JPS5378180A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5378180A JPS5378180A JP15337276A JP15337276A JPS5378180A JP S5378180 A JPS5378180 A JP S5378180A JP 15337276 A JP15337276 A JP 15337276A JP 15337276 A JP15337276 A JP 15337276A JP S5378180 A JPS5378180 A JP S5378180A
- Authority
- JP
- Japan
- Prior art keywords
- manufacture
- semiconductor device
- impurity
- diffusion coefficient
- junction boundary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: For the easing of the electric field at a junction boundary, the insulating film containing the impurity of a large diffusion coefficient in addition to the impurity of a small diffusion coefficient is used for covering and diffusing the junction boundary via the oxidized film between thin films, thereby improving the dielectric strength.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15337276A JPS5378180A (en) | 1976-12-22 | 1976-12-22 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15337276A JPS5378180A (en) | 1976-12-22 | 1976-12-22 | Manufacture of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5378180A true JPS5378180A (en) | 1978-07-11 |
Family
ID=15561006
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15337276A Pending JPS5378180A (en) | 1976-12-22 | 1976-12-22 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5378180A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58118153A (en) * | 1982-01-07 | 1983-07-14 | Seiko Epson Corp | Manufacturing method of semiconductor device |
| JPS5961071A (en) * | 1982-08-30 | 1984-04-07 | テキサス・インスツルメンツ・インコ−ポレイテツド | Insulated gate field effect transistor and method of produc-ing same |
| US4878100A (en) * | 1988-01-19 | 1989-10-31 | Texas Instruments Incorporated | Triple-implanted drain in transistor made by oxide sidewall-spacer method |
-
1976
- 1976-12-22 JP JP15337276A patent/JPS5378180A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58118153A (en) * | 1982-01-07 | 1983-07-14 | Seiko Epson Corp | Manufacturing method of semiconductor device |
| JPS5961071A (en) * | 1982-08-30 | 1984-04-07 | テキサス・インスツルメンツ・インコ−ポレイテツド | Insulated gate field effect transistor and method of produc-ing same |
| US4878100A (en) * | 1988-01-19 | 1989-10-31 | Texas Instruments Incorporated | Triple-implanted drain in transistor made by oxide sidewall-spacer method |
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