ATE544159T1 - Röntgen- oder neutronen-monochromatisierer - Google Patents

Röntgen- oder neutronen-monochromatisierer

Info

Publication number
ATE544159T1
ATE544159T1 AT06709137T AT06709137T ATE544159T1 AT E544159 T1 ATE544159 T1 AT E544159T1 AT 06709137 T AT06709137 T AT 06709137T AT 06709137 T AT06709137 T AT 06709137T AT E544159 T1 ATE544159 T1 AT E544159T1
Authority
AT
Austria
Prior art keywords
monochromatizer
neutron
ray
optical layer
wavelength band
Prior art date
Application number
AT06709137T
Other languages
English (en)
Inventor
Francois Rieutord
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Application granted granted Critical
Publication of ATE544159T1 publication Critical patent/ATE544159T1/de

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49826—Assembling or joining

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Luminescent Compositions (AREA)
  • Compositions Of Oxide Ceramics (AREA)
AT06709137T 2005-01-21 2006-01-20 Röntgen- oder neutronen-monochromatisierer ATE544159T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0500657A FR2881264B1 (fr) 2005-01-21 2005-01-21 Monochromateur a rayon x ou a neutrons
PCT/FR2006/000133 WO2006077329A1 (fr) 2005-01-21 2006-01-20 Monochromateur a rayons x ou a neutrons

Publications (1)

Publication Number Publication Date
ATE544159T1 true ATE544159T1 (de) 2012-02-15

Family

ID=34953473

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06709137T ATE544159T1 (de) 2005-01-21 2006-01-20 Röntgen- oder neutronen-monochromatisierer

Country Status (6)

Country Link
US (1) US7702072B2 (de)
EP (1) EP1842209B1 (de)
JP (1) JP5173435B2 (de)
AT (1) ATE544159T1 (de)
FR (1) FR2881264B1 (de)
WO (1) WO2006077329A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2444962B (en) * 2006-12-22 2010-01-27 Univ Muenster Wilhelms Adaptive crystalline X-ray reflecting device
JP5125994B2 (ja) * 2008-11-04 2013-01-23 株式会社島津製作所 ゲルマニウム湾曲分光素子
JP5320592B2 (ja) * 2009-03-18 2013-10-23 大学共同利用機関法人 高エネルギー加速器研究機構 中性子線の単色集光装置
WO2011066447A1 (en) * 2009-11-25 2011-06-03 Columbia University Confocal double crystal monochromator
US9240254B2 (en) * 2011-09-27 2016-01-19 Revera, Incorporated System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopy
KR20130087843A (ko) * 2012-01-30 2013-08-07 한국전자통신연구원 단결정 물질을 이용한 엑스선 제어 장치
CN107424889A (zh) * 2012-02-28 2017-12-01 X射线光学系统公司 具有使用多材料x射线管阳极和单色光学装置产生的多激励能带的x射线分析器
CN115308240A (zh) * 2022-09-09 2022-11-08 中国科学院高能物理研究所 分析晶体及其制作方法及应用

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture
US3397312A (en) * 1964-08-15 1968-08-13 Hitachi Ltd Laminated X-ray analyzing crystal wherein the respective laminations have different lattice spacings
DE2051017C3 (de) * 1970-01-15 1974-12-12 Hewlett-Packard Co., Palo Alto, Calif. (V.St.A.) Kristallbeugungsvorrichtung und Verfahren zu deren Herrstellung
US4261771A (en) * 1979-10-31 1981-04-14 Bell Telephone Laboratories, Incorporated Method of fabricating periodic monolayer semiconductor structures by molecular beam epitaxy
JPS58172810U (ja) * 1982-05-15 1983-11-18 株式会社トーキン 圧電変位素子
JPS62144051A (ja) * 1985-12-18 1987-06-27 Hitachi Ltd 結晶分光器
JP2696936B2 (ja) * 1988-06-17 1998-01-14 三井造船株式会社 短波長用ミラー
US5008908A (en) * 1988-12-09 1991-04-16 The United States Of America As Represented By The Secretary Of Commerce Diffraction device which detects the Bragg condition
JP3099038B2 (ja) * 1990-03-08 2000-10-16 科学技術振興事業団 Ｘ線用モノクロメータ及びその製造方法
JP2968995B2 (ja) * 1990-11-30 1999-11-02 株式会社リコー 多波長分光素子
JPH05180992A (ja) * 1991-12-27 1993-07-23 Ishikawajima Harima Heavy Ind Co Ltd 集光モノクロメータ
JPH06167605A (ja) * 1992-11-27 1994-06-14 Kobe Steel Ltd 光学素子
JP2674506B2 (ja) * 1994-05-30 1997-11-12 日本電気株式会社 Ｘ線回折装置
JPH08201589A (ja) * 1995-01-26 1996-08-09 Nikon Corp Ｘ線分光素子
JP3044683B2 (ja) * 1995-03-17 2000-05-22 科学技術振興事業団 グラファイト層の形成方法、該方法によって形成されたグラファイト層を有するｘ線光学素子及びｘ線光学素子の製造方法
US5923720A (en) * 1997-06-17 1999-07-13 Molecular Metrology, Inc. Angle dispersive x-ray spectrometer
JP2000098093A (ja) * 1998-09-22 2000-04-07 Nikon Corp 反射鏡およびその製造方法
JP3950239B2 (ja) * 1998-09-28 2007-07-25 株式会社リガク Ｘ線装置
JP2001141893A (ja) * 1999-11-18 2001-05-25 Toshiba Corp Ｘ線光学素子
AU2001257587A1 (en) * 2000-04-03 2001-10-15 University Of Alabama Research Foundation Optical assembly for increasing the intensity of a formed x-ray beam
US6829327B1 (en) * 2000-09-22 2004-12-07 X-Ray Optical Systems, Inc. Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic
FR2826378B1 (fr) * 2001-06-22 2004-10-15 Commissariat Energie Atomique Structure composite a orientation cristalline uniforme et procede de controle de l'orientation cristalline d'une telle structure
US6680996B2 (en) * 2002-02-19 2004-01-20 Jordan Valley Applied Radiation Ltd. Dual-wavelength X-ray reflectometry
JP4710022B2 (ja) * 2004-08-27 2011-06-29 国立大学法人東北大学 曲率分布結晶レンズ、曲率分布結晶レンズを有するｘ線装置及び曲率分布結晶レンズの作製方法

Also Published As

Publication number Publication date
EP1842209B1 (de) 2012-02-01
US20080279332A1 (en) 2008-11-13
WO2006077329A1 (fr) 2006-07-27
US7702072B2 (en) 2010-04-20
EP1842209A1 (de) 2007-10-10
FR2881264A1 (fr) 2006-07-28
FR2881264B1 (fr) 2007-06-01
JP5173435B2 (ja) 2013-04-03
JP2008528959A (ja) 2008-07-31

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