SG137831A1 - Workpiece processing device - Google Patents
Workpiece processing deviceInfo
- Publication number
- SG137831A1 SG137831A1 SG200703938-1A SG2007039381A SG137831A1 SG 137831 A1 SG137831 A1 SG 137831A1 SG 2007039381 A SG2007039381 A SG 2007039381A SG 137831 A1 SG137831 A1 SG 137831A1
- Authority
- SG
- Singapore
- Prior art keywords
- workpiece
- bar code
- adhering
- peeling
- protection film
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0442—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0618—Apparatus for monitoring, sorting, marking, testing or measuring using identification means, e.g. labels on substrates or labels on containers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/976—Temporary protective layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1105—Delaminating process responsive to feed or shape at delamination
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1906—Delaminating means responsive to feed or shape at delamination
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1978—Delaminating bending means
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006155921A JP4693696B2 (ja) | 2006-06-05 | 2006-06-05 | ワーク処理装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG137831A1 true SG137831A1 (en) | 2007-12-28 |
Family
ID=38327061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200703938-1A SG137831A1 (en) | 2006-06-05 | 2007-05-30 | Workpiece processing device |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7490650B2 (fr) |
| EP (1) | EP1865535A3 (fr) |
| JP (1) | JP4693696B2 (fr) |
| KR (1) | KR100861424B1 (fr) |
| SG (1) | SG137831A1 (fr) |
| TW (1) | TWI337759B (fr) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4841262B2 (ja) * | 2006-02-13 | 2011-12-21 | 株式会社東京精密 | ウェーハ処理装置 |
| TW201015652A (en) * | 2008-10-07 | 2010-04-16 | Asia Ic Mic Process Inc | Separating device and method |
| JP5957220B2 (ja) * | 2011-12-20 | 2016-07-27 | 株式会社ディスコ | 板状ワークの割れ判断方法 |
| WO2016046952A1 (fr) * | 2014-09-26 | 2016-03-31 | 富士機械製造株式会社 | Appareil de transfert de plaquette |
| JP6427131B2 (ja) | 2016-03-18 | 2018-11-21 | 株式会社荏原製作所 | 研磨装置および研磨方法 |
| JP6692577B2 (ja) * | 2016-06-24 | 2020-05-13 | 株式会社ディスコ | ウェーハの加工方法 |
| JP6842352B2 (ja) * | 2017-04-25 | 2021-03-17 | 株式会社ディスコ | バーコードシールの保護方法 |
| JP6858452B2 (ja) * | 2017-06-23 | 2021-04-14 | 株式会社ディスコ | 識別マーク付きウェーハ治具 |
| WO2019013022A1 (fr) * | 2017-07-12 | 2019-01-17 | 東京エレクトロン株式会社 | Dispositif de transport, système de traitement de substrat, procédé de transport et procédé de traitement de substrat |
| KR102941184B1 (ko) * | 2017-08-28 | 2026-03-19 | 린텍 가부시키가이샤 | 마운트 장치 및 마운트 방법 |
| JP7379234B2 (ja) * | 2020-03-24 | 2023-11-14 | リンテック株式会社 | シート剥離装置およびシート剥離方法 |
| JP7754679B2 (ja) * | 2021-10-19 | 2025-10-15 | 株式会社ディスコ | 加工装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5118369A (en) * | 1990-08-23 | 1992-06-02 | Colorcode Unlimited Corporation | Microlabelling system and process for making microlabels |
| US20010010972A1 (en) * | 1998-09-03 | 2001-08-02 | Robinson Karl M. | Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes |
| US20040074607A1 (en) * | 2002-10-11 | 2004-04-22 | Lintec Corporation | Laminating apparatus |
| EP1310432B1 (fr) * | 2001-11-07 | 2006-02-08 | LINTEC Corporation | Dispositif de lamination pour disques optiques |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60100450A (ja) * | 1983-11-07 | 1985-06-04 | Disco Abrasive Sys Ltd | 半導体ウエーハ装着及び切断装置 |
| JPS628966A (ja) | 1985-07-05 | 1987-01-16 | Nitto Electric Ind Co Ltd | ウエハとリングフレ−ムの貼り合せ方法ならびに装置 |
| JPH097977A (ja) * | 1995-06-26 | 1997-01-10 | Disco Abrasive Syst Ltd | ダイシング装置及びダイシングシステム |
| JP3171148B2 (ja) | 1997-09-01 | 2001-05-28 | 日本電気株式会社 | ウエハ−マウント装置 |
| JP3888754B2 (ja) * | 1997-12-08 | 2007-03-07 | 日東電工株式会社 | 半導体ウエハの自動貼付け装置 |
| JP3560823B2 (ja) | 1998-08-18 | 2004-09-02 | リンテック株式会社 | ウェハ転写装置 |
| KR20020026668A (ko) * | 2000-10-02 | 2002-04-12 | 윤종용 | 반도체 웨이퍼 라벨링 방법 |
| JP2002343756A (ja) | 2001-05-21 | 2002-11-29 | Tokyo Seimitsu Co Ltd | ウェーハ平面加工装置 |
| JP4748901B2 (ja) * | 2001-09-06 | 2011-08-17 | 日東電工株式会社 | 半導体ウエハのマウント方法およびこれに用いるカセット |
| JP4201564B2 (ja) * | 2001-12-03 | 2008-12-24 | 日東電工株式会社 | 半導体ウエハ搬送方法およびこれを用いた半導体ウエハ搬送装置 |
| JP2004363165A (ja) * | 2003-06-02 | 2004-12-24 | Tokyo Seimitsu Co Ltd | ウェーハ処理装置およびウェーハ処理方法 |
| DE602004000739T2 (de) * | 2003-07-15 | 2006-11-16 | Tokyo Seimitsu Co. Ltd., Mitaka | Verfahren und Vorrichtung zum Berechnen einer Lichtmenge |
| JP4485248B2 (ja) | 2004-04-28 | 2010-06-16 | リンテック株式会社 | 剥離装置及び剥離方法 |
| JP2006035159A (ja) | 2004-07-29 | 2006-02-09 | Japan Organo Co Ltd | 電気化学的水処理方法および装置 |
| JP2006100728A (ja) * | 2004-09-30 | 2006-04-13 | Nitto Denko Corp | 保護テープ剥離方法およびこれを用いた装置 |
| JP4326519B2 (ja) * | 2005-03-31 | 2009-09-09 | 日東電工株式会社 | 保護テープ剥離方法およびこれを用いた装置 |
| JP4541237B2 (ja) * | 2005-06-29 | 2010-09-08 | リンテック株式会社 | 半導体ウエハ処理テープ巻装体およびそれを用いた半導体ウエハ処理テープ貼着装置ならびに半導体ウエハ加工処理装置 |
| JP4841262B2 (ja) | 2006-02-13 | 2011-12-21 | 株式会社東京精密 | ウェーハ処理装置 |
-
2006
- 2006-06-05 JP JP2006155921A patent/JP4693696B2/ja not_active Expired - Lifetime
-
2007
- 2007-05-22 US US11/752,146 patent/US7490650B2/en active Active
- 2007-05-22 TW TW096118215A patent/TWI337759B/zh not_active IP Right Cessation
- 2007-05-29 EP EP07109098A patent/EP1865535A3/fr not_active Withdrawn
- 2007-05-30 SG SG200703938-1A patent/SG137831A1/en unknown
- 2007-06-04 KR KR1020070054635A patent/KR100861424B1/ko not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5118369A (en) * | 1990-08-23 | 1992-06-02 | Colorcode Unlimited Corporation | Microlabelling system and process for making microlabels |
| US20010010972A1 (en) * | 1998-09-03 | 2001-08-02 | Robinson Karl M. | Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes |
| EP1310432B1 (fr) * | 2001-11-07 | 2006-02-08 | LINTEC Corporation | Dispositif de lamination pour disques optiques |
| US20040074607A1 (en) * | 2002-10-11 | 2004-04-22 | Lintec Corporation | Laminating apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070116560A (ko) | 2007-12-10 |
| EP1865535A2 (fr) | 2007-12-12 |
| JP2007324516A (ja) | 2007-12-13 |
| JP4693696B2 (ja) | 2011-06-01 |
| TWI337759B (en) | 2011-02-21 |
| KR100861424B1 (ko) | 2008-10-07 |
| US20070277934A1 (en) | 2007-12-06 |
| US7490650B2 (en) | 2009-02-17 |
| TW200807535A (en) | 2008-02-01 |
| EP1865535A3 (fr) | 2009-08-12 |
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