JPS6360978U - - Google Patents
Info
- Publication number
- JPS6360978U JPS6360978U JP15419486U JP15419486U JPS6360978U JP S6360978 U JPS6360978 U JP S6360978U JP 15419486 U JP15419486 U JP 15419486U JP 15419486 U JP15419486 U JP 15419486U JP S6360978 U JPS6360978 U JP S6360978U
- Authority
- JP
- Japan
- Prior art keywords
- region
- depletion layer
- junction
- regions
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000005259 measurement Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Description
第１図は本考案の一実施例を示す断面図、第２
図は従来の放射線スペクトル測定の一例を示す断
面図、第３図は他の例を示す断面図、第４図は本
考案の他の実施例を示す断面図である。 １：ｐ型基板、２：ｎ＋領域、４：空乏層、６
：人射放射線。
図は従来の放射線スペクトル測定の一例を示す断
面図、第３図は他の例を示す断面図、第４図は本
考案の他の実施例を示す断面図である。 １：ｐ型基板、２：ｎ＋領域、４：空乏層、６
：人射放射線。
Claims (1)
- 一つの半導体基板が複数の厚さの異なる領域を
有し、各領域に空乏層形成のための接合が設けら
れたことを特徴とする半導体放射線検出器。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15419486U JPS6360978U (ja) | 1986-10-07 | 1986-10-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15419486U JPS6360978U (ja) | 1986-10-07 | 1986-10-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6360978U true JPS6360978U (ja) | 1988-04-22 |
Family
ID=31073768
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15419486U Pending JPS6360978U (ja) | 1986-10-07 | 1986-10-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6360978U (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011164048A (ja) * | 2010-02-15 | 2011-08-25 | Yokogawa Electric Corp | 放射線測定装置 |
-
1986
- 1986-10-07 JP JP15419486U patent/JPS6360978U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011164048A (ja) * | 2010-02-15 | 2011-08-25 | Yokogawa Electric Corp | 放射線測定装置 |