JPS647312Y2 - - Google Patents
Info
- Publication number
- JPS647312Y2 JPS647312Y2 JP1983135804U JP13580483U JPS647312Y2 JP S647312 Y2 JPS647312 Y2 JP S647312Y2 JP 1983135804 U JP1983135804 U JP 1983135804U JP 13580483 U JP13580483 U JP 13580483U JP S647312 Y2 JPS647312 Y2 JP S647312Y2
- Authority
- JP
- Japan
- Prior art keywords
- tube
- sample
- plasma
- central tube
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【考案の詳細な説明】
(イ) 産業上の利用分野
本考案は誘導結合プラズマ式(以下ICPと略称
する)発光分光分析に用いるプラズマトーチに関
するものである。[Detailed description of the invention] (a) Industrial application field The present invention relates to a plasma torch used for inductively coupled plasma (hereinafter abbreviated as ICP) emission spectrometry analysis.
(ロ) 従来技術
近年ICP分析法が広く用いられるようになり装
置を種々改良されているが、三重管構造のプラズ
マトーチの形状はほとんど変わつていない。現在
のICP分析は比較的低い高周波出力で行われる傾
向にありプラズマの圧力も小さくなつているが、
プラズマトーチの中心管の形状はかつて高い高周
波出力を用いていたときにプラズマの中心部に穴
を穿け易いように先端開口部を細く絞つていた形
状をそのまま踏襲している。しかしながら最近の
ように低出力のICP分析ではプラズマの圧力も低
く、中心管の先端を絞つて試料ガスの流速を増す
必要はなくなつており、むしろそれによつて分析
感度やSN比の向上を阻害しているという問題が
あつた。(b) Prior Art Although the ICP analysis method has become widely used in recent years and various improvements have been made to the equipment, the shape of the triple-tube plasma torch has remained largely unchanged. Current ICP analysis tends to be performed with relatively low high-frequency power, and the plasma pressure is becoming smaller.
The shape of the central tube of a plasma torch follows the same shape as in the past, when high-frequency output was used, the opening at the tip was narrowed to make it easier to punch a hole in the center of the plasma. However, in recent low-power ICP analysis, the plasma pressure is low, and there is no longer a need to increase the flow rate of the sample gas by constricting the tip of the central tube, which actually hinders the improvement of analytical sensitivity and signal-to-noise ratio. I had a problem with that.
(ハ) 目的
本考案は上記の問題点に鑑み、プラズマトーチ
の中心管の先端部をストレートにするというきわ
めて簡単な改造により試料ガス中の溶液試料の濃
度を高め得るようにして分析感度を高くすると共
に、試料ガスのプラズマ内での流速を低くして分
析元素の励起効率を高めSN比を向上することを
目的とするものである。(c) Purpose In view of the above-mentioned problems, the present invention has been developed to increase the concentration of the solution sample in the sample gas by a very simple modification of straightening the tip of the central tube of the plasma torch, thereby increasing the analytical sensitivity. At the same time, the purpose is to lower the flow velocity of the sample gas in the plasma to increase the excitation efficiency of the analysis elements and improve the signal-to-noise ratio.
(ニ) 構成
本考案によるプラズマトーチは中心管の管壁に
おける溶液試料からの試料塩の析出を防ぐために
できるだけ管の曲がりを少くしたものであり、中
心管の下端を弾性チユーブを介することなく真直
に下方に延ばして試料霧化器に直接連結すると共
に、中心管の両端部を絞らずに下部より上端開口
まで同一管径とし、かつ上記中心管の中に同軸的
に更に補助管を設け、この補助管にもキヤリヤガ
スを供給し得るようにしたものである。(D) Structure The plasma torch according to the present invention has the tube bent as little as possible in order to prevent the precipitation of sample salt from the solution sample on the tube wall of the center tube, and the lower end of the center tube is straightened without passing through an elastic tube. The center tube is extended downward and directly connected to the sample atomizer, and both ends of the center tube are made to have the same diameter from the lower part to the upper end opening without constriction, and an auxiliary tube is further provided coaxially within the center tube, Carrier gas can also be supplied to this auxiliary pipe.
(ホ) 実施例
図は本考案の一実施例を示したもので、プラズ
マトーチは中心管1、外管2、最外管3よりなる
三重管で構成されており、本考案では中心管1の
中に試料ガスの流速を調節するための補助管4を
設けている。中心管1の下端は従来のような弾性
チユーブを用いずに真直なまゝで直接試料霧化器
5に連結されており、中心管1の上端部は従来の
ように細く絞らずに下部から上端開口6まで同一
管径に形成されている。図中7はキヤリヤガス
(アルゴンガス)供給用チユーブ、8は溶液試料
Aを吸い上げるためのパイプ、9はドレインであ
る。外管2へ供給されたアルゴンガスは高周波コ
イル10による誘起電界で励起されて図のように
中心部に穴の穿いた筒状のプラズマ炎Pを形成し
て試料ガスのプラズマ内への導入を容易にしてい
る。プラズマ発光分析では試料原子はプラズマ炎
の中心に供給され、プラズマ炎内を外周に向つて
拡散するが、試料原子はプラズマ炎内で外側程高
温でないと、中心部で発生した試料原子の光が相
対的に低温の外側の試料蒸気により吸収されるこ
とになつて感度が低下するから、プラズマ炎の中
心部には穴をあけてプラズマ炎に供給される試料
蒸気が中心から外周に向つて温度が高くなるよう
にしている。中心管を先端を絞らない場合、中心
管に供給されるガス流量によつては中心管から吹
出すガスの流速がプラズマ炎の中心に穴をあける
のに充分でない場合があるが、そのような場合、
補助管4にもキヤリヤガスを供給することで、補
助管の先端噴流により中心管噴流を加速してプラ
ズマ炎に穴をあけることができる。また最外管へ
供給されたアルゴンガスはプラズマ炎と高周波コ
イルとの間の熱の遮断の役目をしている。(e) Example The figure shows an example of the present invention. The plasma torch is composed of a triple tube consisting of a central tube 1, an outer tube 2, and an outermost tube 3. In the present invention, the central tube 1 An auxiliary pipe 4 for adjusting the flow rate of the sample gas is provided inside. The lower end of the central tube 1 is directly connected to the sample atomizer 5 without using an elastic tube as in the conventional case, and the upper end of the central tube 1 is connected directly to the sample atomizer 5 without using a conventional elastic tube. The tubes are formed to have the same diameter up to the upper end opening 6. In the figure, 7 is a carrier gas (argon gas) supply tube, 8 is a pipe for sucking up the solution sample A, and 9 is a drain. The argon gas supplied to the outer tube 2 is excited by the electric field induced by the high-frequency coil 10 to form a cylindrical plasma flame P with a hole in the center as shown in the figure, and the sample gas is introduced into the plasma. It's easy. In plasma emission analysis, sample atoms are supplied to the center of the plasma flame and diffuse toward the outer periphery within the plasma flame. However, if the sample atoms are not as hot as the outside of the plasma flame, the light from the sample atoms generated at the center will be Since the sensitivity decreases as the sample vapor is absorbed by the sample vapor on the outside, which is relatively low temperature, a hole is made in the center of the plasma flame so that the sample vapor supplied to the plasma flame has a lower temperature from the center to the outer periphery. is set to be high. If the tip of the center tube is not constricted, depending on the gas flow rate supplied to the center tube, the flow rate of the gas blown out from the center tube may not be sufficient to make a hole in the center of the plasma flame. case,
By supplying carrier gas to the auxiliary tube 4 as well, the central tube jet can be accelerated by the jet at the tip of the auxiliary tube to punch a hole in the plasma flame. Furthermore, the argon gas supplied to the outermost tube serves as a heat shield between the plasma flame and the high-frequency coil.
(ヘ) 効果
上述の構成によれば試料ガスの通路となる中心
管が根元から先端開口までストレートの形状とな
り細い部分がなくなつたので、試料ガス中の試料
溶液含有率を高くしても、試料塩が中心管の出口
付近に折出するおそれがなくなり、また同様な理
由により溶液中の試料濃度を高くすることができ
るので、プラズマ中へ一度に多量の試料を導入す
ることによつて発光量を増し分析感度を高めると
いう利点がある。また従来のように中心管の出口
を絞らないのでプラズマ中に導入される試料ガス
の径が太くなつてプラズマとの接触面積が大きく
なると共に、試料ガスのプラズマ中でのドリフト
速度が低くなつて分析元素の励起効率が高くなり
SN比が向上するという利点がある。(f) Effects According to the above configuration, the central tube, which serves as a passage for the sample gas, has a straight shape from the root to the tip opening, and there is no thin part, so even if the content of the sample solution in the sample gas is increased, There is no risk of the sample salt being precipitated near the exit of the central tube, and for the same reason, the sample concentration in the solution can be increased, so by introducing a large amount of sample into the plasma at once, light emission is achieved. It has the advantage of increasing the amount and increasing the analytical sensitivity. In addition, since the outlet of the central tube is not constricted as in the conventional method, the diameter of the sample gas introduced into the plasma becomes larger, the contact area with the plasma becomes larger, and the drift velocity of the sample gas in the plasma becomes lower. The excitation efficiency of the analyzed elements is increased.
This has the advantage of improving the signal-to-noise ratio.
実験によれば、中心管の内径が最外管の内径の
3/18以上であるときに分析感度およびSN比の顕
著な向上が見られた。なお試料の種類によつて適
当な試料ガスの流速が不足してプラズマ中への導
入がスムースでない場合でも、中心管の上端を絞
らずに中心管の中に補助管4を設けているので、
補助管へ供給するアルゴンガスの噴出力によつて
中心管からのガス流速を調節することができる。
このようにすれば中心管の先端を絞ることなく試
料ガスの流速を上げることができるという利点が
ある。 According to experiments, when the inner diameter of the central tube was 3/18 or more of the inner diameter of the outermost tube, a significant improvement in analytical sensitivity and signal-to-noise ratio was observed. Note that even if the sample gas is not introduced smoothly into the plasma due to insufficient flow rate depending on the type of sample, the auxiliary tube 4 is installed inside the center tube without constricting the upper end of the center tube.
The gas flow rate from the central tube can be adjusted by adjusting the jetting force of the argon gas supplied to the auxiliary tube.
This has the advantage that the flow rate of the sample gas can be increased without constricting the tip of the central tube.
図は本考案の一実施例を示すための一部断面を
示した側面図である。
1……中心管、2……外管、3……最外管、4
……補助管、5……試料霧化器、6……上端開
口、7……キヤリヤガス供給用チユーブ、8……
試料吸い上げ用パイプ、9……ドレイン、10…
…高周波コイル、A……溶液試料、P……プラズ
マ炎。
The figure is a partially sectional side view showing an embodiment of the present invention. 1...Central tube, 2...Outer tube, 3...Outermost tube, 4
... Auxiliary tube, 5 ... Sample atomizer, 6 ... Upper end opening, 7 ... Carrier gas supply tube, 8 ...
Sample suction pipe, 9...Drain, 10...
...High frequency coil, A...Solution sample, P...Plasma flame.
Claims (1)
ラズマ炎形成用のアルゴンガスを供給する外管
と、プラズマ炎の外側へ冷却用ガスを供給する最
外管とで構成された三重管構造のプラズマトーチ
において、中心管の下端を真直に延ばして試料霧
化器に直接連結すると共に、中心管の上端部を絞
らずに下部より上端開口まで同一管径とし、かつ
上記中心管内に同軸的に補助管を挿入配置し、同
補助管にもキヤリヤガスを供給し得るようにした
ことを特徴とするICP発光分光分析用プラズマト
ーチ。 A plasma torch with a triple tube structure consisting of a central tube that supplies an aerosol of the solution sample, an outer tube that supplies argon gas for plasma flame formation, and an outermost tube that supplies cooling gas to the outside of the plasma flame. In this case, the lower end of the central tube is extended straight and connected directly to the sample atomizer, and the upper end of the central tube is not constricted but has the same diameter from the lower part to the upper end opening, and an auxiliary tube is installed coaxially within the central tube. A plasma torch for ICP emission spectrometry analysis, characterized in that a carrier gas can also be supplied to the auxiliary tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13580483U JPS6042944U (en) | 1983-08-31 | 1983-08-31 | Plasma torch for ICP emission spectrometry |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13580483U JPS6042944U (en) | 1983-08-31 | 1983-08-31 | Plasma torch for ICP emission spectrometry |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6042944U JPS6042944U (en) | 1985-03-26 |
| JPS647312Y2 true JPS647312Y2 (en) | 1989-02-27 |
Family
ID=30305547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13580483U Granted JPS6042944U (en) | 1983-08-31 | 1983-08-31 | Plasma torch for ICP emission spectrometry |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6042944U (en) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5772151U (en) * | 1980-10-17 | 1982-05-01 | ||
| JPS5886556U (en) * | 1981-12-07 | 1983-06-11 | 川崎製鉄株式会社 | Plasma torch for IPC emission spectrometer |
-
1983
- 1983-08-31 JP JP13580483U patent/JPS6042944U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6042944U (en) | 1985-03-26 |
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