JPH0424081U - - Google Patents
Info
- Publication number
- JPH0424081U JPH0424081U JP6530390U JP6530390U JPH0424081U JP H0424081 U JPH0424081 U JP H0424081U JP 6530390 U JP6530390 U JP 6530390U JP 6530390 U JP6530390 U JP 6530390U JP H0424081 U JPH0424081 U JP H0424081U
- Authority
- JP
- Japan
- Prior art keywords
- address
- synchronization
- trigger
- memory
- counter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 125000004122 cyclic group Chemical group 0.000 claims description 2
- 238000005070 sampling Methods 0.000 claims 3
- 230000001934 delay Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案の波形測定装置の構成ブロツク
図、第２図は第１図で示した波形測定装置の動作
を示すタイミングチヤート、第３図はメモリに読
み込まれるデータの内容の説明図、第４図は従来
のＬＳＩテスタによつて波形を測定する場合の説
明図である。
１……モジユールコントローラ、４……波形測
定モジユール、４２……デイレイタイマ、４４…
…サイクリツクカウンタ、４５……メモリ、４６
……アドレスラツチ、４７……ライトパルス発生
器、５０……トリガ後カウンタ。
FIG. 1 is a block diagram of the configuration of the waveform measuring device of the present invention, FIG. 2 is a timing chart showing the operation of the waveform measuring device shown in FIG. 1, and FIG. 3 is an explanatory diagram of the contents of data read into the memory. FIG. 4 is an explanatory diagram when a waveform is measured by a conventional LSI tester. 1...Module controller, 4...Waveform measurement module, 42...Delay timer, 44...
...Cyclic counter, 45...Memory, 46
... Address latch, 47 ... Write pulse generator, 50 ... Post-trigger counter.
Claims (1)
トをサンプリングクロツク信号に同期して測定す
る波形測定装置であつて、 前記ＤＵＴに与える検査信号に同期してモジユ
ール同期トリガを出力するモジユールコントロー
ラと、 前記モジユール同期トリガでイネーブルされた
後、前記モジユールコントローラで設定されたア
ドレスをサイクリツクにカウントしてメモリに出
力するサイクリツクカウンタと、 前記モジユール同期トリガを前記モジユールコ
ントローラで設定された時間遅延するデイレイタ
イマと、 このデイレイタイマで遅延して得たトリガ信号
によつて前記サイクリツクカウンタから出力され
たアドレスをラツチし、測定ポイントを前記モジ
ユールコントローラに出力するアドレスラツチと
、 前記デイレイタイマからのトリガ信号で前記サ
ンプリングクロツクをカウントし、前記モジユー
ルコントローラで設定されたカウント数で、前記
サイクリツクカウンタとメモリをデイスエイブル
するトリガ−後カウンタと、 前記サイクリツクカウンタから出力されたアド
レスと前記ＤＵＴからの出力データとが入力され
たメモリに、前記サンプリングクロツクに同期し
てライト信号を出力するライトパルス発生器とを
設け、 前記アドレスラツチでラツチしたアドレスを基
準に、任意の測定ポイントを連続してメモリから
読出して検査することができることを特徴とした
波形測定装置。[Claims for Utility Model Registration] A waveform measuring device that measures measurement points of a signal under test output from a DUT in synchronization with a sampling clock signal, the device having a module synchronization trigger in synchronization with a test signal applied to the DUT. a cyclic counter that, after being enabled by the module synchronization trigger, cyclically counts the address set in the module controller and outputs it to memory; A delay timer that delays the time set by the controller, and an address that latches the address output from the cycle counter using the trigger signal obtained by delaying with this delay timer and outputs the measurement point to the module controller. a post-trigger counter that counts the sampling clock with a trigger signal from the delay timer and disables the cycle counter and memory at a count set by the module controller; A write pulse generator that outputs a write signal in synchronization with the sampling clock is provided in a memory into which the address output from the counter and the output data from the DUT are input, and the address latched by the address latch is provided. A waveform measurement device characterized in that arbitrary measurement points can be continuously read out from a memory and inspected based on a reference.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6530390U JP2543721Y2 (en) | 1990-06-20 | 1990-06-20 | Waveform measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6530390U JP2543721Y2 (en) | 1990-06-20 | 1990-06-20 | Waveform measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0424081U true JPH0424081U (en) | 1992-02-27 |
| JP2543721Y2 JP2543721Y2 (en) | 1997-08-13 |
Family
ID=31597012
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6530390U Expired - Lifetime JP2543721Y2 (en) | 1990-06-20 | 1990-06-20 | Waveform measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2543721Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN121254047A (en) * | 2025-12-04 | 2026-01-02 | 南京宏泰半导体科技股份有限公司 | Method and equipment for scanning voltage and current turning point of chip |
-
1990
- 1990-06-20 JP JP6530390U patent/JP2543721Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN121254047A (en) * | 2025-12-04 | 2026-01-02 | 南京宏泰半导体科技股份有限公司 | Method and equipment for scanning voltage and current turning point of chip |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2543721Y2 (en) | 1997-08-13 |
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