NL8702071A - Inrichting voor het puntsgewijs aftasten van een voorwerp. - Google Patents

Inrichting voor het puntsgewijs aftasten van een voorwerp. Download PDF

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Publication number
NL8702071A
NL8702071A NL8702071A NL8702071A NL8702071A NL 8702071 A NL8702071 A NL 8702071A NL 8702071 A NL8702071 A NL 8702071A NL 8702071 A NL8702071 A NL 8702071A NL 8702071 A NL8702071 A NL 8702071A
Authority
NL
Netherlands
Prior art keywords
signal
radiation
scanning
processing unit
frequency
Prior art date
Application number
NL8702071A
Other languages
English (en)
Dutch (nl)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NL8702071A priority Critical patent/NL8702071A/nl
Priority to EP88201826A priority patent/EP0307029B1/fr
Priority to DE88201826T priority patent/DE3885218T2/de
Priority to JP63216437A priority patent/JPH01158578A/ja
Publication of NL8702071A publication Critical patent/NL8702071A/nl
Priority to US08/167,423 priority patent/US5450501A/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/50—Optics for phase object visualisation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Processing (AREA)
NL8702071A 1987-09-03 1987-09-03 Inrichting voor het puntsgewijs aftasten van een voorwerp. NL8702071A (nl)

Priority Applications (5)

Application Number Priority Date Filing Date Title
NL8702071A NL8702071A (nl) 1987-09-03 1987-09-03 Inrichting voor het puntsgewijs aftasten van een voorwerp.
EP88201826A EP0307029B1 (fr) 1987-09-03 1988-08-26 Dispositif pour le balayage point par point d'un objet
DE88201826T DE3885218T2 (de) 1987-09-03 1988-08-26 Vorrichtung zum punktweisen Abtasten eines Gegenstandes.
JP63216437A JPH01158578A (ja) 1987-09-03 1988-09-01 物体点順次走査装置
US08/167,423 US5450501A (en) 1987-09-03 1993-01-05 Apparatus for the point-by-point scanning of an object

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8702071 1987-09-03
NL8702071A NL8702071A (nl) 1987-09-03 1987-09-03 Inrichting voor het puntsgewijs aftasten van een voorwerp.

Publications (1)

Publication Number Publication Date
NL8702071A true NL8702071A (nl) 1989-04-03

Family

ID=19850544

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8702071A NL8702071A (nl) 1987-09-03 1987-09-03 Inrichting voor het puntsgewijs aftasten van een voorwerp.

Country Status (5)

Country Link
US (1) US5450501A (fr)
EP (1) EP0307029B1 (fr)
JP (1) JPH01158578A (fr)
DE (1) DE3885218T2 (fr)
NL (1) NL8702071A (fr)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8926435D0 (en) * 1989-11-22 1990-01-10 Secr Defence Phase measuring scanning optical microscope
JP3018687B2 (ja) * 1991-12-12 2000-03-13 松下電器産業株式会社 走査型レーザー顕微鏡
ATE248364T1 (de) * 1997-01-16 2003-09-15 Stanislav Fedorovich Rastopov Verfahren und vorrichtung zur aufzeichnung der bewegung von mikroskopischen objekten
US6121603A (en) * 1997-12-01 2000-09-19 Hang; Zhijiang Optical confocal device having a common light directing means
US6262818B1 (en) * 1998-10-07 2001-07-17 Institute Of Applied Optics, Swiss Federal Institute Of Technology Method for simultaneous amplitude and quantitative phase contrast imaging by numerical reconstruction of digital holograms
US7365858B2 (en) * 2001-12-18 2008-04-29 Massachusetts Institute Of Technology Systems and methods for phase measurements
US7557929B2 (en) 2001-12-18 2009-07-07 Massachusetts Institute Of Technology Systems and methods for phase measurements
FR2842407B1 (fr) * 2002-07-18 2005-05-06 Mauna Kea Technologies "procede et appareillage d'imagerie de fluorescence confocale fibree"
US8662962B2 (en) * 2008-06-30 2014-03-04 3M Innovative Properties Company Sandpaper with non-slip coating layer and method of using
EP3538941B1 (fr) 2016-11-10 2025-04-23 The Trustees of Columbia University in the City of New York Procédés d'imagerie rapide de grands échantillons à haute résolution
TWI662262B (zh) * 2018-04-20 2019-06-11 國立臺灣大學 具等向性轉換函數之量化差分相位對比顯微系統

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7413162A (nl) * 1974-10-07 1976-04-09 Philips Nv Inrichting voor het uitlezen van een schijf- vormige registratiedrager.
US4020333A (en) * 1975-05-06 1977-04-26 International Business Machines Corporation Digital filter for filtering complex signals
NL7600843A (nl) * 1976-01-28 1977-08-01 Philips Nv Inrichting voor het uitlezen van een registratie- drager waarop informatie, bijvoorbeeld en/of ge- luidsinformatie, is aangebracht.
NL8103505A (nl) * 1981-07-24 1983-02-16 Philips Nv Inrichting voor het puntsgewijs aftasten van een voorwerp.
US4791590A (en) * 1985-11-19 1988-12-13 Cornell Research Foundation, Inc. High performance signal processor

Also Published As

Publication number Publication date
EP0307029B1 (fr) 1993-10-27
US5450501A (en) 1995-09-12
DE3885218T2 (de) 1994-05-05
DE3885218D1 (de) 1993-12-02
EP0307029A1 (fr) 1989-03-15
JPH01158578A (ja) 1989-06-21

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