JPS6448860U - - Google Patents

Info

Publication number
JPS6448860U
JPS6448860U JP14295987U JP14295987U JPS6448860U JP S6448860 U JPS6448860 U JP S6448860U JP 14295987 U JP14295987 U JP 14295987U JP 14295987 U JP14295987 U JP 14295987U JP S6448860 U JPS6448860 U JP S6448860U
Authority
JP
Japan
Prior art keywords
piezoelectric element
side hole
hole
fitted
length direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14295987U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14295987U priority Critical patent/JPS6448860U/ja
Publication of JPS6448860U publication Critical patent/JPS6448860U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1〜2図は本考案の走査型トンネル顕微鏡用
探針の微動装置の実施例を示しており、第1図は
縦断面図、第2図は第1図の側方から見た部分縦
断面図、第3図A〜Fは、この微動装置の作用を
順番に示す略図、第4図はこの微動装置の制御回
路図、第5図は探針先端部分の拡大図、第6図は
別の制御回路を示す回路図、第7図は微動装置の
動きにつれて変化する移動距離を示す線図、第8
図はSTMの原理を示すブロツク図、第9図は第
8図のA部の原子状態を示す超拡大図である。 1:探針、1a:原子、2:物質、2a:原子
、3:X方向ピエゾ素子、4:Y方向ピエゾ素子
、5:Z方向ピエゾ素子、6:XY走査回路、7
:サーボ回路、8:メモリ、9:マイクロコンピ
ユータ、10:表示装置、11:トンネル電流増
幅器、12:本体、13:案内孔、14:第一の
移動軸、15:第二の移動軸、16:第一の圧電
素子、17:第一の側孔、18:第一の押圧片、
19:空間部、20:蓋体、21:第二の圧電素
子、22:第二の側孔、23:第二の押圧片、2
4:空間部、25:蓋体、26:第三の圧電素子
、27:パワーアンプ、28:高圧電源、29:
タイミングコントローラ、30:電源、31:指
令手段、32:伝達杆、33:タイミングコント
ローラ、34:サーボ、35:トンネル電流検出
器、36:サーボ、37:パワーアンプ。
Figures 1 and 2 show an embodiment of the fine movement device for a scanning tunneling microscope probe according to the present invention. 3A to 3F are schematic diagrams sequentially showing the functions of this fine adjustment device, FIG. 4 is a control circuit diagram of this fine adjustment device, FIG. 5 is an enlarged view of the tip of the probe, and FIG. A circuit diagram showing another control circuit, FIG. 7 is a diagram showing the moving distance that changes as the fine movement device moves, and FIG.
The figure is a block diagram showing the principle of STM, and FIG. 9 is a super enlarged view showing the atomic state of part A in FIG. 8. 1: Probe, 1a: Atom, 2: Substance, 2a: Atom, 3: X-direction piezo element, 4: Y-direction piezo element, 5: Z-direction piezo element, 6: XY scanning circuit, 7
: Servo circuit, 8: Memory, 9: Microcomputer, 10: Display device, 11: Tunnel current amplifier, 12: Main body, 13: Guide hole, 14: First movement axis, 15: Second movement axis, 16 : first piezoelectric element, 17: first side hole, 18: first pressing piece,
19: space, 20: lid, 21: second piezoelectric element, 22: second side hole, 23: second pressing piece, 2
4: Space, 25: Lid, 26: Third piezoelectric element, 27: Power amplifier, 28: High voltage power supply, 29:
timing controller, 30: power supply, 31: command means, 32: transmission rod, 33: timing controller, 34: servo, 35: tunnel current detector, 36: servo, 37: power amplifier.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 本体に設けたシリンダ状の案内孔にがたつきな
く、且つ案内孔の長さ方向に亘る移動自在に嵌装
された第一、第二の両移動軸と、この第一、第二
の両移動軸を互いに結合し、電圧の印加に基づい
て全長を変化させる第一の圧電素子と、上記案内
孔の内側面で、第一の移動軸の外周面に整合する
部分に開口した第一の側孔に、第一の移動軸に対
する遠近動を自在に嵌装され、第二の圧電素子に
よつて上記第一の側孔の長さ方向に駆動される第
一の押圧片と、上記案内孔の内側面で、第二の移
動軸の外周面に整合する部分に開口した第二の側
孔に、第二の移動軸に対する遠近動を自在に嵌装
され、第三の圧電素子によつて上記第二の側孔の
長さ方向に駆動される第二の押圧片とから成る、
走査型トンネル顕微鏡用探針の微動装置。
Both first and second moving shafts are fitted into a cylindrical guide hole provided in the main body so as to be movable in the length direction of the guide hole without rattling; a first piezoelectric element that connects the moving axes to each other and whose total length changes based on the application of a voltage; a first pressing piece fitted into the side hole so as to be freely movable near and far with respect to the first movement axis, and driven in the length direction of the first side hole by a second piezoelectric element; and the guide. A third piezoelectric element is fitted into a second side hole opened at a portion of the inner surface of the hole that is aligned with the outer circumferential surface of the second moving shaft, so as to be freely movable near and far with respect to the second moving shaft. and a second pressing piece driven in the length direction of the second side hole.
Fine movement device for the probe for scanning tunneling microscopes.
JP14295987U 1987-09-21 1987-09-21 Pending JPS6448860U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14295987U JPS6448860U (en) 1987-09-21 1987-09-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14295987U JPS6448860U (en) 1987-09-21 1987-09-21

Publications (1)

Publication Number Publication Date
JPS6448860U true JPS6448860U (en) 1989-03-27

Family

ID=31409348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14295987U Pending JPS6448860U (en) 1987-09-21 1987-09-21

Country Status (1)

Country Link
JP (1) JPS6448860U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03185302A (en) * 1989-12-15 1991-08-13 Hikari Gijutsu Kenkyu Kaihatsu Kk Scanning tunnel microscope

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62138071A (en) * 1985-12-11 1987-06-20 Nec Corp Linear motor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62138071A (en) * 1985-12-11 1987-06-20 Nec Corp Linear motor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03185302A (en) * 1989-12-15 1991-08-13 Hikari Gijutsu Kenkyu Kaihatsu Kk Scanning tunnel microscope

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