JPH0226728B2 - - Google Patents
Info
- Publication number
- JPH0226728B2 JPH0226728B2 JP58032587A JP3258783A JPH0226728B2 JP H0226728 B2 JPH0226728 B2 JP H0226728B2 JP 58032587 A JP58032587 A JP 58032587A JP 3258783 A JP3258783 A JP 3258783A JP H0226728 B2 JPH0226728 B2 JP H0226728B2
- Authority
- JP
- Japan
- Prior art keywords
- output
- light
- circuit
- receiving element
- distance measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 4
- 239000003990 capacitor Substances 0.000 description 7
- IERHLVCPSMICTF-XVFCMESISA-N CMP group Chemical group P(=O)(O)(O)OC[C@@H]1[C@H]([C@H]([C@@H](O1)N1C(=O)N=C(N)C=C1)O)O IERHLVCPSMICTF-XVFCMESISA-N 0.000 description 6
- 239000013317 conjugated microporous polymer Substances 0.000 description 6
- 210000003643 myeloid progenitor cell Anatomy 0.000 description 6
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009499 grossing Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 101000640713 Homo sapiens Transmembrane protein 126A Proteins 0.000 description 1
- 102100033846 Transmembrane protein 126A Human genes 0.000 description 1
- 230000004397 blinking Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 208000009606 optic atrophy 7 Diseases 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Automatic Focus Adjustment (AREA)
Description
【発明の詳細な説明】
本発明はカメラ等に用いられる測距装置であつ
て、発光素子から発せられた光を測距対象に向け
て投射し、その反射光を隣接配置された二つの受
光素子で受光する三角測距方式の測距装置の改良
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention is a distance measuring device used in a camera, etc., which projects light emitted from a light emitting element toward a distance measuring object, and transmits the reflected light to two light receivers arranged adjacently. This invention relates to an improvement of a triangular distance measuring device that receives light with an element.
従来、上述のような方式の測距装置としては、
特開昭54−39731号公報或は特開昭57−104809号
公報等により提案されている。 Conventionally, as a distance measuring device using the method described above,
This method has been proposed in Japanese Patent Application Laid-open No. 54-39731, Japanese Patent Application Laid-Open No. 57-104809, etc.
一般に、受光素子より投射した光の測距対象か
らの反射光を受光素子で受光して測距する場合、
その反射光強度は、測距対象の反射率、距離等に
よつて、千倍以上の差を生じる。従つて、受光素
子の出力を増幅する増幅回路は、60dB以上のダ
イナミツクレンジが必要となる。 In general, when measuring distance by receiving reflected light from the distance measurement target of light projected by the light receiving element,
The intensity of the reflected light varies by a factor of 1,000 or more depending on the reflectance of the object to be measured, the distance, etc. Therefore, the amplifier circuit that amplifies the output of the light receiving element needs to have a dynamic range of 60 dB or more.
そのダイナミツクレンジを広くする方法として
は、受光素子出力の対数圧縮や増幅回路の自動利
得調整が考えられるが、前者では、受光々量が大
きく受光素子間の出力差が小さい時に、S/Nが
悪くなる欠点があり、また後者では、フイードバ
ツク系が必要で、発振等の不安定要素が増大する
欠点があつた。 Possible ways to widen the dynamic range include logarithmic compression of the light receiving element output and automatic gain adjustment of the amplifier circuit, but in the former case, when the amount of light received is large and the output difference between the light receiving elements is small, the S/N In the latter case, a feedback system is required, which increases unstable factors such as oscillation.
そこで、本発明の目的は、上記従来例の欠点を
伴わず、簡単な手段で、受光素子の出力を見掛上
零或は微少値から徐々に増大させて、比較回路の
判別し易いある設定値に達した時に測距状態を判
別させるようにした測距装置を提供するものであ
る。 SUMMARY OF THE INVENTION Therefore, an object of the present invention is to gradually increase the output of a light-receiving element from an apparently zero or minute value by a simple means without having the drawbacks of the conventional example, and to set the comparison circuit to a certain setting that is easy to distinguish. The object of the present invention is to provide a distance measuring device that determines the distance measuring state when a value is reached.
以下、図面に基づいて本発明の実施例を説明す
る。 Embodiments of the present invention will be described below based on the drawings.
先ず、第1図において、1は時間形成回路(時
間t=25ms)、2はインバータ、3はトランジ
スタ、4は定電流回路、5は抵抗、6はコンデン
サ、7はバツフアとしての演算増幅回路、8は定
電流回路、9,10及び11は抵抗、13は積分
器としての演算増幅回路、14はコンデンサ、1
5はヒステリシスコンパレータとしての演算増幅
回路(なお、演算増幅回路は、以下共通して
OPAと記述する。)、16及び17は抵抗9端の
電圧を分圧する分圧抵抗、18及び19も分圧抵
抗、20及び21は夫々トランジスタ、22は測
距対象へスポツト光を投射する発光素子としての
赤外線発光をダイオード(以下IRDと記述する)、
23及び24は夫々IRD22から投射され測距対
象により反射された光を受光し得るように基線長
方向に隣接して配置された受光素子としてのシリ
コンホトダイオード(以下SPDと記述する)、2
5及び26は夫々交流増幅回路、27及び28は
夫々帯域フイルター回路(中心周波数f0=
16KHzであり、以下BPFと記述する)、29及び
30は夫々検波回路、31及び32は夫々平滑回
路、33及び34は夫々直流増幅回路、35,3
6及び37は夫々コンパレータ回路(以下CMP
と記述する)、38は定電流回路、39,40及
び41は夫々CMP35の反転入力端子(−)及
びCMP36,37の非反転入力端子(+)に基
準電圧Vr1及びVr2,Vr3を与える分圧抵抗、42
はアンドゲート、43及び44は夫々Dタイプの
フリツプフロツプ回路、45はR.Sタイプのフリ
ツプフロツプ回路(なお、フリツプフロツプ回路
は、以下共通してFFと記述する。)であり、夫々
図示の如く接続されている。 First, in FIG. 1, 1 is a time forming circuit (time t = 25 ms), 2 is an inverter, 3 is a transistor, 4 is a constant current circuit, 5 is a resistor, 6 is a capacitor, 7 is an operational amplifier circuit as a buffer, 8 is a constant current circuit, 9, 10 and 11 are resistors, 13 is an operational amplifier circuit as an integrator, 14 is a capacitor, 1
5 is an operational amplifier circuit as a hysteresis comparator (the operational amplifier circuit is commonly referred to as
Describe it as OPA. ), 16 and 17 are voltage dividing resistors that divide the voltage at the end of the resistor 9, 18 and 19 are also voltage dividing resistors, 20 and 21 are transistors, respectively, and 22 is an infrared light emitting element as a light emitting element that projects a spot light to the object to be measured. is a diode (hereinafter referred to as IRD),
23 and 24 are silicon photodiodes (hereinafter referred to as SPD) as light-receiving elements arranged adjacent to each other in the baseline length direction so as to be able to receive the light projected from the IRD 22 and reflected by the distance measurement target, respectively;
5 and 26 are AC amplifier circuits, and 27 and 28 are band filter circuits (center frequency f0 =
16KHz (hereinafter referred to as BPF), 29 and 30 are detection circuits, 31 and 32 are smoothing circuits, 33 and 34 are DC amplifier circuits, respectively.
6 and 37 are comparator circuits (hereinafter referred to as CMP), respectively.
), 38 is a constant current circuit, 39, 40 and 41 are reference voltages Vr 1 , Vr 2 and Vr 3 applied to the inverting input terminal (-) of CMP 35 and the non-inverting input terminal (+) of CMP 36 and 37, respectively. Partial voltage resistance to give, 42
are AND gates, 43 and 44 are D-type flip-flop circuits, and 45 is an RS-type flip-flop circuit (the flip-flop circuits are hereinafter commonly referred to as FF), which are connected as shown in the figure. .
次に、第1図の動作を第2図と共に説明する。 Next, the operation shown in FIG. 1 will be explained with reference to FIG. 2.
操作の開始によつて、図示していない電源スイ
ツチが閉成されると、回路の各部に給電が行なわ
れると共に、FF43,44及び45はリセツト
が解除される。 When a power switch (not shown) is closed at the start of the operation, power is supplied to each part of the circuit, and the FFs 43, 44, and 45 are released from reset.
また、この初期状態、即ち、トランジスタ3が
導通している状態では、実質的に定電流回路4と
抵抗5によるa点と、定電流回路8と抵抗9によ
るb点とがほゞ同電位に設定してあり、従つて、
OPA7の出力端子a′点もそれと同電位であり、
延いては、抵抗10,11及び12を経たOPA
13の両入力端子も同電位であり、その出力端子
c点も同電位となつている。一方、OPA15の
出力を「L」レベルと仮定すると、その非反転入
力端子(+)には、抵抗9端の電圧を分圧した電
位とグランドG間において、抵抗18及び19に
より分圧されたd点の電圧が与えられ、OPA1
5の両入力端子の電位は、c>dの関係に置かれ
ている。 Further, in this initial state, that is, in a state where the transistor 3 is conductive, point a, which is formed by the constant current circuit 4 and the resistor 5, and point b, which is formed by the constant current circuit 8 and the resistor 9, are at approximately the same potential. has been set, so
The output terminal a' point of OPA7 is also at the same potential,
By extension, OPA via resistors 10, 11 and 12
Both input terminals of 13 are at the same potential, and its output terminal at point c is also at the same potential. On the other hand, assuming that the output of OPA15 is "L" level, the non-inverting input terminal (+) has a voltage divided by resistors 18 and 19 between the potential obtained by dividing the voltage at resistor 9 end and ground G. The voltage at point d is given, OPA1
The potentials of both input terminals of 5 are placed in the relationship c>d.
そして、時間形成回路1が動作して、その出力
がt=25msの時間だけ「H」レベルへ反転す
る。この結果、同様にインバータ2の出力が
「L」レベルへ反転し、トランジスタ6が遮断す
るので、コンデンサ6は抵抗5を介して定電流回
路4により定電流充電され、その定電流をI、コ
ンデンサ6の容量をCとすると、OPA7の出力
端子a′点の電圧Vは、V=(1/C)I・tの関
係式により、○イで示す如く、上述の電位から上昇
する。 Then, the time forming circuit 1 operates and its output is inverted to the "H" level for a time of t=25 ms. As a result, the output of the inverter 2 similarly inverts to the "L" level and the transistor 6 is cut off, so that the capacitor 6 is charged with a constant current by the constant current circuit 4 via the resistor 5, and the constant current is transferred to I, the capacitor Assuming that the capacitance of OPA 6 is C, the voltage V at the output terminal a' of OPA 7 rises from the above-mentioned potential as shown by ◯A according to the relational expression V=(1/C)I·t.
この結果、OPA13の両入力端子に電位差が
生じ、電流Ixが流れ込み、コンデンサ14が図示
の方向に充電される。従つて、○ロに示す如く、
OPA13の出力端子、即ち、OPA15の反転入
力端子(−)c点の電位は上述の電位から下降
し、そして、c点の電位がd点の電位に達する
と、OPA15の出力端子は「H」レベルへ反転
し、点線で示す如く、d点の電位を上昇させると
共に、トランジスタ20を導通させる。依つて、
抵抗10と11の接続点をグランドGのレベルに
落すので、コンデンサ14の充電々荷が、抵抗1
1及びトランジスタ20を介して放電され、c点
の電位は上昇し、c点の電位が先に上昇したd点
の電位に達すると、OPA15の出力端子は再び
「L」レベルへ反転し、d点のレベルを初めの状
態に戻すと共に、トランジスタ20を遮断させ
る。すると、コンデンサ14が電流Ixにより再び
充電を開始され、c点の電位は再び下降して行
く。 As a result, a potential difference is generated between both input terminals of OPA 13, current Ix flows, and capacitor 14 is charged in the direction shown. Therefore, as shown in ○B,
The output terminal of OPA13, that is, the inverting input terminal (-) of OPA15, the potential at point c falls from the above-mentioned potential, and when the potential at point c reaches the potential at point d, the output terminal of OPA15 becomes "H". As shown by the dotted line, the potential at point d is increased and the transistor 20 is made conductive. Therefore,
Since the connection point between resistors 10 and 11 is lowered to the ground G level, the electrical charge of capacitor 14 is transferred to resistor 1.
1 and the transistor 20, the potential at point c rises, and when the potential at point c reaches the previously increased potential at point d, the output terminal of the OPA 15 is again inverted to the "L" level, and the potential at point c rises. The level of the point is returned to the initial state, and the transistor 20 is turned off. Then, the capacitor 14 starts to be charged again by the current Ix, and the potential at point c starts to fall again.
以上の動作を繰り返えし、IRD22はOPA1
5の出力端子が「H」レベルへ反転して、トラン
ジスタ21が導通した時だけパルス点灯され、そ
の電流Ixがa′点の電圧Vの上昇に対応して逐時増
大しており、毎回のd点の電位までの充電時間が
速くなるので、その点滅の周期が速くなり、発光
の周波数は低周波数からBPF27及び28の中
心周波数0=16KHzに向つて高周波数になつて
行く。 Repeat the above operation, IRD22 becomes OPA1
The pulse is lit only when the output terminal of 5 is inverted to the "H" level and the transistor 21 is conductive, and the current Ix increases gradually in response to the rise in the voltage V at point a', and the Since the charging time to the potential at point d becomes faster, the blinking period becomes faster, and the frequency of light emission increases from a low frequency to a high frequency toward the center frequency of BPF 27 and 28, 0=16 KHz.
このIRD22の点灯による投射光は、測距対象
から反射してSPD23及び24で受光され、こ
の結果、e及びe′点の受光出力は、○ハに示す如
く、自然光による直流成分に重畳されて発生す
る。 The light projected by the lighting of the IRD 22 is reflected from the distance measurement target and received by the SPDs 23 and 24, and as a result, the received light output at points e and e' is superimposed on the DC component due to natural light, as shown in ○c. Occur.
また、交流増幅回路25及び26の後の及び
′点の出力は○ヘに示す如く、増幅されて現われ
る。 Further, the outputs at points and '' after the AC amplifier circuits 25 and 26 are amplified and appear as shown in circles.
更に、BPF27及び28後のg及びg′点の出力
は、その中心周波数を0=16KHzに設定してあ
るので、○ホに示す如く、○ニの波形を増幅したよう
に現われる。 Furthermore, since the center frequency of the outputs at points g and g' after BPF 27 and 28 is set to 0=16 KHz, they appear as if the waveform at point ○2 has been amplified, as shown in ○ho.
更にまた、検波回路29及び30後のh及び
h′点の出力波形は、○ヘに示す如くになり、平滑回
路31及び32を経た直流増幅回路24及び25
後のj及びj′は、○トに示す如く、所定値から徐々
に上昇する。 Furthermore, h and after the detection circuits 29 and 30
The output waveform at point h' is as shown in ○F, and the DC amplifier circuits 24 and 25 pass through the smoothing circuits 31 and 32.
The latter j and j' gradually increase from the predetermined value, as shown in ◯.
そして、第2図に示す如く、測距対象が近距離
位置に存在している場合には、a1,a2に示す
如く、反射光スポツトXが、SPD23に充分広
くかゝり、SPD24に極く狭くかゝるので、j
点の出力電圧Vjがj′点の出力電圧Vj′よりも充分
高いと共に、その出力電圧Vjが基準電圧Vr1に達
した時、CMP35の出力が「H」レベルへ反転
して、先の時間tの間「H」レベルの信号が与え
られているアンドゲート24が開いてその出力が
「H」レベルへ反転する。一方、その時点では、
j′点の出力電圧Vj′が基準電圧Vr3にも達していな
いので、CMP36及び37の出力は共に「H」
レベルのまゝである。従つて、アンドゲート42
の出力の「H」レベルの立上り信号をクロツクパ
ルスとするFF43及び44は、共に「H」レベ
ルの信号を読み込み、夫々の出力端子Q1及びQ2
に「H」レベルの信号を記憶し、またその立上り
信号をセツトパルスとするFF45は、出力端子
Q3が「H」レベルへ反転する。 As shown in FIG. 2, when the object to be measured is located at a short distance, the reflected light spot Because it is narrow,
When the output voltage Vj at the point is sufficiently higher than the output voltage Vj' at the point j' and the output voltage Vj reaches the reference voltage Vr 1 , the output of the CMP35 is inverted to the "H" level, and the previous time The AND gate 24 to which the "H" level signal is applied during time t is opened and its output is inverted to the "H" level. On the other hand, at that point,
Since the output voltage Vj' at point j' has not reached the reference voltage Vr 3 , both the outputs of CMP36 and CMP37 are "H".
It remains at the same level. Therefore, AND gate 42
The FFs 43 and 44, which use the "H" level rising signal of the output as a clock pulse, both read the "H" level signal and output the signals to their respective output terminals Q1 and Q2.
The FF45, which stores an "H" level signal at the output terminal and uses the rising signal as a set pulse, outputs the
Q3 flips to "H" level.
また、測距対象が中距離位置に存在している場
合には、b1,b2に示す如くになり、同様の動
作で出力電圧Vj′がVr2<Vr3の間に在るので、
FF43の出力Q1は「H」レベルの信号を、他方
FF44の出力端子Q2は「L」レベルの信号を
夫々記憶し、またFF45の出力端子Q3は「H」
レベルへ反転する。 In addition, when the object to be measured is located at a middle distance position, the output voltage Vj' is between Vr 2 < Vr 3 due to the same operation, as shown in b1 and b2.
Output Q 1 of FF43 sends a “H” level signal, and the other
The output terminal Q 2 of FF44 stores "L" level signals, and the output terminal Q 3 of FF45 stores "H" level signals.
Flip to level.
更に、測距対象が遠距離への境界位置に存在し
ていた場合には、c1,c2において実線で示す
如く、反射光スポツトXがSPD23及び24に
ほゞ等分にかゝり、従つて、その出力電圧Vj及
びVj′はほゞ等しく、その判別時点では、出力電
圧Vj′が基準電圧Vr2よりも高くなつているので、
FF43及び44の夫々出力端子Q1及びQ2は
「L」レベルの信号を記憶し、またFF45の出力
端子Q3は「H」レベルへ反転する。 Furthermore, if the object to be measured is located at a boundary position to a long distance, the reflected light spot , the output voltages Vj and Vj' are almost equal, and at the time of the determination, the output voltage Vj' is higher than the reference voltage Vr 2 , so
The output terminals Q 1 and Q 2 of the FFs 43 and 44 store "L" level signals, and the output terminal Q 3 of the FF 45 is inverted to "H" level.
更にまた、測距対象が極遠距離位置に存在して
いた場合には、c1,c2において鎖線で示す如
く、反射光スポツトX′がSPD24の方に広く
かゝるが、極遠距離のため、出力電圧Vjは先の
時間t内には基準電圧Vr1に達せず(測距対象が
反射率の小さいものゝ場合も同様になることがあ
る)、CMP35の出力が「L」レベルのまゝであ
り、その時間tが終了すると、アンドゲート42
がゲートを閉じるので、FF45はセツトされず、
出力端子Q3が「L」レベルのまゝの状態に保持
される。 Furthermore, if the object to be measured is located at a very far distance, the reflected light spot X' will be wider toward the SPD24 at c1 and c2, as shown by the chain line, but because the distance is very far away, , the output voltage Vj does not reach the reference voltage Vr 1 within the previous time t (this may also happen when the distance measurement target has a low reflectance), and the output of the CMP35 remains at the "L" level. , and when the time t ends, the AND gate 42
closes the gate, so FF45 is not set,
Output terminal Q3 remains at the "L" level.
なお、この時は、アンドゲート42の出力が
「H」レベルへ反転することはないので、FF43
及び44は読み込み動作を行わない。 Note that at this time, the output of the AND gate 42 does not invert to the "H" level, so the FF 43
and 44 do not perform a read operation.
即ち、第3図の真理値の図表に示す如く、FF
43及び44の出力端子Q1及びQ2の信号レベル
状態により近、中及び遠距離を判別するように設
定されているものであり、更に、FF45の出力
端子Q3が「L」レベルの時は、FF43及び44
による判別に優先して遠距離を判別するように設
定されるものである。 That is, as shown in the truth value chart in Figure 3, FF
It is set to distinguish near, medium and long distance based on the signal level status of output terminals Q 1 and Q 2 of FF 43 and 44, and when the output terminal Q 3 of FF 45 is at "L" level. is FF43 and 44
This is set to give priority to long-distance discrimination.
また、第1図のCMP36及び37への基準電
圧は、固定バイアスであり、出力電圧Vj′と出力
電圧Vjとは絶対値比較が行われている。 Further, the reference voltage to the CMPs 36 and 37 in FIG. 1 is a fixed bias, and the output voltage Vj' and the output voltage Vj are compared in absolute value.
第4図の実施例は、CMP36及び37への基
準電圧が変動する出力電圧Vjを分割する形で与
えられ、従つて、出力電圧Vj′は出力電圧Vjに対
する割合の量として比較が行われる。なお、分圧
回路のVbは、例えば、IRD22を動作させてい
ない時のSPD23或は24の受光出力回路の通
常の電圧レベルがバイアスされている。 In the embodiment of FIG. 4, the reference voltages to the CMPs 36 and 37 are provided in a manner that divides the varying output voltage Vj, so that the output voltage Vj' is compared as a proportion of the output voltage Vj. Note that Vb of the voltage dividing circuit is biased to, for example, the normal voltage level of the light receiving output circuit of the SPD 23 or 24 when the IRD 22 is not operating.
また、第1図の回路動作では、CMP35の出
力が「H」レベルへ反転した時、出力電圧Vj′の
状態を判別する訳けであるが、アンドゲート42
以下の累積される動作遅れ時間により、その判別
に精度を欠く場合が起り得る。 In addition, in the circuit operation shown in FIG. 1, when the output of the CMP 35 is inverted to the "H" level, the state of the output voltage Vj' is determined, but the AND gate 42
Due to the following accumulated operation delay time, the determination may lack accuracy.
これに対し、第4図の実施例の特徴は、上述の
如く、割合の量、即ち、出力電圧Vj′は出力電圧
Vjに対する比で判別されるので、前実施例より
も精度の向上が計れるものである。 On the other hand, the feature of the embodiment shown in FIG. 4 is that, as mentioned above, the output voltage Vj' is
Since the determination is made based on the ratio to Vj, the accuracy can be improved compared to the previous embodiment.
なお、上述の測距出力の段数は増減可能であ
り、更に、FF45により遠距離を判別した場合、
伴せて警報を発するようにすることもできる。 Note that the number of stages of the distance measurement output mentioned above can be increased or decreased, and furthermore, when determining a long distance using FF45,
It is also possible to issue an alarm accordingly.
以上の如く、本発明は、受光素子出力の対数圧
縮や増幅回路の自動利得調整を行うことなく、発
光素子の発光周波数を変化させる簡単な構成によ
り安定した動作で測距状態を判別することができ
るものである。 As described above, the present invention makes it possible to determine the ranging state with stable operation using a simple configuration that changes the light emission frequency of the light emitting element without performing logarithmic compression of the light receiving element output or automatic gain adjustment of the amplifier circuit. It is possible.
第1図は本発明の一実施例を示した回路図、第
2図は受光素子に対する反射光スポツトの状態と
出力電圧の関係を示した説明図、第3図は測距出
力の一例を示した真理値の図表、第4図は本発明
の他の実施例を示した部分回路図である。
1……時間形成回路、7,13及び15……演
算増幅回路、22……赤外線発光ダイオード、2
3及び24……シリコンホトダイオード、25及
び26……交流増幅回路、27及び28……帯域
フイルター回路、29及び30……検波回路、3
1及び32……平滑回路、33及び34……直流
増幅回路、35,36及び37……コンパレータ
回路、X及びX′……反射光スポツト。
Fig. 1 is a circuit diagram showing an embodiment of the present invention, Fig. 2 is an explanatory diagram showing the relationship between the state of the reflected light spot and the output voltage with respect to the light receiving element, and Fig. 3 shows an example of the distance measurement output. FIG. 4 is a partial circuit diagram showing another embodiment of the present invention. 1... Time forming circuit, 7, 13 and 15... Operational amplifier circuit, 22... Infrared light emitting diode, 2
3 and 24...Silicon photodiode, 25 and 26...AC amplifier circuit, 27 and 28...Band filter circuit, 29 and 30...Detection circuit, 3
1 and 32...Smoothing circuit, 33 and 34...DC amplifier circuit, 35, 36, and 37...Comparator circuit, X and X'...Reflected light spot.
Claims (1)
て投射し、その反射光を隣接配置された二つの受
光素子で受光する三角測距方式の測距装置におい
て、前記発光素子をパルス点灯させると共に、前
記受光素子の出力を処理する回路系に帯域フイル
ター回路を設け、一定時間内において該発光素子
の発光周波数を該帯域フイルター回路の中心周波
数に向けて変化させ、前記一方の受光素子回路の
出力がある設定値に達した時点で、前記他方の受
光素子回路の出力状態を判別するようにしたこと
を特徴とする測距装置。 2 発光素子から発せられた光を測距対象に向け
て投射し、その反射光を隣接配置された二つの受
光素子で受光する三角測距方式の測距装置におい
て、前記発光素子をパルス点灯させると共に、前
記受光素子の出力を処理する回路系に帯域フイル
ター回路を設け、一定時間内において該発光素子
の発光周波数を該帯域フイルター回路の中心周波
数に向けて変化させ、前記一方の受光素子回路の
出力がある設定値に達した時の、前記他方の受光
素子回路の出力を、該一方の受光素子回路の出力
に対する所定の割合の量と比較して判別するよう
にしたことを特徴とする測距装置。 3 他方の受光素子回路の出力を複数のレベルと
比較するようにしたことを特徴とする特許請求の
範囲第1項または第2項に記載の測距装置。 4 一定時間内に一方の受光素子回路の出力があ
る設定値に達しない時は、測距出力を遠距離とし
て判別するようにしたことを特徴とする特許請求
の範囲第1項または第2項に記載の測距装置。[Scope of Claims] 1. In a triangular distance measuring device in which light emitted from a light emitting element is projected toward a distance measuring object and the reflected light is received by two adjacently arranged light receiving elements, A band filter circuit is provided in a circuit system that pulses the light emitting element and processes the output of the light receiving element, and changes the emission frequency of the light emitting element toward the center frequency of the band filter circuit within a certain period of time, and A distance measuring device characterized in that the output state of the other light-receiving element circuit is determined when the output of one light-receiving element circuit reaches a certain set value. 2. In a triangular distance measuring device in which light emitted from a light emitting element is projected toward a distance measurement target and the reflected light is received by two adjacently arranged light receiving elements, the light emitting element is lit in pulses. At the same time, a bandpass filter circuit is provided in a circuit system that processes the output of the light receiving element, and the emission frequency of the light emitting element is changed toward the center frequency of the bandpass filter circuit within a certain period of time. The measurement is characterized in that when the output reaches a certain set value, the output of the other light-receiving element circuit is compared with a predetermined ratio of the output of the one light-receiving element circuit. range device. 3. The distance measuring device according to claim 1 or 2, wherein the output of the other light receiving element circuit is compared with a plurality of levels. 4. Claims 1 or 2, characterized in that when the output of one of the light receiving element circuits does not reach a certain set value within a certain period of time, the distance measurement output is determined as long distance. The distance measuring device described in .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58032587A JPS59159009A (en) | 1983-02-28 | 1983-02-28 | Distance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58032587A JPS59159009A (en) | 1983-02-28 | 1983-02-28 | Distance measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59159009A JPS59159009A (en) | 1984-09-08 |
| JPH0226728B2 true JPH0226728B2 (en) | 1990-06-12 |
Family
ID=12362994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58032587A Granted JPS59159009A (en) | 1983-02-28 | 1983-02-28 | Distance measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59159009A (en) |
-
1983
- 1983-02-28 JP JP58032587A patent/JPS59159009A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59159009A (en) | 1984-09-08 |
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