JPS634173B2 - - Google Patents

Info

Publication number
JPS634173B2
JPS634173B2 JP57019581A JP1958182A JPS634173B2 JP S634173 B2 JPS634173 B2 JP S634173B2 JP 57019581 A JP57019581 A JP 57019581A JP 1958182 A JP1958182 A JP 1958182A JP S634173 B2 JPS634173 B2 JP S634173B2
Authority
JP
Japan
Prior art keywords
film
metal
oxide
photomask
missing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57019581A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58138028A (ja
Inventor
Katsuro Mizukoshi
Mikio Ppongo
Takeoki Myauchi
Masaaki Okunaka
Masao Mitani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57019581A priority Critical patent/JPS58138028A/ja
Publication of JPS58138028A publication Critical patent/JPS58138028A/ja
Publication of JPS634173B2 publication Critical patent/JPS634173B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
    • G03F1/48Protective coatings

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
JP57019581A 1982-02-12 1982-02-12 フオトマスクの欠陥修正方法 Granted JPS58138028A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57019581A JPS58138028A (ja) 1982-02-12 1982-02-12 フオトマスクの欠陥修正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57019581A JPS58138028A (ja) 1982-02-12 1982-02-12 フオトマスクの欠陥修正方法

Publications (2)

Publication Number Publication Date
JPS58138028A JPS58138028A (ja) 1983-08-16
JPS634173B2 true JPS634173B2 (fr) 1988-01-27

Family

ID=12003226

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57019581A Granted JPS58138028A (ja) 1982-02-12 1982-02-12 フオトマスクの欠陥修正方法

Country Status (1)

Country Link
JP (1) JPS58138028A (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2803259B2 (ja) * 1989-12-12 1998-09-24 三菱電機株式会社 マスクのパターン欠け欠陥の修正方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51139267A (en) * 1975-05-28 1976-12-01 Hitachi Ltd Photo-mask
JPS5579447A (en) * 1978-12-09 1980-06-14 Dainippon Printing Co Ltd Photomask substrate and photomask
JPS55161240A (en) * 1979-06-04 1980-12-15 Dainippon Printing Co Ltd Photomask
JPS5694350A (en) * 1979-12-28 1981-07-30 Hitachi Ltd Method for correcting white spot defect of photomask

Also Published As

Publication number Publication date
JPS58138028A (ja) 1983-08-16

Similar Documents

Publication Publication Date Title
JPS58203443A (ja) ホトマスクの白点欠陥修正用組成物
JPS6161670B2 (fr)
US4636403A (en) Method of repairing a defective photomask
US7195846B2 (en) Methods of manufacturing photomask blank and photomask
JPS634173B2 (fr)
JPS60192903A (ja) カラ−フイルタ−
JPS6322575B2 (fr)
JPS5912438A (ja) フオトマスクの欠落欠陥修正方法
JP2007088187A (ja) レジストパターンの形成方法およびその利用
JPS62210467A (ja) レジスト塗布方法
JPS5884964A (ja) 絶縁体上へのパタ−ンメツキ製造方法
JPS617839A (ja) ハ−ドマスク修正法
JP7495752B2 (ja) パターン欠陥の修復が容易なフォトマスクの製造方法及びこれを用いて製造したフォトマスク
JP3252236B2 (ja) 位相シフトマスクの製造方法および位相シフトマスク用ブランクスの製造方法
JPH0519265A (ja) 液晶配向膜の形成方法
JPS6159506B2 (fr)
JPS6140102B2 (fr)
JPH01102567A (ja) 露光マスクの製造方法
JP3232853B2 (ja) レーザ加工用誘電体マスクとその製造方法
JPH05224015A (ja) カラーフィルターの製造方法
JPS6024933B2 (ja) 電子線感応性無機レジスト
JPH0566411A (ja) 透明導電性フイルムおよび透明導電性フイルムの製造方法
DE102024139814A1 (de) Blindmaske und verfahren zum herstellen derselben
JPS6366556A (ja) フオトマスクの修正方法
JPS6262336B2 (fr)