TW356596B - Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit - Google Patents

Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit

Info

Publication number
TW356596B
TW356596B TW086108963A TW86108963A TW356596B TW 356596 B TW356596 B TW 356596B TW 086108963 A TW086108963 A TW 086108963A TW 86108963 A TW86108963 A TW 86108963A TW 356596 B TW356596 B TW 356596B
Authority
TW
Taiwan
Prior art keywords
digital
converter
facility
signals
analog
Prior art date
Application number
TW086108963A
Other languages
English (en)
Inventor
Manoj Sachdev
Original Assignee
Koninl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninl Philips Electronics Nv filed Critical Koninl Philips Electronics Nv
Application granted granted Critical
Publication of TW356596B publication Critical patent/TW356596B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
TW086108963A 1996-10-16 1997-06-26 Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit TW356596B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96202881 1996-10-16

Publications (1)

Publication Number Publication Date
TW356596B true TW356596B (en) 1999-04-21

Family

ID=8224498

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086108963A TW356596B (en) 1996-10-16 1997-06-26 Testing control signals in A/D converters the invention relates to an integrated circuit containing an A/D converter and a test circuit

Country Status (6)

Country Link
US (1) US5969653A (zh)
EP (1) EP0867072A2 (zh)
JP (1) JP2000502542A (zh)
KR (1) KR19990072173A (zh)
TW (1) TW356596B (zh)
WO (1) WO1998017003A2 (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6184810B1 (en) * 1997-08-29 2001-02-06 Texas Instruments Incorporated Method and apparatus to generate mixed signal test stimulus
US6813579B1 (en) * 2001-12-14 2004-11-02 Cirrus Logic, Inc. Apparatus and method for test mode control
TWI233495B (en) * 2004-02-11 2005-06-01 Ind Tech Res Inst IC with built-in self-test function and design method thereof
US20090039897A1 (en) * 2007-08-10 2009-02-12 Via Technologies, Inc. Systems and Methods for Scan Chain Testing Using Analog Signals
US9729163B1 (en) * 2016-08-30 2017-08-08 Qualcomm Incorporated Apparatus and method for in situ analog signal diagnostic and debugging with calibrated analog-to-digital converter
BE1026732B1 (de) * 2018-10-26 2020-06-03 Phoenix Contact Gmbh & Co Messgerät
TW202505404A (zh) * 2023-07-25 2025-02-01 智原科技股份有限公司 電子保險絲裝置及其操作方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4251881A (en) * 1978-06-05 1981-02-17 Storage Technology Corporation Centralized automatic gain control circuit
JPS57119259A (en) * 1981-01-19 1982-07-24 Hitachi Ltd Testing method for a/d converter
GB2145888B (en) * 1983-08-24 1986-06-18 Ferranti Plc Testing the transfer function linearity of analogue input circuits
US4947168A (en) * 1988-05-23 1990-08-07 Hughes Aircraft Company Subranging analog-to-digital converter with calibration
DE69124709T2 (de) * 1990-03-15 1997-05-28 At & T Corp Eingebaute Selbstprüfung für Analog-Digitalumsetzer
JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
KR930004772Y1 (ko) * 1991-05-13 1993-07-23 금성일렉트론 주식회사 아날로그/디지탈 변환기의 테스트장치
JP3098327B2 (ja) * 1992-07-17 2000-10-16 九州日本電気株式会社 １チップマイクロコンピュータ
US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters

Also Published As

Publication number Publication date
WO1998017003A2 (en) 1998-04-23
EP0867072A2 (en) 1998-09-30
US5969653A (en) 1999-10-19
WO1998017003A3 (en) 1998-06-25
JP2000502542A (ja) 2000-02-29
KR19990072173A (ko) 1999-09-27

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