JPH0167554U - - Google Patents

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Publication number
JPH0167554U
JPH0167554U JP1987163206U JP16320687U JPH0167554U JP H0167554 U JPH0167554 U JP H0167554U JP 1987163206 U JP1987163206 U JP 1987163206U JP 16320687 U JP16320687 U JP 16320687U JP H0167554 U JPH0167554 U JP H0167554U
Authority
JP
Japan
Prior art keywords
sample
detector
line
output
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987163206U
Other languages
English (en)
Other versions
JPH0723733Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987163206U priority Critical patent/JPH0723733Y2/ja
Publication of JPH0167554U publication Critical patent/JPH0167554U/ja
Application granted granted Critical
Publication of JPH0723733Y2 publication Critical patent/JPH0723733Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【図面の簡単な説明】
第１図は本考案実施例の平面図、並びに装置の
構成を示した図、第２図は第１図のＡ―Ａ断面拡
大図である。 なお、図において、１はゴニオメータ、２は試
料装着台、３は試料、４は光線およびＸ線の通過
孔、５は光源、１１はＸ線源である。

Claims (1)

    【実用新案登録請求の範囲】
  1. 試料をその表面の少なくとも一部が密着するよ
    うに取り付ける試料装着台を具備した線回折ゴ
    ニオメータと、上記ゴニオメータの回折角に対応
    した信号を送出する回転角検出器と、前記ゴニオ
    メータに取り付けられて前記試料の表面に細い光
    線を投射する光源並びに試料表面による反射光線
    の位置検出器と、前記試料の表面に線ビームを
    入射させる線源と、上記試料の表面で回折した
    線の検出器と、上記検出器が出力を送出した状
    態における前記回転角検出器の出力に前記位置検
    出器の出力と対応した補正を加える演算回路とよ
    りなる結晶方位角測定装置。
JP1987163206U 1987-10-27 1987-10-27 結晶方位角測定装置 Expired - Lifetime JPH0723733Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987163206U JPH0723733Y2 (ja) 1987-10-27 1987-10-27 結晶方位角測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987163206U JPH0723733Y2 (ja) 1987-10-27 1987-10-27 結晶方位角測定装置

Publications (2)

Publication Number Publication Date
JPH0167554U true JPH0167554U (ja) 1989-05-01
JPH0723733Y2 JPH0723733Y2 (ja) 1995-05-31

Family

ID=31447723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987163206U Expired - Lifetime JPH0723733Y2 (ja) 1987-10-27 1987-10-27 結晶方位角測定装置

Country Status (1)

Country Link
JP (1) JPH0723733Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006177842A (ja) * 2004-12-24 2006-07-06 Pioneer Electronic Corp カット面検査装置、及びカット面検査方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51161183U (ja) * 1975-06-17 1976-12-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51161183U (ja) * 1975-06-17 1976-12-22

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006177842A (ja) * 2004-12-24 2006-07-06 Pioneer Electronic Corp カット面検査装置、及びカット面検査方法

Also Published As

Publication number Publication date
JPH0723733Y2 (ja) 1995-05-31

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