JPH0717022Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JPH0717022Y2 JPH0717022Y2 JP13027789U JP13027789U JPH0717022Y2 JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2 JP 13027789 U JP13027789 U JP 13027789U JP 13027789 U JP13027789 U JP 13027789U JP H0717022 Y2 JPH0717022 Y2 JP H0717022Y2
- Authority
- JP
- Japan
- Prior art keywords
- air
- spacing frame
- constant temperature
- temperature bath
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027789U JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13027789U JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0369236U JPH0369236U (da) | 1991-07-09 |
| JPH0717022Y2 true JPH0717022Y2 (ja) | 1995-04-19 |
Family
ID=31677862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13027789U Expired - Lifetime JPH0717022Y2 (ja) | 1989-11-08 | 1989-11-08 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0717022Y2 (da) |
-
1989
- 1989-11-08 JP JP13027789U patent/JPH0717022Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0369236U (da) | 1991-07-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |