US4632546A - Grooved surface defect detection apparatus - Google Patents

Grooved surface defect detection apparatus Download PDF

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Publication number
US4632546A
US4632546A US06/599,890 US59989084A US4632546A US 4632546 A US4632546 A US 4632546A US 59989084 A US59989084 A US 59989084A US 4632546 A US4632546 A US 4632546A
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US
United States
Prior art keywords
photoreceiver
laser beam
grooves
light
optical system
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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US06/599,890
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English (en)
Inventor
Erwin Sick
Christoph Schenk
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Erwin Sick GmbH Optik Elektronik
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Erwin Sick GmbH Optik Elektronik
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Assigned to ERWIN SICK GMBH OPTIK-ELEKTRONIK reassignment ERWIN SICK GMBH OPTIK-ELEKTRONIK ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: SCHENK, CHRISTOPH, SICK, ERWIN
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Definitions

  • the invention relates to fault detection apparatus for flat articles wherein a line of light is generated on the article and is imaged onto a photoreceiver in an optical system having cylindrical imaging characteristics.
  • photoreceiver Only one photoreceiver is normally used in fault detection apparatus of this kind. If faults are present in the material the photoreceiver transmits a fault signal as a result of the additional deflection of light which takes place at the faults. If necessary, two or more photoreceivers can also receive light by exploiting the scattering angle for the light at the article, in order to be able to detect faults of different natures.
  • the object underlying the invention is to provide fault detection apparatus of the initially named kind which can be used to obtain more comprehensive information concerning faults with articles which have light diffracting characteristics. It is a particular object of the invention to provide fault detection apparatus which is suitable for finding faults with so-called laser disks which have very narrow grooves, the spacing of which is of the order of magnitude of the wavelength of visible light, so that diffraction effects occur when using visible or infrared light.
  • the invention provides a fault detecting apparatus which is characterised in that the line of light is arranged substantially at right angles to the structure producing the light diffraction; in that the optical system detects at least the first diffraction order of the light leaving the article in addition to the zero order; and in that the light from the first and optionally further diffraction orders is imaged onto its own associated photoreceiver.
  • the article is in particular a record which is to be scanned by a laser beam with the light beam extending radially over the record. The invention is thus especially suited to the detection of faults in articles which have a substantially linear, extended, diffracting structure.
  • the line of light is formed by a moving beam of light which is periodically movable to and fro.
  • the moving beam can, in the first instance be generated by a mirror wheel illuminated by a laser.
  • the transmitted light should fall on the article and be reflected to the optical system at the angle of reflection.
  • the light diffraction then takes place in a plane at right angles to the plane of reflection.
  • the principal purpose of the apparatus of the invention is that several photoreceivers can receive light which signifies different faults.
  • polarised light can for example be used, with an analyser being arranged in front of one of the photoreceivers but not in front of the other.
  • the one photoreceiver thus primarily registers depolarising material faults whereas the other photoreceiver can respond to other faults.
  • the optical system having cylindrical imaging characteristics can consist of a single strip-like cylindrical mirror which should be made sufficiently long to receive at least two diffraction orders.
  • the optical system can however also consist of as many strip-like cylindrical lenses as there are photoreceivers.
  • FIG. 1 a schematic perspective illustration of a first embodiment of the fault detecting apparatus of the invention
  • FIG. 2 a perspective reproduction of a further embodiment.
  • a tightly bundled light beam 20 leaving a laser 19 falls on a mirror wheel 21 the reflective periphery of which is arranged at the focal point of a strip-like concave transmitting mirror 22.
  • the light reflected from the concave mirror is displaced relative to the mirror wheel sufficiently that it can pass by the mirror wheel and reach the surface of a flat article 11 whereby a line or bar of light 12 is generated by the mirror wheel which is rotating in the sense of the arrow f.
  • the line of light 12 extends at right angles to a linear diffraction structure 13 present on the surface of the article 11 which can for example consist of the microgrooves of a laser disk.
  • the moving beam reflected by the concave mirror 22 impinges, in accordance with FIG. 1, obliquely on the surface of the article 11 so that, for a substantially reflecting surface it is reflected at the angle of reflection by the article 11.
  • a strip-like receiving concave mirror 14 is arranged spaced apart from the article 11 at this angle and forms an optical system having cylindrical imaging characteristics.
  • the zero reflection order illustrated in full lines is concentrated on a first photoreceiver 15a, which is constructed as a photomultiplier.
  • the surface of the mirror wheel 21 is imaged via the concave mirrors 22, 14 onto the photomultiplier 14a.
  • the diffraction structure 13 light is however also deflected to both sides into the first diffraction order.
  • FIG. 1 only shows the one diffraction order which falls on the cylindrical mirror 14 as a result of a suitable construction of the latter, and which is deflected by this cylindrical mirror 14 into a second photoreceiver 15b, which is likewise constructed as a photomultiplier. In this manner two different photoreceivers are available for receiving the reflected light.
  • a polariser 17 in the laser beam 20 and an analyser 18 in front of the photoreceiver 15a the photoreceiver 15a can be made to respond to depolarising faults whereas the receiver 15b responds to other faults.
  • the zero order is shown in full lines in FIG. 1 the first diffraction order is however illustrated in broken lines.
  • the ratio of the wavelength of the laser beam to the grid constant of the grooves of linear diffraction structure 13 of flat article 11 is preferably chosen to generate at most zero, first and second diffraction orders.
  • FIG. 2 the same reference numerals are used to designate parts which have counter-parts in FIG. 1.
  • the optical system having cylindrical imaging characteristics consists in this embodiment of two separate cylindrical lenses 14a, 14b which receive the zero and first diffraction orders of the light leaving the light beam 12 and concentrate them onto the photoreceivers 15a and 15b respectively.
  • the invention thus provides a beam division for articles having a diffraction structure without a special beam divider being required for this purpose.
  • the gathering system 14, 14a, 14b could be dispensed with if the article being tested has small dimensions in the scanning direction and if a large area receiver (for example rectangular photomultiplier) is simultaneously used.
  • a large area receiver for example rectangular photomultiplier
  • FIG. 1 also indicates in broken lines, the location of the first diffraction order, a line-like photoreceiver arrangement 15c which can be provided in place of the photoreceiver 15b and which consists of a plurality of individual photoreceivers arranged alongside one another. In this manner lateral displacements of the first diffraction order can be detected which are a measure for changes of the periodicity of the periodic diffraction structure 13.
  • the invention is used for monitoring the grooves or lines which occur during a turning process then the turning process can be monitored by means of this embodiment.
  • the articles to be investigated with the apparatus of the invention can for example be laser discs, video discs, computer storage discs and also surfaces which are machined in a turning machine.
  • the line of light does not need to extend across the full width of the article being examined although it should extend over a substantial number of elements of the diffracting structure.
  • the scanning of the line of light across the full width of the article ensures that faults anywhere on the surface of the article are detected.
  • optical system with cylindrical imaging characteristics is not restricted to systems with purely cylindrical imaging characteristics but also extends to other optical systems which will produce a line focus, e.g. an elongate parabolic mirror.

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
US06/599,890 1983-04-22 1984-04-13 Grooved surface defect detection apparatus Expired - Fee Related US4632546A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3314620 1983-04-22
DE3314620 1983-04-22

Publications (1)

Publication Number Publication Date
US4632546A true US4632546A (en) 1986-12-30

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Family Applications (1)

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US06/599,890 Expired - Fee Related US4632546A (en) 1983-04-22 1984-04-13 Grooved surface defect detection apparatus

Country Status (5)

Country Link
US (1) US4632546A (fr)
EP (1) EP0123929B1 (fr)
JP (2) JPS6089735A (fr)
DE (1) DE3472300D1 (fr)
ES (1) ES8505480A1 (fr)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4868404A (en) * 1987-04-23 1989-09-19 Hajime Industries, Ltd. Surface inspection apparatus using a mask system to monitor uneven surfaces
US4943734A (en) * 1989-06-30 1990-07-24 Qc Optics, Inc. Inspection apparatus and method for detecting flaws on a diffractive surface
US4972091A (en) * 1989-05-16 1990-11-20 Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee Method and apparatus for detecting the presence of flaws in a moving sheet of material
US5027418A (en) * 1989-02-13 1991-06-25 Matsushita Electric Industrial Co., Ltd. Electro-optical inspection apparatus for printed-circuit boards with components mounted thereon
US5125741A (en) * 1990-03-16 1992-06-30 Agency Of Industrial Science & Technology Method and apparatus for inspecting surface conditions
WO2003010488A1 (fr) * 2001-07-27 2003-02-06 Hamamatsu Metrix Co., Ltd. Unite de capteur optique composite et dispositif d'inspection de disque optique l'utilisant
WO2003010521A1 (fr) * 2001-07-24 2003-02-06 The Board Of Regents For Oklahoma State University Capteur et dispositif de commande de reflectance spectrale optique
US6775012B2 (en) * 1995-06-02 2004-08-10 Accu-Sort Systems, Inc. System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface
US20040169849A1 (en) * 2002-02-26 2004-09-02 Syunsuke Kimura Surface foreign matter inspecting device
US6853446B1 (en) * 1999-08-16 2005-02-08 Applied Materials, Inc. Variable angle illumination wafer inspection system
US7130036B1 (en) 2003-09-16 2006-10-31 Kla-Tencor Technologies Corp. Methods and systems for inspection of an entire wafer surface using multiple detection channels
WO2007025972A3 (fr) * 2005-08-30 2007-04-26 Imp Innovations Ltd Dispositif de lecture optique

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3446355C2 (de) * 1984-12-19 1986-11-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät
DE3518832A1 (de) * 1985-05-24 1986-11-27 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Oberflaechenbeschaffenheitsfeststellungs-lichtabtastvorrichtung mit einem lichtkonzentrator
DE3709500A1 (de) * 1985-09-24 1988-10-06 Sick Optik Elektronik Erwin Optische bahnueberwachungseinrichtung mit zeilenkameras mit gerichteter beleuchtung
DE3534019A1 (de) * 1985-09-24 1987-04-02 Sick Optik Elektronik Erwin Optische bahnueberwachungsvorrichtung
DE8700520U1 (de) * 1987-01-12 1987-03-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Scanner zur optischen Abtastung von Objekten, insbesondere Aufzeichnungsplatten
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
NL8802404A (nl) * 1988-09-30 1990-04-17 Meyn Bv Werkwijze en inrichting voor het door middel van doorstraling controleren van voedselprodukten.
FR2688064B1 (fr) * 1992-07-22 1997-10-17 Scanera Sc Dispositif de detection de defauts de materiaux fibreux
DE19528519A1 (de) * 1995-08-03 1997-02-06 Tzn Forschung & Entwicklung Vorrichtung zur Detektion streifenförmiger Oberflächenfehler
DE10137340A1 (de) * 2001-07-31 2003-02-20 Heidelberger Druckmasch Ag Verfahren und Vorrichtung zur Erkennung von Fremdkörpern und Oberflächendefekten auf einer transparenten Vorlage sowie zur Korrektur von dadurch verursachten Bildfehlern einer Abbildung der Vorlage

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3474254A (en) * 1968-02-26 1969-10-21 Sick Erwin Photoelectronic apparatus for scanning textile material
US3790286A (en) * 1972-04-21 1974-02-05 Phillips Petroleum Co Carbon black testing by analyzing non-specularly reflected polarized light
US3821557A (en) * 1972-03-10 1974-06-28 P Lipke Device for checking movable webs of paper synthetic material metal foils and the like
US4118127A (en) * 1976-03-18 1978-10-03 Agfa-Gevaert Aktiengesellschaft Method of detecting faults in moving webs of materials
US4180830A (en) * 1977-06-28 1979-12-25 Rca Corporation Depth estimation system using diffractive effects of the grooves and signal elements in the grooves
US4197011A (en) * 1977-09-22 1980-04-08 Rca Corporation Defect detection and plotting system
US4284357A (en) * 1978-12-27 1981-08-18 Fuji Photo Film Co., Ltd. Device for continuously inspecting a surface
US4352564A (en) * 1980-05-30 1982-10-05 Rca Corporation Missing order defect detection apparatus
US4395122A (en) * 1981-04-29 1983-07-26 Rca Corporation Defect detection system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2200222A1 (de) * 1972-01-04 1973-07-12 Ibm Deutschland Vorrichtung zur bestimmung der oberflaechenguete
JPS5611894B2 (fr) * 1973-09-26 1981-03-17
JPS5637499B2 (fr) * 1973-11-15 1981-09-01
US4030835A (en) * 1976-05-28 1977-06-21 Rca Corporation Defect detection system
DE2627609A1 (de) * 1976-06-19 1977-12-29 Ibm Deutschland Interferometrisches verfahren
JPS5414789A (en) * 1977-07-05 1979-02-03 Mitsubishi Electric Corp Surface inspecting apparatus
DE2800351B2 (de) * 1978-01-04 1979-11-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn
JPS5594145A (en) * 1979-01-12 1980-07-17 Hitachi Ltd Method of and device for inspecting surface of article
JPS6038592B2 (ja) * 1980-06-16 1985-09-02 石川島播磨重工業株式会社 高速回転機器の従動機器側シ−ル構造

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3474254A (en) * 1968-02-26 1969-10-21 Sick Erwin Photoelectronic apparatus for scanning textile material
US3821557A (en) * 1972-03-10 1974-06-28 P Lipke Device for checking movable webs of paper synthetic material metal foils and the like
US3790286A (en) * 1972-04-21 1974-02-05 Phillips Petroleum Co Carbon black testing by analyzing non-specularly reflected polarized light
US4118127A (en) * 1976-03-18 1978-10-03 Agfa-Gevaert Aktiengesellschaft Method of detecting faults in moving webs of materials
US4180830A (en) * 1977-06-28 1979-12-25 Rca Corporation Depth estimation system using diffractive effects of the grooves and signal elements in the grooves
US4197011A (en) * 1977-09-22 1980-04-08 Rca Corporation Defect detection and plotting system
US4284357A (en) * 1978-12-27 1981-08-18 Fuji Photo Film Co., Ltd. Device for continuously inspecting a surface
US4352564A (en) * 1980-05-30 1982-10-05 Rca Corporation Missing order defect detection apparatus
US4395122A (en) * 1981-04-29 1983-07-26 Rca Corporation Defect detection system

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4868404A (en) * 1987-04-23 1989-09-19 Hajime Industries, Ltd. Surface inspection apparatus using a mask system to monitor uneven surfaces
US5027418A (en) * 1989-02-13 1991-06-25 Matsushita Electric Industrial Co., Ltd. Electro-optical inspection apparatus for printed-circuit boards with components mounted thereon
US4972091A (en) * 1989-05-16 1990-11-20 Canadian Patents And Development Limited/Societe Canadienne Des Brevets Et D'exploitation Limitee Method and apparatus for detecting the presence of flaws in a moving sheet of material
US4943734A (en) * 1989-06-30 1990-07-24 Qc Optics, Inc. Inspection apparatus and method for detecting flaws on a diffractive surface
US5125741A (en) * 1990-03-16 1992-06-30 Agency Of Industrial Science & Technology Method and apparatus for inspecting surface conditions
US6775012B2 (en) * 1995-06-02 2004-08-10 Accu-Sort Systems, Inc. System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface
US6853446B1 (en) * 1999-08-16 2005-02-08 Applied Materials, Inc. Variable angle illumination wafer inspection system
WO2003010521A1 (fr) * 2001-07-24 2003-02-06 The Board Of Regents For Oklahoma State University Capteur et dispositif de commande de reflectance spectrale optique
WO2003010488A1 (fr) * 2001-07-27 2003-02-06 Hamamatsu Metrix Co., Ltd. Unite de capteur optique composite et dispositif d'inspection de disque optique l'utilisant
EP1413852A4 (fr) * 2001-07-27 2010-05-19 Hamamatsu Metrix Co Ltd Unite de capteur optique composite et dispositif d'inspection de disque optique l'utilisant
US20040169849A1 (en) * 2002-02-26 2004-09-02 Syunsuke Kimura Surface foreign matter inspecting device
US7046354B2 (en) * 2002-02-26 2006-05-16 Matsushita Electric Industrial Co., Ltd. Surface foreign matter inspecting device
US7130036B1 (en) 2003-09-16 2006-10-31 Kla-Tencor Technologies Corp. Methods and systems for inspection of an entire wafer surface using multiple detection channels
WO2007025972A3 (fr) * 2005-08-30 2007-04-26 Imp Innovations Ltd Dispositif de lecture optique

Also Published As

Publication number Publication date
JPS6089735A (ja) 1985-05-20
ES531768A0 (es) 1985-05-16
EP0123929A3 (en) 1985-12-04
JPH064655U (ja) 1994-01-21
DE3472300D1 (en) 1988-07-28
EP0123929B1 (fr) 1988-06-22
ES8505480A1 (es) 1985-05-16
EP0123929A2 (fr) 1984-11-07

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Owner name: ERWIN SICK GMBH OPTIK-ELEKTRONIK, SEBASTIAN-KNEIPP

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