CA2018976A1 - Methodes de dopage de semiconducteurs - Google Patents
Methodes de dopage de semiconducteursInfo
- Publication number
- CA2018976A1 CA2018976A1 CA2018976A CA2018976A CA2018976A1 CA 2018976 A1 CA2018976 A1 CA 2018976A1 CA 2018976 A CA2018976 A CA 2018976A CA 2018976 A CA2018976 A CA 2018976A CA 2018976 A1 CA2018976 A1 CA 2018976A1
- Authority
- CA
- Canada
- Prior art keywords
- semiconductor devices
- electric fields
- dopant ions
- fermi
- doping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P32/00—Diffusion of dopants within, into or out of wafers, substrates or parts of devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/041—Doping control in crystal growth
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/048—Energy beam assisted EPI growth
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/071—Heating, selective
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/094—Laser beam treatment of compound devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/925—Fluid growth doping control, e.g. delta doping
Landscapes
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Junction Field-Effect Transistors (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
- Bipolar Transistors (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Recrystallisation Techniques (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/374,336 US5024967A (en) | 1989-06-30 | 1989-06-30 | Doping procedures for semiconductor devices |
| US374,336 | 1989-06-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2018976A1 true CA2018976A1 (fr) | 1990-12-31 |
| CA2018976C CA2018976C (fr) | 1994-06-28 |
Family
ID=23476343
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002018976A Expired - Fee Related CA2018976C (fr) | 1989-06-30 | 1990-06-14 | Methodes de dopage de semiconducteurs |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5024967A (fr) |
| EP (1) | EP0405832B1 (fr) |
| JP (1) | JPH0828327B2 (fr) |
| CA (1) | CA2018976C (fr) |
| DE (1) | DE69029687T2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112924075A (zh) * | 2021-02-26 | 2021-06-08 | 云和县瑞灵玩具有限公司 | 一种木材固定栓松动时的提醒装置 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2560562B2 (ja) * | 1991-04-30 | 1996-12-04 | 住友化学工業株式会社 | エピタキシャル成長化合物半導体結晶 |
| JPH081955B2 (ja) * | 1991-08-21 | 1996-01-10 | ヒューズ・エアクラフト・カンパニー | 反転変調ドープされたヘテロ構造の製造方法 |
| US5533072A (en) * | 1993-11-12 | 1996-07-02 | International Business Machines Corporation | Digital phase alignment and integrated multichannel transceiver employing same |
| JP3347002B2 (ja) * | 1996-11-08 | 2002-11-20 | 株式会社東芝 | 半導体発光素子の製造方法 |
| US7483212B2 (en) * | 2006-10-11 | 2009-01-27 | Rensselaer Polytechnic Institute | Optical thin film, semiconductor light emitting device having the same and methods of fabricating the same |
| JP4865047B2 (ja) | 2010-02-24 | 2012-02-01 | 株式会社東芝 | 結晶成長方法 |
| JP5238867B2 (ja) * | 2011-11-08 | 2013-07-17 | 株式会社東芝 | 半導体発光素子の製造方法 |
| US10987631B2 (en) | 2018-04-17 | 2021-04-27 | Smartflow Technologies, Inc. | Filter cassette article, and filter comprising same |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1446860A (en) * | 1972-09-09 | 1976-08-18 | Ranco Controls Ltd | Control switch unit |
| US3941624A (en) * | 1975-03-28 | 1976-03-02 | Bell Telephone Laboratories, Incorporated | Sn-Doped group III(a)-v(a) Ga-containing layers grown by molecular beam epitaxy |
| JPS5814644B2 (ja) * | 1975-05-14 | 1983-03-22 | 松下電器産業株式会社 | ヒカリデンソウロノセイゾウホウホウ |
| JPS5372A (en) * | 1976-06-24 | 1978-01-05 | Agency Of Ind Science & Technol | Selective doping crystal growing method |
| FR2388413A1 (fr) * | 1977-04-18 | 1978-11-17 | Commissariat Energie Atomique | Procede de commande de la migration d'une espece chimique dans un substrat solide |
| GB2034972B (en) * | 1978-10-11 | 1982-12-22 | Secr Defence | Method of controlling penetration of dopant into semiconductor devices |
| US4447276A (en) * | 1981-06-15 | 1984-05-08 | The Post Office | Molecular beam epitaxy electrolytic dopant source |
| JPS5958878A (ja) * | 1982-09-28 | 1984-04-04 | Matsushita Electric Ind Co Ltd | 半導体発光装置 |
| US4766087A (en) * | 1983-08-01 | 1988-08-23 | Union Oil Company Of California | Electrical contacts containing thallium (III) oxide prepared at relatively low temperature |
| US4645687A (en) * | 1983-11-10 | 1987-02-24 | At&T Laboratories | Deposition of III-V semiconductor materials |
| US4581248A (en) * | 1984-03-07 | 1986-04-08 | Roche Gregory A | Apparatus and method for laser-induced chemical vapor deposition |
| US4583110A (en) * | 1984-06-14 | 1986-04-15 | International Business Machines Corporation | Intermetallic semiconductor ohmic contact |
| JPH0669025B2 (ja) * | 1984-12-07 | 1994-08-31 | シャープ株式会社 | 半導体結晶成長装置 |
| IT1214808B (it) * | 1984-12-20 | 1990-01-18 | Ates Componenti Elettron | Tico e semiconduttore processo per la formazione di uno strato sepolto e di una regione di collettore in un dispositivo monoli |
| FR2578095B1 (fr) * | 1985-02-28 | 1988-04-15 | Avitaya Francois D | Procede et dispositif de depot par croissance epitaxiale d'un materiau dope |
| US4659401A (en) * | 1985-06-10 | 1987-04-21 | Massachusetts Institute Of Technology | Growth of epitaxial films by plasma enchanced chemical vapor deposition (PE-CVD) |
| JPS62196815A (ja) * | 1986-02-24 | 1987-08-31 | Tadatsugu Ito | 薄膜成長装置 |
| JPH0691009B2 (ja) * | 1986-06-24 | 1994-11-14 | 日本電気株式会社 | 半導体薄膜製造方法 |
| JPS63138765A (ja) * | 1986-12-01 | 1988-06-10 | Sumitomo Electric Ind Ltd | 化合物半導体装置 |
| US4829021A (en) * | 1986-12-12 | 1989-05-09 | Daido Sanso K.K. | Process for vacuum chemical epitaxy |
| JPS63318784A (ja) * | 1987-06-22 | 1988-12-27 | Matsushita Electric Ind Co Ltd | 電界効果トランジスタの製造方法 |
| US4843031A (en) * | 1987-03-17 | 1989-06-27 | Matsushita Electric Industrial Co., Ltd. | Method of fabricating compound semiconductor laser using selective irradiation |
| GB2204066A (en) * | 1987-04-06 | 1988-11-02 | Philips Electronic Associated | A method for manufacturing a semiconductor device having a layered structure |
| US4800100A (en) * | 1987-10-27 | 1989-01-24 | Massachusetts Institute Of Technology | Combined ion and molecular beam apparatus and method for depositing materials |
| US4871692A (en) * | 1988-09-30 | 1989-10-03 | Lee Hong H | Passivation of group III-V surfaces |
-
1989
- 1989-06-30 US US07/374,336 patent/US5024967A/en not_active Expired - Lifetime
-
1990
- 1990-06-14 CA CA002018976A patent/CA2018976C/fr not_active Expired - Fee Related
- 1990-06-20 DE DE69029687T patent/DE69029687T2/de not_active Expired - Fee Related
- 1990-06-20 EP EP90306751A patent/EP0405832B1/fr not_active Expired - Lifetime
- 1990-06-29 JP JP17041090A patent/JPH0828327B2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112924075A (zh) * | 2021-02-26 | 2021-06-08 | 云和县瑞灵玩具有限公司 | 一种木材固定栓松动时的提醒装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0405832B1 (fr) | 1997-01-15 |
| DE69029687T2 (de) | 1997-05-07 |
| DE69029687D1 (de) | 1997-02-27 |
| US5024967A (en) | 1991-06-18 |
| EP0405832A1 (fr) | 1991-01-02 |
| JPH0828327B2 (ja) | 1996-03-21 |
| CA2018976C (fr) | 1994-06-28 |
| JPH0344919A (ja) | 1991-02-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2107174A1 (fr) | Oxyde de magnesium epitaxial utilise comme couche tampon sur des semiconducteurs tetrahedraux | |
| EP0236123A3 (fr) | Dispositif à semi-conducteur et son procédé de fabrication | |
| CA2018976A1 (fr) | Methodes de dopage de semiconducteurs | |
| DE69213759D1 (de) | Halbleiter vorrichtung und herstellungsverfahren mittels mikrowellen-niederschlag. | |
| AU6883987A (en) | Deposition feedstock and dopant materials useful in the fabrication of hydrogenated amorphous silicon alloys for photovoltaic devices and other semiconductor devices | |
| EP0559986A3 (en) | Method for producing semiconductor wafer and substrate used for producing the semiconductor | |
| EP0423535A3 (en) | Semiconductor device made by an epitaxial growth technique and method for the making of the same | |
| EP0500130A3 (en) | Method of manufacturing an epitaxial semiconductor wafer having gettering properties | |
| EP0480424A3 (en) | Scanning electron microscope and method for production of semiconductor device by using the same | |
| GB1465830A (en) | Reducing boundary charges in semiconductor layers grown on a substrate | |
| DE3588127D1 (de) | Halbleiteranordnung mit einer dielektrischen Schicht | |
| EP0370387A3 (fr) | Matériau supraconducteur | |
| GB2035686B (en) | Method of making semiconductor devices by epitaxial deposition and apparatus for making the same | |
| CA2062709A1 (fr) | Mince pellicule supraconductrice a au moins une zone isolee supraconductrice formee de matiere d'oxyde supraconductrice et methode de fabrication connexe | |
| EP0262034A3 (en) | Impurity doping method for the fabrication of semiconductor devices | |
| JPS5393788A (en) | Production of semiconductor device | |
| JPS6451684A (en) | Working method for superconducting material | |
| JPS51113461A (en) | A method for manufacturing semiconductor devices | |
| JPS5577151A (en) | Heat treatment device for semiconductor wafer | |
| IT1236995B (it) | Processo per la formazione di regioni di dispositivi semiconduttori autoallineate fra loro e aventi differente drogaggio | |
| JPS5271172A (en) | Growth of p type boron phosphide semiconductor | |
| JPS5326663A (en) | Manu facture of semiconductor device | |
| Bagraev et al. | Induced Photoconduction in Semiconductors with Exchange Impurity Levels | |
| JPS6431410A (en) | Semiconductor device | |
| JPS5252366A (en) | Improvement of crystallinity of semiconductor crystals |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |