When growing InP, a gas containing As113 and TMG is supplied from the line 23 and the second gas supply port 28 from about 20 minutes before the end of InP growth.The growth gas is supplied from the first gas as before. (supplied from the port 27), so as not to affect the temperature of the heater 24 on the substrate 12.
Maintain the temperature at 50°C to 100°C lower than the temperature of the susceptor 13,
This will prevent gas convection (flow in one direction).
InPの成長を停止した場合、TEInとPH3の供給
を停止した後さらにTMGとASH3の供給を約20分
続ける。このような処理をなすことにより、基板12以
外のところに析出するりんおよびりん化合物は、Asお
よびGaによって希釈され、さらにAsとGa−Asに
よってカバーされる。When the growth of InP is stopped, the supply of TMG and ASH3 is continued for about 20 minutes after the supply of TEIn and PH3 is stopped. By carrying out such treatment, phosphorus and phosphorus compounds deposited on areas other than the substrate 12 are diluted with As and Ga, and further covered with As and Ga-As.
第2図は第1図のサセプタ13の変形例を示し、本来の
サセプタ13に第2サセプタ13aを加えた二重構造と
し、サセプタ13と第2サセプタ13aの間に逆流防止
仕切板26aを配置し、反応ガスが矢印で示す如く流れ
るようにする。FIG. 2 shows a modification of the susceptor 13 in FIG. 1, which has a double structure in which a second susceptor 13a is added to the original susceptor 13, and a backflow prevention partition plate 26a is arranged between the susceptor 13 and the second susceptor 13a. and allow the reaction gas to flow as shown by the arrow.
以上述べたMO−CVD装置を用いることにより、基板
へのエピタキシャル成長の後に、基板取出しや各種治具
の洗浄のためにサセプタ、治具を大気にさらした場合、
りんの発火が防止され、安全衛生上の改善がなされる。By using the MO-CVD apparatus described above, when the susceptor and jigs are exposed to the atmosphere for taking out the substrate and cleaning various jigs after epitaxial growth on the substrate,
Phosphorous ignition is prevented and health and safety are improved.
りんは燃えやすいだけでなくそれ自体有害であるが、有
毒性ではあるが活性でなく取り扱い易いAsでカバーす
ることにより、りんについて発生した従来の問題が解決
されたのである。Phosphorus is not only flammable but also harmful in itself, but by covering it with As, which is toxic but inactive and easy to handle, the conventional problems encountered with phosphorus have been solved.
以上述べてきたようち本発明によれば、■りんおよびり
ん化合物の蓄積物の発火が防止され安全性が高まり、■
りんおよびりん化合物の蓄積物からのりん蒸気の発散が
低減され、基板/エピタキシャル層界面の特性劣化が低
減する効果がある。As described above, according to the present invention, the ignition of accumulated phosphorus and phosphorus compounds is prevented and safety is increased;
This has the effect of reducing the emission of phosphorus vapor from the accumulation of phosphorus and phosphorus compounds, and reducing the deterioration of characteristics at the substrate/epitaxial layer interface.
第1図は本発明実施例断面図、
第2図は第1図のサセプタの変形例断面図、第3図は従
来のMO−CVD装置の断面図である。
第1図ないし第3図において、
11は反応管、
12は基板、
13はサセプタ、
13aは第2サセプタ、
14はRFコイル、
15は排ガス処理装置、
16はTEGガスボンベ、
17はTEInガスボンベ、
18はDEZnガスボンベ、
19はPH3ガスボンベ、
20はへsH3ガスボンベ、
21はMFC。
22はTMGガスボンベ、
23はAsH3とTMGガスの供給ライン、24はヒー
タ、
25は電源、
26はガス逆流防止治具、
26aはガス逆流防止仕切板、
27は第1ガス供給口、
28は第2ガス供給口である。FIG. 1 is a sectional view of an embodiment of the present invention, FIG. 2 is a sectional view of a modification of the susceptor shown in FIG. 1, and FIG. 3 is a sectional view of a conventional MO-CVD apparatus. 1 to 3, 11 is a reaction tube, 12 is a substrate, 13 is a susceptor, 13a is a second susceptor, 14 is an RF coil, 15 is an exhaust gas treatment device, 16 is a TEG gas cylinder, 17 is a TEIn gas cylinder, 18 is a DEZn gas cylinder, 19 is a PH3 gas cylinder, 20 is a sH3 gas cylinder, and 21 is an MFC. 22 is a TMG gas cylinder, 23 is a supply line for AsH3 and TMG gas, 24 is a heater, 25 is a power supply, 26 is a gas backflow prevention jig, 26a is a gas backflow prevention partition plate, 27 is a first gas supply port, 28 is a first gas supply port 2 gas supply ports.
Claims (2)
長用ガスを供給する第1ガス供給口(27)を設け、 サセプタ(13、13a)の下方に有機金属と砒素また
は砒素化合物を供給する第2ガス供給口(28)を設け
たことを特徴とする有機金属熱分解気相成長装置。(1) In an apparatus for growing a compound semiconductor containing phosphorus, a first gas supply port (27) for supplying growth gas is provided above the high-frequency induction heating type susceptor (13, 13a), and the susceptor (13, 13a) An organometallic pyrolysis vapor phase growth apparatus characterized in that a second gas supply port (28) for supplying an organometal and arsenic or an arsenic compound is provided below.
)を設けたことを特徴とする特許請求の範囲第1項記載
の有機金属熱分解気相成長装置。(2) Heater (24) that heats the lower part of the susceptor (13)
) The organometallic pyrolysis vapor phase growth apparatus according to claim 1, further comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18226485A JPS6242516A (en) | 1985-08-20 | 1985-08-20 | Organic metal thermal decomposition vapor growth device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18226485A JPS6242516A (en) | 1985-08-20 | 1985-08-20 | Organic metal thermal decomposition vapor growth device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6242516A true JPS6242516A (en) | 1987-02-24 |
Family
ID=16115212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18226485A Pending JPS6242516A (en) | 1985-08-20 | 1985-08-20 | Organic metal thermal decomposition vapor growth device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6242516A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019151344A (en) * | 2018-02-28 | 2019-09-12 | 株式会社トーモク | Tray and packaging box |
-
1985
- 1985-08-20 JP JP18226485A patent/JPS6242516A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019151344A (en) * | 2018-02-28 | 2019-09-12 | 株式会社トーモク | Tray and packaging box |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| SE9500326D0 (en) | Method for protecting the susceptor during epitaxial growth by CVD and a device for epitaxial growth by CVD | |
| KR880013226A (en) | Thermal / Microwave Remote Plasma Multiprocessing Reactor and How to Use It | |
| JPH07111244A (en) | Vapor phase crystal growth equipment | |
| JPH1174202A5 (en) | ||
| JPH0680633B2 (en) | Vapor phase growth equipment | |
| JPH05251359A (en) | Vapor silicon epitaxial growth device | |
| EP0205034B1 (en) | Chemical vapor deposition method for the gaas thin film | |
| JPS62214616A (en) | Organo metallic vapor phase epitaxy equipment | |
| JP4427694B2 (en) | Film forming apparatus and film forming method | |
| JPS62190834A (en) | Vapor growth apparatus | |
| JPS61242011A (en) | Vapor-phase growth device | |
| SE9500327D0 (en) | Device for epitaxially growing SiC by CVD | |
| JPH0715133Y2 (en) | Reaction tube of semiconductor thin film forming equipment | |
| JPS63318733A (en) | Vapor-growth reaction pipe | |
| JPH01224295A (en) | Gas source molecular beam crystal growing apparatus | |
| JPS61185918A (en) | Vapor-phase epitaxial crystal growth equipment | |
| JPH05251360A (en) | Film forming equipment | |
| JPS63266816A (en) | Growing method for iii-v compound semiconductor crystal | |
| JPH0628245B2 (en) | Metalorganic vapor phase growth equipment | |
| JPS6353918A (en) | Semiconductor crystal growth apparatus | |
| JPH0265125A (en) | Reaction pipe of mocvd crystal growth device | |
| JP2700210B2 (en) | Vapor phase epitaxial growth of compound semiconductors | |
| JPH0536397B2 (en) | ||
| JPH0582040U (en) | Semiconductor heat treatment equipment | |
| JPH04130625A (en) | Vapor phase crystal growth apparatus |