JPS558084A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS558084A JPS558084A JP8131478A JP8131478A JPS558084A JP S558084 A JPS558084 A JP S558084A JP 8131478 A JP8131478 A JP 8131478A JP 8131478 A JP8131478 A JP 8131478A JP S558084 A JPS558084 A JP S558084A
- Authority
- JP
- Japan
- Prior art keywords
- hole
- protracted
- electrode
- established
- insulating film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
Landscapes
- Wire Bonding (AREA)
Abstract
PURPOSE: To give no influence to a hole by heat pressure when touching by making no section touched to the protracted electrode of semiconductor element of a protracted head wire terminal on the upper hole of the protected and insulating film hole of the element.
CONSTITUTION: An insulating film 12 is set up at a semiconductor plate 11 and on the film is set up an internal wiring layer 13 which is covered by a protected and insulating film 14 to be established. In this film is set up a hole 15 through which a metal layer 16 and a protracted electrode 17 are established being adjacent to the internal wiring layer 13. On the other hand, a protracted terminal 20 is established at a section to be touched to the protracted electrode 17 of the semiconductor element at a pointed head and is designed to make a dented section in a form of a circular better near the center of this terminal 20 at the hole 15 below the elements electrode 17 in order not to put a direct pressure on the hole 15. As a result, a crack doesn't into the metal layer 16 and a metal to metal compound of electrodes 17 and 18 is not formed tu improve reliability.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8131478A JPS558084A (en) | 1978-07-03 | 1978-07-03 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8131478A JPS558084A (en) | 1978-07-03 | 1978-07-03 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS558084A true JPS558084A (en) | 1980-01-21 |
Family
ID=13742924
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8131478A Pending JPS558084A (en) | 1978-07-03 | 1978-07-03 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS558084A (en) |
-
1978
- 1978-07-03 JP JP8131478A patent/JPS558084A/en active Pending
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