SG21890G - Apparatus for use in testing circuit boards - Google Patents

Apparatus for use in testing circuit boards

Info

Publication number
SG21890G
SG21890G SG218/90A SG21890A SG21890G SG 21890 G SG21890 G SG 21890G SG 218/90 A SG218/90 A SG 218/90A SG 21890 A SG21890 A SG 21890A SG 21890 G SG21890 G SG 21890G
Authority
SG
Singapore
Prior art keywords
baskets
circuit boards
electrical connectors
test chamber
testing circuit
Prior art date
Application number
SG218/90A
Other languages
English (en)
Original Assignee
Venturedyne Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Venturedyne Ltd filed Critical Venturedyne Ltd
Publication of SG21890G publication Critical patent/SG21890G/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817Environmental-, stress-, or burn-in tests

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Tests Of Electronic Circuits (AREA)
SG218/90A 1984-11-07 1990-03-16 Apparatus for use in testing circuit boards SG21890G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/669,117 US4683424A (en) 1984-11-07 1984-11-07 Apparatus for use in testing circuit boards

Publications (1)

Publication Number Publication Date
SG21890G true SG21890G (en) 1990-07-06

Family

ID=24685097

Family Applications (1)

Application Number Title Priority Date Filing Date
SG218/90A SG21890G (en) 1984-11-07 1990-03-16 Apparatus for use in testing circuit boards

Country Status (7)

Country Link
US (1) US4683424A (fr)
EP (1) EP0181729B1 (fr)
JP (1) JPH0677043B2 (fr)
AT (1) ATE48931T1 (fr)
CA (1) CA1238113A (fr)
DE (1) DE3574924D1 (fr)
SG (1) SG21890G (fr)

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US8238099B2 (en) 2008-04-17 2012-08-07 Teradyne, Inc. Enclosed operating area for disk drive testing systems
US8041449B2 (en) 2008-04-17 2011-10-18 Teradyne, Inc. Bulk feeding disk drives to disk drive testing systems
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US8628239B2 (en) 2009-07-15 2014-01-14 Teradyne, Inc. Storage device temperature sensing
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US7995349B2 (en) 2009-07-15 2011-08-09 Teradyne, Inc. Storage device temperature sensing
JP2011242338A (ja) * 2010-05-20 2011-12-01 Advantest Corp 試験装置
JP2011242339A (ja) * 2010-05-20 2011-12-01 Advantest Corp テストヘッド、試験ボードおよび試験装置
US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US8687349B2 (en) 2010-07-21 2014-04-01 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
EP2766785B1 (fr) 2011-10-14 2019-03-13 Ergotron, Inc. Systèmes et procédés de bras de montage de tablette
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US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
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RU208609U1 (ru) * 2021-09-27 2021-12-28 Федеральное государственное казённое военное образовательное учреждение высшего образования "Военная академия материально-технического обеспечения имени генерала армии А.В. Хрулева" Министерства обороны Российской Федерации Устройство для хранения и транспортирования автомобильного имущества

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Also Published As

Publication number Publication date
US4683424A (en) 1987-07-28
JPH0677043B2 (ja) 1994-09-28
JPS61114175A (ja) 1986-05-31
EP0181729A1 (fr) 1986-05-21
CA1238113A (fr) 1988-06-14
DE3574924D1 (de) 1990-01-25
ATE48931T1 (de) 1990-01-15
EP0181729B1 (fr) 1989-12-20

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