JPH0556868B2 - - Google Patents
Info
- Publication number
- JPH0556868B2 JPH0556868B2 JP61108809A JP10880986A JPH0556868B2 JP H0556868 B2 JPH0556868 B2 JP H0556868B2 JP 61108809 A JP61108809 A JP 61108809A JP 10880986 A JP10880986 A JP 10880986A JP H0556868 B2 JPH0556868 B2 JP H0556868B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- output
- signal line
- input
- pull
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 claims description 26
- 239000004065 semiconductor Substances 0.000 claims description 15
- 238000000034 method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000002457 bidirectional effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61108809A JPS62264652A (ja) | 1986-05-12 | 1986-05-12 | 半導体集積回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61108809A JPS62264652A (ja) | 1986-05-12 | 1986-05-12 | 半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62264652A JPS62264652A (ja) | 1987-11-17 |
| JPH0556868B2 true JPH0556868B2 (de) | 1993-08-20 |
Family
ID=14494038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61108809A Granted JPS62264652A (ja) | 1986-05-12 | 1986-05-12 | 半導体集積回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62264652A (de) |
-
1986
- 1986-05-12 JP JP61108809A patent/JPS62264652A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62264652A (ja) | 1987-11-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4743841A (en) | Semiconductor integrated circuit including circuit elements evaluating the same and having means for testing the circuit elements | |
| US5012185A (en) | Semiconductor integrated circuit having I/O terminals allowing independent connection test | |
| US5239191A (en) | Semiconductor wafer | |
| EP0297821A3 (de) | Integrierte Halbleiterschaltung bestehend aus einem Gatearray und einem Speicher | |
| US5138257A (en) | Circuit for testing internal data bus of integrated circuit | |
| EP0084260A1 (de) | Integerierte Halbleiterschaltung mit Prüfschaltung | |
| JPH0224474B2 (de) | ||
| US4707654A (en) | Integrated circuit having input and output terminals for testing | |
| US6369599B1 (en) | Circuit and a method for configuring pad connections in an integrated device | |
| CA1102008A (en) | Large scale integrated circuit with external integral access test circuitry and method | |
| JPH05198637A (ja) | 半導体集積回路及びそのテスト方法 | |
| US5225774A (en) | Semiconductor integrated circuit | |
| JP3228589B2 (ja) | マルチチップモジュール | |
| JP2594541B2 (ja) | 半導体集積回路 | |
| US5406197A (en) | Apparatus for controlling test inputs of circuits on an electronic module | |
| JPH0576184B2 (de) | ||
| JPS62264652A (ja) | 半導体集積回路 | |
| JPH0758172A (ja) | 半導体装置試験用ユニバーサルバーンインボード | |
| JPH01111365A (ja) | 半導体集積回路 | |
| JPH0541429A (ja) | 半導体ｉｃウエーハおよび半導体ｉｃの製造方法 | |
| EP0803735B1 (de) | Mehrchipmodul | |
| JPH0354841A (ja) | ＢｉＣＭＯＳ半導体装置 | |
| KR20020045641A (ko) | 반도체 디바이스 | |
| JPS577136A (en) | Inspection of semiconductor device | |
| JPH05121501A (ja) | 半導体集積回路 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |