JPH042139A - Solder supply plate - Google Patents

Solder supply plate

Info

Publication number
JPH042139A
JPH042139A JP2104298A JP10429890A JPH042139A JP H042139 A JPH042139 A JP H042139A JP 2104298 A JP2104298 A JP 2104298A JP 10429890 A JP10429890 A JP 10429890A JP H042139 A JPH042139 A JP H042139A
Authority
JP
Japan
Prior art keywords
solder
terminal
supply plate
solder supply
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2104298A
Other languages
Japanese (ja)
Other versions
JP2811112B2 (en
Inventor
Kiyotaka Tsukada
輝代隆 塚田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ibiden Co Ltd
Original Assignee
Ibiden Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibiden Co Ltd filed Critical Ibiden Co Ltd
Priority to JP2104298A priority Critical patent/JP2811112B2/en
Publication of JPH042139A publication Critical patent/JPH042139A/en
Application granted granted Critical
Publication of JP2811112B2 publication Critical patent/JP2811112B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/011Apparatus therefor
    • H10W72/0113Apparatus for manufacturing die-attach connectors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistors
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3465Application of solder

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Die Bonding (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、電子回路基板あるいは電子部品等の接続端子
に半田を供給する半田供給板であって、半田層の形成が
困難な所へも容易に半田を供給することができる半田供
給板に関するものである。
Detailed Description of the Invention (Industrial Field of Application) The present invention is a solder supply plate that supplies solder to connection terminals of electronic circuit boards or electronic components, and is applicable to places where it is difficult to form a solder layer. The present invention relates to a solder supply plate that can easily supply solder.

(従来の技術) 従来から表面実装部品等の電子部品を、電子回路基板(
以下、単に基板という)に形成した導体回路上に実装す
る場合には、この導体回路あるいは電子部品の何れか少
なくとも一方の接続端子に、半田層を形成し、接続端子
同志を接触させたうえで加熱溶融することにより、電子
部品と基板とを非常に簡単に接続している。
(Conventional technology) Electronic components such as surface mount components have traditionally been mounted on electronic circuit boards (
When mounting on a conductor circuit formed on a conductor circuit (hereinafter simply referred to as a board), a solder layer is formed on the connection terminals of at least one of the conductor circuit or the electronic component, and the connection terminals are brought into contact with each other. By heating and melting, electronic components and substrates are connected very easily.

上記のような半田層を形成する方法としては、次の二つ
の方法か代表的なものである。
There are two typical methods for forming the solder layer as described above.

第一の方法は、基板あるいは電子部品の接続端子に対し
て半田ペーストを印刷し、このように印刷した半田ペー
ストを加熱して接続する方法である。なお、この場合、
半田ペーストに代えて溶融半田中に基板又は電子部品を
浸漬する方法、あるいは、所定の部分以外にマスクを施
して、スパッタリング、蒸着等で半田膜を形成する方法
も採用されている。
The first method is to print solder paste on the connection terminals of a board or electronic component, and to connect by heating the printed solder paste. In this case,
Instead of using solder paste, a method of immersing the board or electronic component in molten solder, or a method of forming a solder film by sputtering, vapor deposition, etc. with a mask applied to areas other than the predetermined parts has also been adopted.

第二の方法は、基板上に導体回路と電気的に一体となる
メツキ用リードを使用して形成する方法である。すなわ
ち、この方法は、導体回路に半田によるメツキを行って
、所定の箇所に半田層を形成するのであるが、そのため
には、導体回路の所定箇所に通電するためのメツキ用リ
ードを形成しなければならない。つまり、基板上に導体
回路を形成するに当たって半田層を形成すべき導体回路
全てについてメツキ用リードを接続するように設計しな
ければならないのである。なお、このメツキ用リードは
、最終製品には全く不要な部分である。
The second method is to use a plating lead that is electrically integrated with the conductor circuit on the substrate. In other words, in this method, a conductor circuit is plated with solder to form a solder layer at a predetermined location, but in order to do so, it is necessary to form a lead for plating to conduct electricity to a predetermined location of the conductor circuit. Must be. In other words, when forming conductive circuits on a substrate, it is necessary to design the circuit so that plating leads are connected to all conductive circuits on which solder layers are to be formed. Note that this plating lead is completely unnecessary for the final product.

ところで、近年の電子回路部品は、それがどのような形
式のものであても、高密度化する必要が生じてきている
。従って、各導体回路間の間隔はますます小さくなって
きているのが現状である。
Incidentally, in recent years, it has become necessary to increase the density of electronic circuit components, no matter what type they are. Therefore, the current situation is that the spacing between each conductor circuit is becoming smaller and smaller.

そのため、電子部品の実装も難しくなってきており、基
板と電子部品とを接続する際に、加熱処理後の端子同志
のショート、ブリッジ等の不良が生じ易く、止むをえず
部品の取替を行っているのが現状である。そして、LS
I、IC等の半導体は、その信頼性を確認すべくバーン
イン試験を実施しているのである。
As a result, it has become difficult to mount electronic components, and when connecting circuit boards and electronic components, defects such as short-circuits and bridging between terminals after heat treatment are likely to occur, making it unavoidable to replace components. This is what is currently being done. And L.S.
Semiconductors such as I and ICs undergo burn-in tests to confirm their reliability.

このように、高密度になればなるほど端子自身のサイズ
は小さくなり、しかもその間隔も小さくなってくる。そ
うなると、前述のようなメツキ用リードの形成もできな
くなるのである。
In this way, the higher the density, the smaller the size of the terminals themselves, and the smaller the intervals between them. In this case, it becomes impossible to form the lead for plating as described above.

(発明が解決しようとする課題) そこで、前記二つの方法においては、それぞれ解決しな
ければならない問題点が含まれていることになる。
(Problems to be Solved by the Invention) Therefore, each of the above two methods includes problems that must be solved.

すなわち、第一の方法において生じる問題は、高密度化
された導体回路に対する半田層の形成を正確に行うこと
が困難となることである。つまり、半田ペースト自体、
印刷精度に限界があり、微細な部分に均一な量の半田層
を形成できないのである。即ち、微細になると印刷がか
すれがちになり、半田量が少なくなり、無理に半田量を
多くしようとすると、滲みが生じて溶融時に接続端子同
士が互いに接触してしまうのである。また、溶融半田中
に浸漬する方法においても、微細な間隔となると、前述
と同様に互いに接触してしまうのである。
That is, the problem that arises in the first method is that it is difficult to accurately form a solder layer for a highly densified conductor circuit. In other words, the solder paste itself,
There is a limit to printing accuracy, and it is not possible to form a uniform amount of solder layer on minute parts. That is, when the solder becomes finer, the printing tends to fade and the amount of solder decreases.If you try to force the amount of solder to increase, bleeding occurs and the connecting terminals come into contact with each other when melted. Furthermore, even in the method of dipping into molten solder, if the gaps are too small, they will come into contact with each other in the same way as described above.

第二の方法において生じる問題は、メツキ用リードを形
成しなければならず、しかも端子とメツキ用リードとを
導体パターンで接続しておかなければならないことから
、導体回路の形成が非常に制限されることである。即ち
、第二の方法を採用しようとすると、導体回路の十分な
高密度化を達成することが困難となるのである。
The problem that arises with the second method is that the plating lead must be formed and the terminal and the plating lead must be connected with a conductive pattern, which severely limits the formation of conductor circuits. Is Rukoto. That is, when trying to adopt the second method, it becomes difficult to achieve a sufficiently high density of conductor circuits.

また、電子部品を交換するために、電子部品を基板より
取外して、再度電子部品を実装する場合において、次の
問題が生じる。
Furthermore, when the electronic component is removed from the board and remounted in order to replace the electronic component, the following problem occurs.

即ち、電子部品を基板より取外すことにより、基板に形
成してあった半田層が電子部品に取られてしまい、半田
量が少なくなってしまうのである。
That is, when the electronic component is removed from the board, the solder layer formed on the board is taken up by the electronic component, resulting in a decrease in the amount of solder.

当然再度電子部品を実装する段階では、接続強度が低下
し接続信頼性が低下すると共に、未接続となって不良が
生じることもあるのである。
Naturally, at the stage of re-mounting electronic components, the connection strength decreases, connection reliability decreases, and failures may occur due to disconnection.

これを解決するには、全ての部品を取外し、再度ペース
トを印刷するなりして半田を供給しなければならない。
To solve this problem, all parts must be removed and solder must be supplied by printing paste again.

また、電子部品側に半田を供給するなり、糸状の半田に
より基板側に半田付けを行ったりして、極めて不確実で
煩雑な作業となるのである。
Moreover, as soon as solder is supplied to the electronic component side, soldering is performed on the board side using filamentous solder, making the work extremely uncertain and complicated.

本発明は、以上のような実状に鑑みてなされたものであ
り、その目的とするところは、非常に高密度で配線され
た基板あるいは電子部品等の微細な接続端子に、高精度
でしかも端子同志がショートせずに半田を供給すること
ができ、また、一部の電子部品を取外した時に生じる半
田不足に対し、迅速かつ正確に半田補給を行うことがで
きる半田供給板を提供することにある。
The present invention has been made in view of the above-mentioned circumstances, and its purpose is to provide highly accurate terminal connections to minute connection terminals of extremely densely wired circuit boards or electronic components. To provide a solder supply plate capable of supplying solder without causing a short circuit, and capable of quickly and accurately replenishing solder in case of solder shortage that occurs when some electronic components are removed. be.

(課題を解決するための手段及びその作用)以上の課題
を解決するために本発明が採った手段は、図面に示した
符号を付して説明すると、「電子回路基板(20)ある
いは電子部品(20)等の接続端子(21)に半田(3
0)を供給する半田供給板(lO)であって、 前記接続端子(21)に対応する部分に半田供給用の端
子(11)を設けると共に、この端子(11)の半田付
着性を前記接続端子(21)の半田付着性よりも低くし
たことを特徴とする半田供給板(10)Jである。
(Means for Solving the Problems and Their Effects) The means taken by the present invention to solve the above problems are described with the reference numerals shown in the drawings. Solder (3) to the connection terminal (21) such as (20).
A solder supply plate (lO) for supplying solder 0), which is provided with a terminal (11) for solder supply in a portion corresponding to the connection terminal (21), and the solder adhesion of this terminal (11) is adjusted to match the connection terminal (11). This is a solder supply plate (10) J characterized in that the solder adhesion is lower than that of the terminal (21).

つまり、本発明において最も注目すべきことは、この半
田供給板(10)は、半田(30)の供給を受ける基板
(20)あるいは電子部品(20)等の接続端子(21
)に対して、半田(30)の付着性を悪くしであること
である。即ち、第1図(イ)〜()\)に示すように、
半田(30)の付着性が高い基板(20)あるいは電子
部品(20)の接続端子(21)と接触して半田(30
)を溶融させ、基板(20)あるいは電子部品(20)
の接続端子(21)へこの半田供給板(lO)の半田(
30)を移動させ、溶融したまま半田供給板(10)を
取外すことにより、基板(20)あるいは電子部品(2
0)の接続端子(21)に半田(30)を供給するので
ある。
In other words, what is most noteworthy about the present invention is that the solder supply plate (10) is connected to the connection terminal (21) of the board (20) or electronic component (20) that receives the solder (30).
), the adhesion of the solder (30) is worsened. That is, as shown in Figure 1 (a) to ()\),
If the solder (30) comes into contact with the connection terminal (21) of the electronic component (20) or the board (20) to which the solder (30) has a high adhesion, the solder (30)
) is melted to form a substrate (20) or electronic component (20).
Apply the solder (
30) and remove the solder supply plate (10) while it is still melted, the board (20) or electronic component (2
Solder (30) is supplied to the connection terminal (21) of 0).

本発明によれば、このように端子(11)(21)間の
半田(30)の付着性に差をつける方法としてまず。
According to the present invention, first, as a method for making a difference in the adhesion of the solder (30) between the terminals (11) and (21).

半田供給板(10)の端子(11)の面積を小さくする
ことが重要である。すなわち、この端子(11)の面積
を小さくすると、その端子(11)が保持できる半田(
30)量が少なくなるため、それよりも大きな面積を有
する基板(20)あるいは電子部品(20)の接続端子
(21)に多くの半田(30)が移動し付着するのであ
る。この面積の差は、基板(20)あるいは電子部品(
20)の接続端子(21)に対して80%以下が好まし
い。80%よりも多いと、半田供給板(10)の端子(
11)に半田(30)を保持する量が多くなり、十分な
量の半田(30)を基板(20)あるいは電子部品(2
0)の接続端子(21)に供給しにくくなり、また、付
着力の差があまり生じないため、供給量にばらつきが生
じるためである。
It is important to reduce the area of the terminals (11) of the solder supply plate (10). In other words, if the area of this terminal (11) is reduced, the solder (
30) Since the amount of solder is small, a large amount of solder (30) moves and adheres to the connection terminal (21) of the board (20) or electronic component (20), which has a larger area. This difference in area is based on the substrate (20) or the electronic component (
20) is preferably 80% or less with respect to the connection terminal (21). If it is more than 80%, the terminals of the solder supply plate (10) (
11) has a large amount of solder (30) to hold, and a sufficient amount of solder (30) can be applied to the board (20) or electronic component (2).
This is because it becomes difficult to supply to the connection terminal (21) of No. 0), and since there is not much difference in adhesion force, variations occur in the amount supplied.

また、端子(11)(21)間の半田(30)の付着性
に差をつける方法として、基板(20)あるいは電子部
品(20)の接続端子(21)に使用されている金属よ
りも、溶融半田(30)に対する接触角の小さな金属を
半田供給板(lO)の端子(11)に用いる。二とであ
る。この端子(11)に用いる金属材料としては、銅、
錫、鉛、金、銀、ニッケル、クロム、アルミニウム、パ
ラジウム、白金、鉄あるいはそれらの複合金属が用いら
れるが、これらの間で基板(20)あるいは電子部品(
20)の接続端子(21)に使用されている金属よりも
溶融半田(30)に対する接触角の小さな金属を半田供
給板(10)の端子(11)に使用するとよい。例えば
、基板(20)あるいは電子部品(20)の接続端子(
21)に錫を使用した場合、金、銅、銀、錫−ニッケル
合金が半田供給板(lO)の端子(11)に使用できる
。一方、半田供給板(10)の端子(11)を酸化等、
表面改良したり、有機物、無機物の層を若干量形成して
、接触角を小さくする方法も適用できる。
In addition, as a method of making a difference in the adhesion of the solder (30) between the terminals (11) and (21), it is possible to A metal having a small contact angle with respect to molten solder (30) is used for the terminal (11) of the solder supply plate (1O). It is two. The metal materials used for this terminal (11) include copper,
Tin, lead, gold, silver, nickel, chromium, aluminum, palladium, platinum, iron, or composite metals thereof are used;
It is preferable to use a metal that has a smaller contact angle with the molten solder (30) than the metal used for the connection terminal (21) of the solder supply plate (10) for the terminal (11) of the solder supply plate (10). For example, the connection terminal (
If tin is used for 21), gold, copper, silver, or a tin-nickel alloy can be used for the terminal (11) of the solder supply plate (lO). On the other hand, the terminals (11) of the solder supply plate (10) are oxidized, etc.
It is also possible to reduce the contact angle by improving the surface or forming a small amount of organic or inorganic layer.

また、端子(II)(21)間の半田(30)の付着性
に差をつける方法としての第三の方法は、半田供給板(
10)の端子(11)に溶融半田(30)に濡れない樹
脂あるいは樹脂複合物(12)を一部形成することであ
る。
A third method for differentiating the adhesion of solder (30) between terminals (II) (21) is to use a solder supply plate (
10) A part of the terminal (11) is formed with a resin or resin composite (12) that does not get wet by the molten solder (30).

これを第2図及び第3図によって説明すると、半田供給
板(lO)の端子(11)の表面に樹脂(12)あるい
は樹脂複合物(12)が一部形成されている。第2図の
場合は、樹脂(12)あるいは樹脂複合物(12)を点
在又は遍在させたものであり、第3図の場合は、緻密な
膜又はポーラスである。この樹脂(12)あるいは樹脂
複合物(12)が溶融半田(30)をはじくことによっ
て、半田供給板(10)の端子(11)にある半田(3
0)を基板(20)あるいは電子部品(20)の接続端
子(21)に移動し易くするのである。このような材料
としてはエポキシ樹脂、ポリイミド樹脂、フッ素樹脂、
ポリエチレン樹脂、アクリル樹脂等、有機高分子が良く
、これらを塗布したり、溶媒に溶解して浸漬した後に前
記溶媒を除去したり、前記有機高分子の粒子あるいは繊
維を分散した溶液に浸漬した後前記溶媒を除去したりし
て、半田供給板(10)の端子(11)の表面に樹脂(
12)あるいは樹脂複合物(12)の粒子を付着させる
方法がある。
To explain this with reference to FIGS. 2 and 3, a resin (12) or a resin composite (12) is partially formed on the surface of the terminal (11) of the solder supply plate (1O). In the case of FIG. 2, the resin (12) or resin composite (12) is scattered or omnipresent, and in the case of FIG. 3, it is a dense film or porous. This resin (12) or resin composite (12) repels the molten solder (30), thereby causing the solder (3) on the terminal (11) of the solder supply plate (10) to
0) to the board (20) or the connection terminal (21) of the electronic component (20). Such materials include epoxy resin, polyimide resin, fluororesin,
Organic polymers such as polyethylene resin and acrylic resin are preferable, and these can be coated, dissolved in a solvent and immersed, and then the solvent removed, or after immersed in a solution in which particles or fibers of the organic polymer are dispersed. By removing the solvent, a resin (
12) Alternatively, there is a method of attaching particles of the resin composite (12).

一方、半田供給板(lO)の端子(11)への半田(3
0)の形成方法であるが、半田ペーストの印刷、溶融半
田(30)中への浸漬、蒸着、スパッタリング、電解メ
ツキ、あるいは無電解メツキ法等の一般的な形成方法を
利用できるが、本発明の目的の如き、極めて微細な端子
(11)^、の形成方法としては、蒸着、スパッタリン
グ、電解メツキあるいは無電解メツキ法がより効果的な
方法である。
On the other hand, solder (3) to the terminal (11) of the solder supply plate (lO)
0), general forming methods such as printing of solder paste, dipping into molten solder (30), vapor deposition, sputtering, electrolytic plating, or electroless plating can be used; however, the present invention For the purpose of forming extremely fine terminals (11)^, vapor deposition, sputtering, electrolytic plating, or electroless plating are more effective methods.

なお、半田供給板(10)と基板(20)あるいは電子
部品(20)とは半田(30)の溶融のために高温で処
理されるため、精度の高い半田供給を行うには、半田供
給板(10)と基板(20)あるいは電子部品(20)
との熱膨張差ができるだけ小さい方が好ましい。例えば
、ICチップやシリコンウェハーのような物への半田供
給には、低熱膨張率のコージェライト多孔質セラミック
ーエポキシ樹脂複合基板(20)あるいは低膨張ガラス
基板(20)を使用すると良い。
Note that the solder supply plate (10) and the board (20) or electronic component (20) are processed at high temperatures to melt the solder (30), so in order to supply solder with high precision, it is necessary to (10) and board (20) or electronic component (20)
It is preferable that the difference in thermal expansion between the two is as small as possible. For example, for supplying solder to things such as IC chips and silicon wafers, it is preferable to use a cordierite porous ceramic-epoxy resin composite substrate (20) with a low coefficient of thermal expansion or a low expansion glass substrate (20).

(実施例) 次に、本発明の実施例及び比較例について説明する。(Example) Next, examples and comparative examples of the present invention will be described.

大11汁1 部品実装用の電子回路基板(20)は、コージェライト
焼結体(気孔率30%)にエポキシ樹脂を充填した熱膨
張率3.8ppm/℃のセラミックー樹脂複合基板(2
0)であり、φ0,18mmの銅製の接続端子(21)
が0.3mmピッチで184個、正方形状に配置しであ
る。この基板(20)1000 個1.:対して、前記
接続端子(21)に対向するようにφ0.07mmの銅
製の端子(11)を有する半田供給板(10)を製作し
た。この半田供給板(10)は、前記基板(20)と同
じコージェライト焼結体(気孔率30%)にエポキシ樹
脂を充填した熱膨張率3.8ppm/’Cのセラミック
ー樹脂複合基板(20)である。
Large 11 Soup 1 The electronic circuit board (20) for mounting components is a ceramic-resin composite board (2
0) and a copper connection terminal (21) with a diameter of 0.18 mm.
There are 184 pieces arranged in a square shape with a pitch of 0.3 mm. This board (20) 1000 pieces 1. On the other hand, a solder supply plate (10) having a copper terminal (11) with a diameter of 0.07 mm was manufactured so as to face the connection terminal (21). This solder supply plate (10) is a ceramic resin composite board (20) with a thermal expansion coefficient of 3.8 ppm/'C, which is made by filling the same cordierite sintered body (30% porosity) with epoxy resin as the board (20). It is.

そして、この半田供給用の端子(11)に、厚み701
’ m sφ140.czmの半田(30) (S n
 : P b=63:37)を電解メツキ法により形成
した。
Then, this solder supply terminal (11) has a thickness of 701 mm.
' m sφ140. czm solder (30) (S n
: Pb=63:37) was formed by electrolytic plating.

この半田供給板(10)を前記基板(20)の接続端子
(21)に接触させ、200℃で溶融して半田供給板(
10)を取外したところ、基板(20)の接続端子(2
1)には、高さ71μm±12μmの極めて均一な半田
(30)を形成することができた。
This solder supply plate (10) is brought into contact with the connection terminal (21) of the board (20), and the solder supply plate (10) is melted at 200°C.
10), the connecting terminal (2) of the board (20) was removed.
In 1), extremely uniform solder (30) with a height of 71 μm±12 μm could be formed.

次にこの基板(20)にφ0.15mm、高さ0. 1
mmの高融点半田(30)(Sn : Pb=5 : 
95)による接続端子(21)を有するフリップチップ
と接続させたところ、1000個中1個の接続不良も生
じなかった。
Next, this substrate (20) has a diameter of 0.15 mm and a height of 0. 1
mm high melting point solder (30) (Sn: Pb=5:
When connected to a flip chip having a connection terminal (21) according to 95), not one connection failure occurred out of 1000.

次いで、前記フリップチップを接続した基板(20)を
再度加熱してフリップチップを取外した。
Next, the substrate (20) to which the flip chip was connected was heated again to remove the flip chip.

次いで、半田供給板(10)の端子(11)に厚み50
pm、φ1.20 (t mの半田(30)(Sn:P
b:63二37)を電解メツキ法により形成し再度接触
させ、200℃で溶融して半田供給板(10)を取外し
たところ、基板(20)の接続端子(21)には高さ6
0μm±9μmの極めて均一な半田(30)を形成する
ことができ、再度新しいフリップチップを接続したとこ
ろ、1000個中1個の接続不良も生じなかった。
Next, the terminal (11) of the solder supply plate (10) is coated with a thickness of 50 mm.
pm, φ1.20 (t m solder (30) (Sn:P
b: 63237) was formed by electrolytic plating, brought into contact again, melted at 200°C, and removed the solder supply plate (10).
It was possible to form extremely uniform solder (30) of 0 μm±9 μm, and when new flip chips were connected again, not one connection failure occurred out of 1000.

笈五五遣 実施例1と同様であるが、半田供給板(10)の端子(
11)として、φ0.18mmの錫−二・ノケル(35
%)合金を用い、厚み30μm1φ210μmの半田(
30)(Sn : Pb=63 : 37)を電解メツ
キ法により形成したところ、基板(20)の接続端子(
21)には、高さ45μm±15μmの均一な半田(3
0)を形成することができた。
It is the same as Embodiment 1, but the terminals of the solder supply plate (10) (
11), φ0.18 mm tin-2 Nokel (35
%) alloy with a thickness of 30 μm and a diameter of 210 μm (
30) (Sn:Pb=63:37) was formed by electrolytic plating method, and the connecting terminal (
21), uniform solder with a height of 45 μm ± 15 μm (3
0) could be formed.

次に、前述と同様に、この基板(20)にフリ・ツブチ
ップを接続したところ、1000個中2個の断線不良を
生じたものの良好な結果であった。
Next, in the same manner as described above, when free-tube chips were connected to this substrate (20), good results were obtained, although 2 disconnections occurred out of 1000 chips.

次いで前記フリツブチ・ツブの接続した基板(20)を
再度加熱してフリツブチ・ノブを取外した。次も)で、
この半田供給板(10)の端子(11)に厚み30μm
1φ210μmの半田(30) (Sn : Pb=6
3:37)を電解メツキ法により形成し再度接触させ、
200℃で溶融して半田供給板(10)を取外したとこ
ろ、基板(20)の接続端子(21)には、高さ55μ
m±21μmの均一な半田(30)を形成することがで
き、再度新しいフリップチップを接続したところ、10
00個中1・個の接続不良も生じなかった。
Next, the substrate (20) to which the fritted knob was connected was heated again and the fritted knob was removed. next time),
The terminal (11) of this solder supply plate (10) has a thickness of 30 μm.
1φ210μm solder (30) (Sn: Pb=6
3:37) by electrolytic plating method and brought into contact again.
When the solder supply plate (10) was melted at 200°C and removed, the connection terminal (21) of the board (20) had a height of 55 μm.
It was possible to form a uniform solder (30) of m±21 μm, and when a new flip chip was connected again, 10
Not even 1 out of 00 connection failures occurred.

友五11 1Cチツプ(20)側には、φ0,08n+mの錫端子
(21)であってピッチ0.15mmで240個の二重
の正方形状に配置された接続端子(21)が形成されて
いる。半田供給板(10)の端子(11)はφ0,07
5mmであり、周囲は厚さ10μmのエポキシ樹脂(1
2)で囲んである。この端子(11)にエポキシ樹脂(
12)上の厚み65μm1φ120μmの半田(30)
(Sn:Pb=63:37)を電解メツキ法ニヨり形成
し、前記ICチップ(20)の接続端子(21)に半田
(30)を供給したところ、高さ98μm±12μm1
φ118μm±15μmの半田(30)が供給され、接
続端子(21)間のショート不良は1000個中1個も
生じなかった。
On the Yugo 11 1C chip (20) side, 240 connecting terminals (21), which are tin terminals (21) with a diameter of 0.08n+m and are arranged in a double square shape with a pitch of 0.15mm, are formed. There is. The terminal (11) of the solder supply plate (10) is φ0.07
5 mm, and the surrounding area is covered with 10 μm thick epoxy resin (1
It is surrounded by 2). This terminal (11) is filled with epoxy resin (
12) Solder on top with a thickness of 65 μm and a diameter of 120 μm (30)
(Sn:Pb=63:37) was formed by electrolytic plating method, and when solder (30) was supplied to the connection terminal (21) of the IC chip (20), the height was 98 μm ± 12 μm1.
Solder (30) with a diameter of 118 μm±15 μm was supplied, and no short-circuit failure occurred between connection terminals (21) out of 1,000.

次いで、このICチップ(20)の接続端子(21)を
基板(20)に接続したところ、断線、ショートの接続
不良は1000個中1個も生じなかった。
Next, when the connection terminals (21) of this IC chip (20) were connected to the substrate (20), no connection failures such as disconnections or shorts occurred in any of the 1000 chips.

ル」飢例づつ 実施例3の半田供給板(10)の端子(11)において
、周囲にめぐらしたエポキシ樹脂(12)を除去したも
ので、前述と同様の半田供給を行ったところ、半田(3
0)は高さ78μm±28μm1φ106μm±32μ
mとなり1000個中28個のショート不良を生じた。
The epoxy resin (12) surrounding the terminal (11) of the solder supply plate (10) of Example 3 was removed, and when the same solder supply as described above was performed, the solder ( 3
0) is height 78μm±28μm1φ106μm±32μ
28 out of 1000 short-circuit defects occurred.

次いで、ICチップ(20)を基板(20)に接続した
ところ、さらに断線不良が978個中3個生じた。
Next, when the IC chip (20) was connected to the substrate (20), 3 out of 978 disconnections occurred.

(発明の効果) 以上詳述したように、本発明に係る半田供給板は、 [電子回路基板あるいは電子部品等の接続端子に半田を
供給する半田供給板であって、前記接続端子に対応する
部分に半田供給用の端子を設けると共に、この端子の半
田付着性を前記接続端子の半田付着性よりも低くしたこ
と」をその要旨とするものである。
(Effects of the Invention) As described in detail above, the solder supply plate according to the present invention is [a solder supply plate that supplies solder to connection terminals of an electronic circuit board or electronic component, etc., which corresponds to the connection terminals] In addition to providing a terminal for supplying solder to the connecting terminal, the solder adhesion of this terminal is lower than that of the connection terminal.''

従って、この半田供給板は、基板あるいは電子部品のい
ずれの接続端子にも極めて高精度で半田の供給ができ、
しかも、取替作業に対しても安定して半田の補給を行う
ことができ、実装工程の効率化、収率の改善にきわめて
有効である。
Therefore, this solder supply plate can supply solder to any connection terminal of a board or electronic component with extremely high precision.
Moreover, it is possible to replenish solder stably even during replacement work, which is extremely effective in increasing the efficiency of the mounting process and improving the yield.

さらに、この半田供給板を利用すると、一つの基板、一
つの電子部品、あるいは一つのICチップ内に異種の半
田を供給することもできる。
Furthermore, by using this solder supply plate, different types of solder can be supplied to one board, one electronic component, or one IC chip.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(イ)〜(ハ)は本発明に係る半田供給板を使用
して電子回路基板に半田を供給する状態を示す各部分断
面図、第2図は本発明に係る半田供給板の一実施例を示
す部分断面図、第3図は他の実施例を示す部分断面図で
ある。 符 1テ の 説 明 10・・ 半田供給板、 11・・ 端子、 12・・・樹脂あるいは 樹脂複合物、 21・・・接続端子、 20・・・電子回路基板又は電子部品、30・・・半田
。 以 上
1(a) to (c) are partial cross-sectional views showing states in which solder is supplied to an electronic circuit board using the solder supply plate according to the present invention, and FIG. 2 is a partial sectional view of the solder supply plate according to the present invention. FIG. 3 is a partial sectional view showing one embodiment, and FIG. 3 is a partial sectional view showing another embodiment. Explanation of number 1 10...Solder supply plate, 11...Terminal, 12...Resin or resin composite, 21...Connection terminal, 20...Electronic circuit board or electronic component, 30...Solder . that's all

Claims (1)

【特許請求の範囲】 1)、電子回路基板あるいは電子部品等の接続端子に半
田を供給する半田供給板であって、 前記接続端子に対応する部分に半田供給用の端子を設け
ると共に、この端子の半田付着性を前記接続端子の半田
付着性よりも低くしたことを特徴とする半田供給板。 2)、前記半田供給用の端子の面積が、前記接続端子の
面積よりも小さいことを特徴とする請求項1記載の半田
供給板。 3)、前記半田供給用の端子の溶融半田に対する接触角
が、前記接続端子の溶融半田に対する接触角よりも小さ
いことを特徴とする請求項1又は2記載の半田供給板。 4)、前記半田供給用の端子に溶融半田をはじく樹脂あ
るいは樹脂複合体が一部形成されていることを特徴とす
る請求項1、2又は3記載の半田供給板。
[Scope of Claims] 1) A solder supply plate for supplying solder to connection terminals of an electronic circuit board or electronic components, comprising: a solder supply terminal provided in a portion corresponding to the connection terminal; A solder supply plate characterized in that the solder adhesion of the connecting terminal is lower than the solder adhesion of the connecting terminal. 2) The solder supply plate according to claim 1, wherein the area of the solder supply terminal is smaller than the area of the connection terminal. 3) The solder supply plate according to claim 1 or 2, wherein a contact angle of the solder supply terminal to the molten solder is smaller than a contact angle of the connection terminal to the molten solder. 4) The solder supply plate according to claim 1, wherein the solder supply terminal is partially formed with a resin or a resin composite that repels molten solder.
JP2104298A 1990-04-18 1990-04-18 Solder supply plate Expired - Lifetime JP2811112B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2104298A JP2811112B2 (en) 1990-04-18 1990-04-18 Solder supply plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2104298A JP2811112B2 (en) 1990-04-18 1990-04-18 Solder supply plate

Publications (2)

Publication Number Publication Date
JPH042139A true JPH042139A (en) 1992-01-07
JP2811112B2 JP2811112B2 (en) 1998-10-15

Family

ID=14377022

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2104298A Expired - Lifetime JP2811112B2 (en) 1990-04-18 1990-04-18 Solder supply plate

Country Status (1)

Country Link
JP (1) JP2811112B2 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150466A (en) * 1974-10-30 1976-05-04 Hitachi Ltd Handamakuno keiseihoho
JPS60101937A (en) * 1983-11-07 1985-06-06 Sony Corp Manufacture of semiconductor device
JPS6345891A (en) * 1986-08-12 1988-02-26 飯村 恵次 Carrier film and method for transcripting solder
JPS6445150A (en) * 1987-08-13 1989-02-17 Toshiba Corp Manufacture of electronic component
JPH02299288A (en) * 1989-05-12 1990-12-11 Fujitsu Ltd Mounting of solder ball

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5150466A (en) * 1974-10-30 1976-05-04 Hitachi Ltd Handamakuno keiseihoho
JPS60101937A (en) * 1983-11-07 1985-06-06 Sony Corp Manufacture of semiconductor device
JPS6345891A (en) * 1986-08-12 1988-02-26 飯村 恵次 Carrier film and method for transcripting solder
JPS6445150A (en) * 1987-08-13 1989-02-17 Toshiba Corp Manufacture of electronic component
JPH02299288A (en) * 1989-05-12 1990-12-11 Fujitsu Ltd Mounting of solder ball

Also Published As

Publication number Publication date
JP2811112B2 (en) 1998-10-15

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