IL91492A - Optical inspection system for soldering joints and inspection method - Google Patents

Optical inspection system for soldering joints and inspection method

Info

Publication number
IL91492A
IL91492A IL9149289A IL9149289A IL91492A IL 91492 A IL91492 A IL 91492A IL 9149289 A IL9149289 A IL 9149289A IL 9149289 A IL9149289 A IL 9149289A IL 91492 A IL91492 A IL 91492A
Authority
IL
Israel
Prior art keywords
axis
solder
wiring board
printed wiring
pad
Prior art date
Application number
IL9149289A
Other languages
English (en)
Hebrew (he)
Other versions
IL91492A0 (en
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of IL91492A0 publication Critical patent/IL91492A0/xx
Publication of IL91492A publication Critical patent/IL91492A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95638Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646Soldering

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Closed-Circuit Television Systems (AREA)
IL9149289A 1988-10-03 1989-08-31 Optical inspection system for soldering joints and inspection method IL91492A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25247688A 1988-10-03 1988-10-03

Publications (2)

Publication Number Publication Date
IL91492A0 IL91492A0 (en) 1990-04-29
IL91492A true IL91492A (en) 1994-07-31

Family

ID=22956169

Family Applications (1)

Application Number Title Priority Date Filing Date
IL9149289A IL91492A (en) 1988-10-03 1989-08-31 Optical inspection system for soldering joints and inspection method

Country Status (7)

Country Link
EP (1) EP0365874B1 (fr)
JP (1) JPH02249957A (fr)
AU (1) AU608175B2 (fr)
CA (1) CA1318414C (fr)
DE (1) DE68907688T2 (fr)
ES (1) ES2042923T3 (fr)
IL (1) IL91492A (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO914574L (no) * 1991-11-22 1993-05-24 Elkem Technology Fremgangsmaate for detektering av pin-hull i strengestoeptemetallemne
US5926557A (en) * 1997-02-26 1999-07-20 Acuity Imaging, Llc Inspection method
US5828449A (en) * 1997-02-26 1998-10-27 Acuity Imaging, Llc Ring illumination reflective elements on a generally planar surface
EA009923B1 (ru) * 2004-03-27 2008-04-28 Тексмаг Гмбх Устройство детектирования соединения листов резины
DE102009017695B3 (de) 2009-04-15 2010-11-25 Göpel electronic GmbH Verfahren zur Inspektion von Lötstellen an elektrischen und elektronischen Bauteilen
CN105866657A (zh) * 2016-03-25 2016-08-17 航天科技控股集团股份有限公司 自动检测印制板的针床和自动检测控制方法
CN111307812A (zh) * 2019-03-05 2020-06-19 南昌工程学院 基于机器视觉的焊点外观检测方法
CN112344879B (zh) * 2020-09-29 2022-03-25 联想(北京)有限公司 一种胶路的检测方法、装置及设备
CN116967664A (zh) * 2023-07-27 2023-10-31 深圳市世宗自动化设备有限公司 焊接补焊方法、装置及电子设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4152723A (en) * 1977-12-19 1979-05-01 Sperry Rand Corporation Method of inspecting circuit boards and apparatus therefor
US4538909A (en) * 1983-05-24 1985-09-03 Automation Engineering, Inc. Circuit board inspection apparatus and method
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
US4672437A (en) * 1985-07-08 1987-06-09 Honeywell Inc. Fiber optic inspection system
EP0236738A3 (fr) * 1986-02-05 1988-12-21 OMRON Corporation Procédé d'entrée de dates d'une plaque à circuits imprimés équipée de référence pour le traitement d'images d'un appareil d'inspection automatique de plaques à circuits imprimés équipées

Also Published As

Publication number Publication date
DE68907688T2 (de) 1993-10-28
AU4143689A (en) 1990-04-05
JPH02249957A (ja) 1990-10-05
AU608175B2 (en) 1991-03-21
IL91492A0 (en) 1990-04-29
EP0365874A1 (fr) 1990-05-02
ES2042923T3 (es) 1993-12-16
DE68907688D1 (de) 1993-08-26
EP0365874B1 (fr) 1993-07-21
CA1318414C (fr) 1993-05-25

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Legal Events

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