JPH0326046U - - Google Patents

Info

Publication number
JPH0326046U
JPH0326046U JP8505789U JP8505789U JPH0326046U JP H0326046 U JPH0326046 U JP H0326046U JP 8505789 U JP8505789 U JP 8505789U JP 8505789 U JP8505789 U JP 8505789U JP H0326046 U JPH0326046 U JP H0326046U
Authority
JP
Japan
Prior art keywords
tilt angle
holder
specimen
sample
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8505789U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8505789U priority Critical patent/JPH0326046U/ja
Publication of JPH0326046U publication Critical patent/JPH0326046U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本案による試料ホールダ傾斜角検出回
路と試料微動装置の構成を示す図である。 3……対物レンズ、4……試料台、6……試料
ホールダ、7……傾斜モータ、10……傾斜角表
示機能、11……傾斜角検出機構、12……検出
回路、13……制御回路。
FIG. 1 is a diagram showing the configuration of a sample holder inclination angle detection circuit and a sample fine movement device according to the present invention. 3...Objective lens, 4...Sample stage, 6...Sample holder, 7...Tilt motor, 10...Tilt angle display function, 11...Tilt angle detection mechanism, 12...Detection circuit, 13...Control circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子顕微鏡等の試料微動装置内に挿入される試
料ホールダの傾斜角制限の為、検出回路を設ける
と共に各種の試料ホールダごとに許容される最大
の傾斜角を表示しこの表示内容を検出する事によ
り試料ホールダ挿入事に最大傾斜角の設定を行な
い、試料ホールダ傾斜時に発生する試料ホールダ
周辺部との接触や接触により起こる破損防止を図
る事を特徴とする電子顕微鏡等の試料微動装置。
In order to limit the tilt angle of a sample holder inserted into a sample fine movement device such as an electron microscope, a detection circuit is installed, the maximum tilt angle allowed for each type of sample holder is displayed, and this display content is detected. A specimen fine movement device for an electron microscope, etc., characterized by setting a maximum tilt angle when inserting a specimen holder to prevent damage caused by contact with or contact with the periphery of the specimen holder that occurs when the specimen holder is tilted.
JP8505789U 1989-07-21 1989-07-21 Pending JPH0326046U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8505789U JPH0326046U (en) 1989-07-21 1989-07-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8505789U JPH0326046U (en) 1989-07-21 1989-07-21

Publications (1)

Publication Number Publication Date
JPH0326046U true JPH0326046U (en) 1991-03-18

Family

ID=31633953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8505789U Pending JPH0326046U (en) 1989-07-21 1989-07-21

Country Status (1)

Country Link
JP (1) JPH0326046U (en)

Similar Documents

Publication Publication Date Title
EP0849765A3 (en) Charged particle beam system with optical microscope
JPH0326046U (en)
JPS5941967U (en) Sample position display device for scanning electron microscopes, etc.
JPH02120259U (en)
JPS6244451Y2 (en)
JPS63192836U (en)
JPS61200657A (en) Sample slightly-moving device for electron microscope or the like
JPH085363Y2 (en) Support device for the detection lever for the board
JPH0231057U (en)
JPS584482U (en) bicycle mount
JPH11345537A (en) Support structure of push button for push switch
JPS60131952U (en) image display device
JPS60166969U (en) Scanning electron microscope sample stage
JPS6049214A (en) Inclination detector
JPH0326110U (en)
JPS61104961U (en)
JPS64259U (en)
JPS6085056U (en) Sample tilting device for stereoscopic observation
JPH0326047U (en)
JPS60121249U (en) Sample equipment for scanning electron microscopes, etc.
JPH0324925U (en)
JPS60129064U (en) electronic microscope
JPS616251U (en) Electron beam position fluctuation prevention device
Blanc et al. Self-revealing microscopies: natural contrast for the control of industrial processes
JPH0364462U (en)