JPS5687362A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5687362A JPS5687362A JP16348979A JP16348979A JPS5687362A JP S5687362 A JPS5687362 A JP S5687362A JP 16348979 A JP16348979 A JP 16348979A JP 16348979 A JP16348979 A JP 16348979A JP S5687362 A JPS5687362 A JP S5687362A
- Authority
- JP
- Japan
- Prior art keywords
- film
- region
- field region
- gate
- oxidation film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
- H10W10/011—Manufacture or treatment of isolation regions comprising dielectric materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/10—Isolation regions comprising dielectric materials
Landscapes
- Local Oxidation Of Silicon (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To reduce the width of the field region of the subject semiconductor device by a method wherein the oxidation film, containing the impurities of the same conductive type as the substrate, is formed on the substrate corresponding to the field region and then a gate oxidation film is formed, while a high-density region is formed in self-matching manner by the heat treatment being performed when said oxidation film was formed. CONSTITUTION:On the P<-> substrate 9, an SiO2 film 10, including P type impurities such as boron and the like, is formed and then the film 10 is removed leaving the field region 3'. Then a gate oxidation film is grown. The boron contained in the SiO2 film 10 is diffused in self-matching by the heat treatment performed when growing the film 11 and a P<+> region 12 is formed. Using the region 12 as the field region, an MOSFETTr1, having a gate 15, a source, drains 13 and 14, and an MOSFETTr2, having a gate 15', a source, drains 13' and 14', are formed. These field regions are formed by leaving the resist, so the width of the field region can be reduced considerably.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16348979A JPS5687362A (en) | 1979-12-18 | 1979-12-18 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16348979A JPS5687362A (en) | 1979-12-18 | 1979-12-18 | Manufacture of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5687362A true JPS5687362A (en) | 1981-07-15 |
Family
ID=15774828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16348979A Pending JPS5687362A (en) | 1979-12-18 | 1979-12-18 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5687362A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58169977A (en) * | 1982-03-30 | 1983-10-06 | Canon Inc | Manufacture of thin film transistor |
| JPS63108745A (en) * | 1986-10-27 | 1988-05-13 | Nec Corp | Mos type semiconductor device |
-
1979
- 1979-12-18 JP JP16348979A patent/JPS5687362A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58169977A (en) * | 1982-03-30 | 1983-10-06 | Canon Inc | Manufacture of thin film transistor |
| JPS63108745A (en) * | 1986-10-27 | 1988-05-13 | Nec Corp | Mos type semiconductor device |
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