ATE48931T1 - Vorrichtung zur pruefung von schaltungsplatten. - Google Patents

Vorrichtung zur pruefung von schaltungsplatten.

Info

Publication number
ATE48931T1
ATE48931T1 AT85307793T AT85307793T ATE48931T1 AT E48931 T1 ATE48931 T1 AT E48931T1 AT 85307793 T AT85307793 T AT 85307793T AT 85307793 T AT85307793 T AT 85307793T AT E48931 T1 ATE48931 T1 AT E48931T1
Authority
AT
Austria
Prior art keywords
baskets
circuit boards
electrical connectors
test chamber
testing circuit
Prior art date
Application number
AT85307793T
Other languages
English (en)
Inventor
Robert A Cutright
Mark W Briggs
George J Bouwman
Original Assignee
Venturedyne Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Venturedyne Ltd filed Critical Venturedyne Ltd
Application granted granted Critical
Publication of ATE48931T1 publication Critical patent/ATE48931T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817Environmental-, stress-, or burn-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
AT85307793T 1984-11-07 1985-10-29 Vorrichtung zur pruefung von schaltungsplatten. ATE48931T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/669,117 US4683424A (en) 1984-11-07 1984-11-07 Apparatus for use in testing circuit boards
EP85307793A EP0181729B1 (de) 1984-11-07 1985-10-29 Vorrichtung zur Prüfung von Schaltungsplatten

Publications (1)

Publication Number Publication Date
ATE48931T1 true ATE48931T1 (de) 1990-01-15

Family

ID=24685097

Family Applications (1)

Application Number Title Priority Date Filing Date
AT85307793T ATE48931T1 (de) 1984-11-07 1985-10-29 Vorrichtung zur pruefung von schaltungsplatten.

Country Status (7)

Country Link
US (1) US4683424A (de)
EP (1) EP0181729B1 (de)
JP (1) JPH0677043B2 (de)
AT (1) ATE48931T1 (de)
CA (1) CA1238113A (de)
DE (1) DE3574924D1 (de)
SG (1) SG21890G (de)

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US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US8687349B2 (en) 2010-07-21 2014-04-01 Teradyne, Inc. Bulk transfer of storage devices using manual loading
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Also Published As

Publication number Publication date
EP0181729A1 (de) 1986-05-21
SG21890G (en) 1990-07-06
US4683424A (en) 1987-07-28
EP0181729B1 (de) 1989-12-20
JPS61114175A (ja) 1986-05-31
DE3574924D1 (de) 1990-01-25
JPH0677043B2 (ja) 1994-09-28
CA1238113A (en) 1988-06-14

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