JPH03225283A - Short defect inspecting method - Google Patents

Short defect inspecting method

Info

Publication number
JPH03225283A
JPH03225283A JP2020665A JP2066590A JPH03225283A JP H03225283 A JPH03225283 A JP H03225283A JP 2020665 A JP2020665 A JP 2020665A JP 2066590 A JP2066590 A JP 2066590A JP H03225283 A JPH03225283 A JP H03225283A
Authority
JP
Japan
Prior art keywords
leads
short
contact pins
pitch
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2020665A
Other languages
Japanese (ja)
Inventor
Kazuto Kasuga
春日 和人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP2020665A priority Critical patent/JPH03225283A/en
Publication of JPH03225283A publication Critical patent/JPH03225283A/en
Pending legal-status Critical Current

Links

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  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To easily detect short without using a large-scaled inspecting tool by electrically connecting a contact pin between the leads of electronic parts at the pitch between the contact pins which is set as the double of the pitch between the leads of the electronic parts. CONSTITUTION:The pitch A between the contact pins 12 and 12 is set as the double of the pitch B between the leads 411 and 411 of the electronic parts 41 mounted on a printed board 4. With such constitution, the pin 12 being a short defect detecting device is assigned between the leads 411 and 411 of the parts 41 mounted on the board 4. At such a time, the lead 411 is electrically connected to the lead 411 and it is possible to decide whether short defect occurs or not. Furthermore, the short is detected among all the leads by laterally deviating the pin 12 and electrically connecting between other leads 411.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はショート不良検出方法に関し、特にフィクスチ
ャーを用いずに容易にショート不良を検出できるショー
ト不良検出方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for detecting short circuit defects, and particularly to a method for detecting short circuit defects that can easily detect short circuit defects without using a fixture.

[従来の技術] 従来より、多種多様の回路を構成するため弁、プリント
基板へ半田付けなどの実装手段によりに様々な電子部品
が実装されている。
[Prior Art] Conventionally, various electronic components have been mounted on valves and printed circuit boards by mounting means such as soldering to configure a wide variety of circuits.

この実装された電子部品が確実に電気的接続が行なわれ
ているか否か検査が必要とされている。
It is necessary to inspect whether the mounted electronic components are electrically connected reliably.

この不良検査を行なう方法として、検査装置であるフィ
クチャーが用いられている。
A fixture, which is an inspection device, is used as a method for performing this defect inspection.

このフィクスチャーは、通常第3図に示すように、フイ
クスチャーピンボード311上で、かつプリント基板4
に実装された電子部品41の実装位置に適する位置に接
点ピン312を有するとともに、端部にプリント基板4
を案内するガイドピン313を有する本体31と、本体
31の一端に回動可能に取り付けられ、本体31と向か
い合う面に複数のプリント基板押えピン321を有する
押え部32とから構成されている。
This fixture is usually mounted on a fixture pin board 311 and on a printed circuit board 4, as shown in FIG.
It has a contact pin 312 at a position suitable for the mounting position of the electronic component 41 mounted on the printed circuit board 4 at the end.
The holding part 32 is rotatably attached to one end of the main body 31 and has a plurality of printed circuit board holding pins 321 on the surface facing the main body 31.

このフィクスチャ−3により、不良検査を行なう場合、
フィクチャー3の本体31のガイドピン313によりプ
リント基板4を案内させて固定する。
When performing defect inspection using this fixture 3,
The printed circuit board 4 is guided and fixed by the guide pin 313 of the main body 31 of the fixture 3.

次に、押え部32を閉じてプリント基板4を挟p込んで
、接点ピン312と電子部品41の半田付けされたリー
ド411を電気的に接続してショート不良の検出を行な
っている。
Next, the holding part 32 is closed and the printed circuit board 4 is sandwiched, and the contact pins 312 and the soldered leads 411 of the electronic component 41 are electrically connected to detect a short circuit defect.

発明が解決しようとする課題 上述したように、従来のショート不良検出方法は、実装
された電子部品のリードが増え、リードピッチが狭くな
ると、接点ピンの間隔も同じように狭めなければならず
、また接点ピンの径も細くする必要がある。
Problems to be Solved by the Invention As mentioned above, in the conventional short circuit defect detection method, as the number of leads of the mounted electronic component increases and the lead pitch becomes narrower, the spacing between the contact pins must be similarly narrowed. It is also necessary to reduce the diameter of the contact pin.

しかし、フィクスチャーピンボードの加工精度と、接点
ピンの強度には制限があるため、フィクスチャーの制作
に大きな制約を加えてしまうという欠点がある。
However, there are limits to the machining accuracy of the fixture pin board and the strength of the contact pins, which has the disadvantage of placing significant restrictions on fixture production.

それ故に本発明の目的は、上接接点ピンの間隔を狭くす
ることなく、またフィクスチャーを用いることなく容易
にショート不良を検出できる検出方法を提供することに
ある。
Therefore, an object of the present invention is to provide a detection method that can easily detect short-circuit defects without narrowing the interval between upper contact pins or without using a fixture.

[課題を解決するための手段] 従って、本発明は上述した目的を達成するために、プリ
ント基板に実装された電子部品のリードに対し、本体よ
り突出する接点ピンを複数有するショート不良検出装置
の前記接点ピンを電気的に接続してショート不良を検出
するショート不良検出方法において、前記電子部品のリ
ード間の間隔に対し倍間隔に設けられた前記接点ピン間
の間隔で、前記接点ピンを前記電子部品のリード間に電
気的に接続してショート不良を検出するものである。
[Means for Solving the Problems] Therefore, in order to achieve the above-mentioned object, the present invention provides a short circuit failure detection device having a plurality of contact pins protruding from the main body for the leads of electronic components mounted on a printed circuit board. In the method for detecting short-circuit defects by electrically connecting the contact pins, the contact pins are connected to each other at a distance between the contact pins that is twice the distance between the leads of the electronic component. It detects short-circuit defects by electrically connecting between the leads of electronic components.

作用 上述した構成により、接点ピンを部品リード間に電気的
に接続して、ショート不良検出を行なう。
Operation With the above-described configuration, the contact pins are electrically connected between the component leads to detect short-circuit defects.

実施例 本発明のショート不良検出方法について、図面を参照し
て説明する。
Embodiment A method for detecting short-circuit defects according to the present invention will be explained with reference to the drawings.

まず、本発明のショート不良検出方法1は、第1図に示
すように、本体11とこの本体より突出する複数の接点
ピン12から構成されている。
First, the method 1 for detecting short-circuit defects of the present invention, as shown in FIG. 1, is composed of a main body 11 and a plurality of contact pins 12 protruding from the main body.

この接点ピン12と接点ピン12とのピッチAは、プリ
ント基板4に実装された電子部品41のリード411と
リード411とのピッチBの2@の間隔に設定している
The pitch A between the contact pins 12 is set to 2@, which is the pitch B between the leads 411 of the electronic component 41 mounted on the printed circuit board 4.

次に、このショート不良検出方法について説明する。Next, this short circuit defect detection method will be explained.

第2図に示すように、ショート不良検出装置1の接点ピ
ン12をプリント基板4に実装された電子部品41のリ
ード411とリード41−0間にあでる。
As shown in FIG. 2, the contact pin 12 of the short-circuit detection device 1 is placed between the lead 411 and the lead 41-0 of the electronic component 41 mounted on the printed circuit board 4. As shown in FIG.

この時、リード411.418間は電気的に接続状態に
なり、ショート不良であるか、否かの判定が可能となる
At this time, the leads 411 and 418 are electrically connected, making it possible to determine whether or not there is a short-circuit defect.

さらに、この接点ピン12を第3図に示すように横にず
らし、他のリード411間を電気的に接続することによ
り、全てのリード間のショートを検出する。
Further, by moving this contact pin 12 laterally as shown in FIG. 3 and electrically connecting other leads 411, a short circuit between all the leads is detected.

効果 以上説明したように、本発明によれば、上述したように
、フイクスチャーのような大がかりな検査具を必要とせ
ず、容易に検出することができる。
Effects As explained above, according to the present invention, detection can be easily performed without requiring a large-scale inspection tool such as a fixture.

また、接点ピンをどちらか一方のリードにずらすだけで
、全てのリード間のショート不良を検出することができ
る。
Furthermore, short-circuit defects between all leads can be detected by simply shifting the contact pin to one of the leads.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例であるショート不良検出方法
に用いる検査装置を示す斜視図、第2図は本発明のショ
ート不良検出方法の検出例を示す側面図、第3図は第2
図の検出位置から接点ピンを横にずらした検出状態を示
す側面図である。 ■・・・ショート不良検出装置、 11−・・本体、 12・・・接点ピン。
FIG. 1 is a perspective view showing an inspection device used in a short-circuit detection method according to an embodiment of the present invention, FIG. 2 is a side view showing a detection example of the short-circuit detection method of the present invention, and FIG.
FIG. 3 is a side view showing a detection state in which the contact pin is laterally shifted from the detection position shown in the figure. ■...Short circuit defect detection device, 11-...Main body, 12...Contact pin.

Claims (1)

【特許請求の範囲】 プリント基板に実装された電子部品のリードに対し、本
体より突出する接点ピンを複数有するショート不良検出
装置の前記接点ピンを電気的に接続してショート不良を
検出するショート不良検出方法において、 前記電子部品のリード間の間隔に対し倍間隔に設けられ
た前記接点ピン間の間隔で、前記接点ピンを前記電子部
品のリード間に電気的に接続してショート不良を検出す
ることを特徴とするショート不良検出方法。
[Claims] A short-circuit defect is detected by electrically connecting a contact pin of a short-circuit defect detection device having a plurality of contact pins protruding from a main body to a lead of an electronic component mounted on a printed circuit board. In the detection method, a short circuit failure is detected by electrically connecting the contact pins between the leads of the electronic component at a spacing between the contact pins that is twice the spacing between the leads of the electronic component. A method for detecting short circuit defects.
JP2020665A 1990-01-31 1990-01-31 Short defect inspecting method Pending JPH03225283A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2020665A JPH03225283A (en) 1990-01-31 1990-01-31 Short defect inspecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020665A JPH03225283A (en) 1990-01-31 1990-01-31 Short defect inspecting method

Publications (1)

Publication Number Publication Date
JPH03225283A true JPH03225283A (en) 1991-10-04

Family

ID=12033495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020665A Pending JPH03225283A (en) 1990-01-31 1990-01-31 Short defect inspecting method

Country Status (1)

Country Link
JP (1) JPH03225283A (en)

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