JPS5223600A - Method for making growth single crystal of gallium nitride - Google Patents
Method for making growth single crystal of gallium nitrideInfo
- Publication number
- JPS5223600A JPS5223600A JP10083275A JP10083275A JPS5223600A JP S5223600 A JPS5223600 A JP S5223600A JP 10083275 A JP10083275 A JP 10083275A JP 10083275 A JP10083275 A JP 10083275A JP S5223600 A JPS5223600 A JP S5223600A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- gallium nitride
- growth single
- making growth
- making
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Led Devices (AREA)
Abstract
PURPOSE: To synthesize single crystal of gallium nitride which bears good electric characteristics and cohesion power to sapphire base.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50100832A JPS5815480B2 (en) | 1975-08-19 | 1975-08-19 | gallium gallium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50100832A JPS5815480B2 (en) | 1975-08-19 | 1975-08-19 | gallium gallium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5223600A true JPS5223600A (en) | 1977-02-22 |
| JPS5815480B2 JPS5815480B2 (en) | 1983-03-25 |
Family
ID=14284280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50100832A Expired JPS5815480B2 (en) | 1975-08-19 | 1975-08-19 | gallium gallium |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5815480B2 (en) |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5006908A (en) * | 1989-02-13 | 1991-04-09 | Nippon Telegraph And Telephone Corporation | Epitaxial Wurtzite growth structure for semiconductor light-emitting device |
| JPH04297023A (en) † | 1991-01-31 | 1992-10-21 | Nichia Chem Ind Ltd | Crystal growth method of gallium nitride compound semiconductor |
| JPH06196757A (en) * | 1992-06-10 | 1994-07-15 | Nichia Chem Ind Ltd | Method of growing indium gallium nitride semiconductor |
| JP2003510233A (en) * | 2000-01-26 | 2003-03-18 | カーベーアー−ジオリ ソシエテ アノニム | Apparatus and method for paper sheet detection |
| JP2004508268A (en) * | 2000-09-06 | 2004-03-18 | シービーエル テクノロジーズ インコーポレーテッド | Method of forming a defect-free, crack-free epitaxial film on a mismatched substrate |
| US6939730B2 (en) | 2001-04-24 | 2005-09-06 | Sony Corporation | Nitride semiconductor, semiconductor device, and method of manufacturing the same |
| JP2009021619A (en) * | 1991-03-18 | 2009-01-29 | Trustees Of Boston Univ | Method for producing semiconductor device by exposing sapphire substrate to active nitrogen and semiconductor device |
| JP2009234800A (en) * | 2008-03-25 | 2009-10-15 | Osaka Univ | Production method of group iii element nitride crystal, and group iii element nitride crystal obtained by the method |
| WO2015053341A1 (en) | 2013-10-09 | 2015-04-16 | 国立大学法人大阪大学 | Method for producing group iii nitride crystal, group iii nitride crystal, semiconductor device and apparatus for producing group iii nitride crystal |
| KR20160130396A (en) | 2014-03-03 | 2016-11-11 | 고꾸리쯔 다이가꾸 호우징 오사까 다이가꾸 | Process for producing group iii nitride crystal and apparatus for producing group iii nitride crystal |
| US10011921B2 (en) | 2014-10-29 | 2018-07-03 | Osaka University | Method for producing group III element nitride crystal, group III element nitride crystal, semiconductor device, method for producing semiconductor device, and group III element nitride crystal production device |
| US10266965B2 (en) | 2014-03-03 | 2019-04-23 | Osaka University | Method for producing group-III nitride crystal, group-III nitride crystal, semiconductor device, and device for producing group-III nitride crystal |
| US11186922B2 (en) | 2019-06-06 | 2021-11-30 | Panasonic Corporation | Apparatus for producing Group-III nitride semiconductor crystal including nitrogen source nozzles with different spray directions |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5631320A (en) * | 1979-08-22 | 1981-03-30 | Mitsubishi Electric Corp | Grounddfault current detector |
-
1975
- 1975-08-19 JP JP50100832A patent/JPS5815480B2/en not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5631320A (en) * | 1979-08-22 | 1981-03-30 | Mitsubishi Electric Corp | Grounddfault current detector |
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5006908A (en) * | 1989-02-13 | 1991-04-09 | Nippon Telegraph And Telephone Corporation | Epitaxial Wurtzite growth structure for semiconductor light-emitting device |
| JPH04297023A (en) † | 1991-01-31 | 1992-10-21 | Nichia Chem Ind Ltd | Crystal growth method of gallium nitride compound semiconductor |
| JP2009021619A (en) * | 1991-03-18 | 2009-01-29 | Trustees Of Boston Univ | Method for producing semiconductor device by exposing sapphire substrate to active nitrogen and semiconductor device |
| JP2010093271A (en) * | 1991-03-18 | 2010-04-22 | Trustees Of Boston Univ | Method of making semiconductor device with exposure of sapphire substrate to activated nitrogen, and semiconductor device |
| JPH06196757A (en) * | 1992-06-10 | 1994-07-15 | Nichia Chem Ind Ltd | Method of growing indium gallium nitride semiconductor |
| JP2003510233A (en) * | 2000-01-26 | 2003-03-18 | カーベーアー−ジオリ ソシエテ アノニム | Apparatus and method for paper sheet detection |
| JP2004508268A (en) * | 2000-09-06 | 2004-03-18 | シービーエル テクノロジーズ インコーポレーテッド | Method of forming a defect-free, crack-free epitaxial film on a mismatched substrate |
| US6939730B2 (en) | 2001-04-24 | 2005-09-06 | Sony Corporation | Nitride semiconductor, semiconductor device, and method of manufacturing the same |
| US7282379B2 (en) | 2001-04-24 | 2007-10-16 | Sony Corporation | Nitride semiconductor, semiconductor device, and method of manufacturing the same |
| US6972206B2 (en) | 2001-04-24 | 2005-12-06 | Sony Corporation | Nitride semiconductor, semiconductor device, and method of manufacturing the same |
| JP2009234800A (en) * | 2008-03-25 | 2009-10-15 | Osaka Univ | Production method of group iii element nitride crystal, and group iii element nitride crystal obtained by the method |
| WO2015053341A1 (en) | 2013-10-09 | 2015-04-16 | 国立大学法人大阪大学 | Method for producing group iii nitride crystal, group iii nitride crystal, semiconductor device and apparatus for producing group iii nitride crystal |
| US10026612B2 (en) | 2013-10-09 | 2018-07-17 | Osaka University | Method for producing group III nitride crystal, group III nitride crystal, semiconductor device and apparatus for producing group III nitride crystal |
| KR20160130396A (en) | 2014-03-03 | 2016-11-11 | 고꾸리쯔 다이가꾸 호우징 오사까 다이가꾸 | Process for producing group iii nitride crystal and apparatus for producing group iii nitride crystal |
| CN106460228A (en) * | 2014-03-03 | 2017-02-22 | 国立大学法人大阪大学 | Process for producing group iii nitride crystal and apparatus for producing group iii nitride crystal |
| US10202710B2 (en) | 2014-03-03 | 2019-02-12 | Osaka University | Process for producing group III nitride crystal and apparatus for producing group III nitride crystal |
| US10266965B2 (en) | 2014-03-03 | 2019-04-23 | Osaka University | Method for producing group-III nitride crystal, group-III nitride crystal, semiconductor device, and device for producing group-III nitride crystal |
| CN106460228B (en) * | 2014-03-03 | 2019-04-26 | 国立大学法人大阪大学 | Method for producing group III nitride crystal and device for producing group III nitride crystal |
| US10011921B2 (en) | 2014-10-29 | 2018-07-03 | Osaka University | Method for producing group III element nitride crystal, group III element nitride crystal, semiconductor device, method for producing semiconductor device, and group III element nitride crystal production device |
| US11186922B2 (en) | 2019-06-06 | 2021-11-30 | Panasonic Corporation | Apparatus for producing Group-III nitride semiconductor crystal including nitrogen source nozzles with different spray directions |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5815480B2 (en) | 1983-03-25 |
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