ATE281909T1 - Vorrichtung und verfahren zum spalten - Google Patents
Vorrichtung und verfahren zum spaltenInfo
- Publication number
- ATE281909T1 ATE281909T1 AT98310462T AT98310462T ATE281909T1 AT E281909 T1 ATE281909 T1 AT E281909T1 AT 98310462 T AT98310462 T AT 98310462T AT 98310462 T AT98310462 T AT 98310462T AT E281909 T1 ATE281909 T1 AT E281909T1
- Authority
- AT
- Austria
- Prior art keywords
- bonded substrate
- substrate stack
- porous layer
- stack
- jet
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26F—PERFORATING; PUNCHING; CUTTING-OUT; STAMPING-OUT; SEVERING BY MEANS OTHER THAN CUTTING
- B26F3/00—Severing by means other than cutting; Apparatus therefor
- B26F3/004—Severing by means other than cutting; Apparatus therefor by means of a fluid jet
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
- H10P72/7432—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used in a transfer process involving transfer directly from an origin substrate to a target substrate without use of an intermediate handle substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/934—Apparatus having delaminating means adapted for delaminating a specified article
- Y10S156/941—Means for delaminating semiconductive product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1126—Using direct fluid current against work during delaminating
- Y10T156/1137—Using air blast directly against work during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1933—Spraying delaminating means [e.g., atomizer, etc.
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1928—Differential fluid pressure delaminating means
- Y10T156/1933—Spraying delaminating means [e.g., atomizer, etc.
- Y10T156/1939—Air blasting delaminating means]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49815—Disassembling
- Y10T29/49821—Disassembling by altering or destroying work part or connector
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T83/00—Cutting
- Y10T83/364—By fluid blast and/or suction
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Forests & Forestry (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP36101297A JPH11195568A (ja) | 1997-12-26 | 1997-12-26 | 試料の分離装置及びその方法並びに基板の製造方法 |
| JP36101697A JPH11195563A (ja) | 1997-12-26 | 1997-12-26 | 試料の分離装置及びその方法並びに基板の製造方法 |
| JP4530898A JPH11243040A (ja) | 1998-02-26 | 1998-02-26 | 試料の分離装置及び分離方法並びに基板の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE281909T1 true ATE281909T1 (de) | 2004-11-15 |
Family
ID=27292180
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT98310462T ATE281909T1 (de) | 1997-12-26 | 1998-12-18 | Vorrichtung und verfahren zum spalten |
Country Status (8)
| Country | Link |
|---|---|
| US (3) | US6418999B1 (de) |
| EP (1) | EP0925888B1 (de) |
| KR (1) | KR100366722B1 (de) |
| AT (1) | ATE281909T1 (de) |
| AU (1) | AU717785B2 (de) |
| DE (1) | DE69827459T2 (de) |
| SG (2) | SG70141A1 (de) |
| TW (1) | TW429464B (de) |
Families Citing this family (56)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SG68035A1 (en) | 1997-03-27 | 1999-10-19 | Canon Kk | Method and apparatus for separating composite member using fluid |
| FR2773261B1 (fr) | 1997-12-30 | 2000-01-28 | Commissariat Energie Atomique | Procede pour le transfert d'un film mince comportant une etape de creation d'inclusions |
| TW484184B (en) * | 1998-11-06 | 2002-04-21 | Canon Kk | Sample separating apparatus and method, and substrate manufacturing method |
| JP2000150836A (ja) | 1998-11-06 | 2000-05-30 | Canon Inc | 試料の処理システム |
| US6672358B2 (en) | 1998-11-06 | 2004-01-06 | Canon Kabushiki Kaisha | Sample processing system |
| FR2796491B1 (fr) * | 1999-07-12 | 2001-08-31 | Commissariat Energie Atomique | Procede de decollement de deux elements et dispositif pour sa mise en oeuvre |
| EP1107295A3 (de) | 1999-12-08 | 2005-04-13 | Canon Kabushiki Kaisha | Trennverfahren für ein Verbundbauteil, Herstellungsverfahren für Dünnfilm, Vorrichtung zur Trennung eines Verbundbauteils |
| FR2802340B1 (fr) * | 1999-12-13 | 2003-09-05 | Commissariat Energie Atomique | Structure comportant des cellules photovoltaiques et procede de realisation |
| JP2003531492A (ja) | 2000-04-14 | 2003-10-21 | エス オー イ テク シリコン オン インシュレータ テクノロジース | 特に半導体材料製の基板又はインゴットから少なくとも一枚の薄層を切り出す方法 |
| JP3580227B2 (ja) * | 2000-06-21 | 2004-10-20 | 三菱住友シリコン株式会社 | 複合基板の分離方法及び分離装置 |
| FR2811807B1 (fr) | 2000-07-12 | 2003-07-04 | Commissariat Energie Atomique | Procede de decoupage d'un bloc de materiau et de formation d'un film mince |
| JP2002075917A (ja) * | 2000-08-25 | 2002-03-15 | Canon Inc | 試料の分離装置及び分離方法 |
| US6491083B2 (en) * | 2001-02-06 | 2002-12-10 | Anadigics, Inc. | Wafer demount receptacle for separation of thinned wafer from mounting carrier |
| FR2823373B1 (fr) * | 2001-04-10 | 2005-02-04 | Soitec Silicon On Insulator | Dispositif de coupe de couche d'un substrat, et procede associe |
| JP2002353081A (ja) * | 2001-05-25 | 2002-12-06 | Canon Inc | 板部材の分離装置及び分離方法 |
| JP2002353423A (ja) * | 2001-05-25 | 2002-12-06 | Canon Inc | 板部材の分離装置及び処理方法 |
| FR2830983B1 (fr) | 2001-10-11 | 2004-05-14 | Commissariat Energie Atomique | Procede de fabrication de couches minces contenant des microcomposants |
| FR2834381B1 (fr) * | 2002-01-03 | 2004-02-27 | Soitec Silicon On Insulator | Dispositif de coupe de couche d'un substrat, et procede associe |
| FR2834380B1 (fr) * | 2002-01-03 | 2005-02-18 | Soitec Silicon On Insulator | Dispositif de coupe de couche d'un substrat, et procede associe |
| US7176108B2 (en) | 2002-11-07 | 2007-02-13 | Soitec Silicon On Insulator | Method of detaching a thin film at moderate temperature after co-implantation |
| US7187162B2 (en) * | 2002-12-16 | 2007-03-06 | S.O.I.Tec Silicon On Insulator Technologies S.A. | Tools and methods for disuniting semiconductor wafers |
| FR2859312B1 (fr) * | 2003-09-02 | 2006-02-17 | Soitec Silicon On Insulator | Scellement metallique multifonction |
| FR2861497B1 (fr) | 2003-10-28 | 2006-02-10 | Soitec Silicon On Insulator | Procede de transfert catastrophique d'une couche fine apres co-implantation |
| US7772087B2 (en) | 2003-12-19 | 2010-08-10 | Commissariat A L'energie Atomique | Method of catastrophic transfer of a thin film after co-implantation |
| US7672558B2 (en) * | 2004-01-12 | 2010-03-02 | Honeywell International, Inc. | Silicon optical device |
| US7149388B2 (en) * | 2004-03-18 | 2006-12-12 | Honeywell International, Inc. | Low loss contact structures for silicon based optical modulators and methods of manufacture |
| US7177489B2 (en) * | 2004-03-18 | 2007-02-13 | Honeywell International, Inc. | Silicon-insulator-silicon thin-film structures for optical modulators and methods of manufacture |
| US7217584B2 (en) * | 2004-03-18 | 2007-05-15 | Honeywell International Inc. | Bonded thin-film structures for optical modulators and methods of manufacture |
| US20050214989A1 (en) * | 2004-03-29 | 2005-09-29 | Honeywell International Inc. | Silicon optoelectronic device |
| US9040420B2 (en) * | 2005-03-01 | 2015-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device including peeling layers from substrates by etching |
| FR2886051B1 (fr) | 2005-05-20 | 2007-08-10 | Commissariat Energie Atomique | Procede de detachement d'un film mince |
| FR2889887B1 (fr) | 2005-08-16 | 2007-11-09 | Commissariat Energie Atomique | Procede de report d'une couche mince sur un support |
| FR2891281B1 (fr) | 2005-09-28 | 2007-12-28 | Commissariat Energie Atomique | Procede de fabrication d'un element en couches minces. |
| US20070101927A1 (en) * | 2005-11-10 | 2007-05-10 | Honeywell International Inc. | Silicon based optical waveguide structures and methods of manufacture |
| US7362443B2 (en) | 2005-11-17 | 2008-04-22 | Honeywell International Inc. | Optical gyro with free space resonator and method for sensing inertial rotation rate |
| KR100898793B1 (ko) * | 2005-12-29 | 2009-05-20 | 엘지디스플레이 주식회사 | 액정표시소자용 기판 합착 장치 |
| FR2899378B1 (fr) | 2006-03-29 | 2008-06-27 | Commissariat Energie Atomique | Procede de detachement d'un film mince par fusion de precipites |
| US7463360B2 (en) * | 2006-04-18 | 2008-12-09 | Honeywell International Inc. | Optical resonator gyro with integrated external cavity beam generator |
| US7454102B2 (en) | 2006-04-26 | 2008-11-18 | Honeywell International Inc. | Optical coupling structure |
| US20070274655A1 (en) * | 2006-04-26 | 2007-11-29 | Honeywell International Inc. | Low-loss optical device structure |
| US7535576B2 (en) * | 2006-05-15 | 2009-05-19 | Honeywell International, Inc. | Integrated optical rotation sensor and method for sensing rotation rate |
| DE102006056339A1 (de) * | 2006-11-29 | 2008-09-11 | Bernhard Brain | Vorrichtung zum Trennen von zwei aufeinander angeordneten scheibenförmigen Elementen bei der Entnahme |
| FR2910179B1 (fr) | 2006-12-19 | 2009-03-13 | Commissariat Energie Atomique | PROCEDE DE FABRICATION DE COUCHES MINCES DE GaN PAR IMPLANTATION ET RECYCLAGE D'UN SUBSTRAT DE DEPART |
| KR20090104839A (ko) * | 2007-01-18 | 2009-10-06 | 실리콘 제너시스 코포레이션 | 기판의 제어된 클리빙 처리 및 클리빙 장치 |
| US20090139655A1 (en) * | 2007-11-30 | 2009-06-04 | Xiang Yang Feng | Adhesive seal peeling device for a hard disk drive |
| FR2925221B1 (fr) | 2007-12-17 | 2010-02-19 | Commissariat Energie Atomique | Procede de transfert d'une couche mince |
| US20090254016A1 (en) * | 2008-04-08 | 2009-10-08 | Max Joseph Wallack | Method and apparatus for cushioning wrists |
| FR2947098A1 (fr) | 2009-06-18 | 2010-12-24 | Commissariat Energie Atomique | Procede de transfert d'une couche mince sur un substrat cible ayant un coefficient de dilatation thermique different de celui de la couche mince |
| JP2013033925A (ja) * | 2011-07-01 | 2013-02-14 | Tokyo Electron Ltd | 洗浄方法、プログラム、コンピュータ記憶媒体、洗浄装置及び剥離システム |
| US8945344B2 (en) * | 2012-07-20 | 2015-02-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Systems and methods of separating bonded wafers |
| JP6016108B2 (ja) * | 2012-12-18 | 2016-10-26 | 旭硝子株式会社 | 基板の剥離装置及び剥離方法並びに電子デバイスの製造方法 |
| JP6301137B2 (ja) * | 2014-01-22 | 2018-03-28 | 株式会社ディスコ | 分離装置 |
| KR102305505B1 (ko) * | 2014-09-29 | 2021-09-24 | 삼성전자주식회사 | 웨이퍼 서포팅 시스템 디본딩 이니시에이터 및 웨이퍼 서포팅 시스템 디본딩 방법 |
| CN107665848B (zh) * | 2016-07-29 | 2020-08-25 | 上海微电子装备(集团)股份有限公司 | 一种解键合调平装置及解键合方法 |
| US20180230389A1 (en) | 2017-02-12 | 2018-08-16 | Magēmā Technology, LLC | Multi-Stage Process and Device for Reducing Environmental Contaminates in Heavy Marine Fuel Oil |
| KR102788502B1 (ko) * | 2023-07-27 | 2025-04-01 | 한국기계연구원 | 효과적인 디본딩이 가능한 웨이퍼 모듈, 및 이의 본딩 및 디본딩 방법 |
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| CN1146973C (zh) | 1997-05-12 | 2004-04-21 | 硅源公司 | 受控切分处理 |
| JPH115064A (ja) * | 1997-06-16 | 1999-01-12 | Canon Inc | 試料の分離装置及びその方法並びに基板の製造方法 |
| US6263941B1 (en) * | 1999-08-10 | 2001-07-24 | Silicon Genesis Corporation | Nozzle for cleaving substrates |
-
1998
- 1998-12-15 US US09/211,757 patent/US6418999B1/en not_active Expired - Fee Related
- 1998-12-15 SG SG1998005839A patent/SG70141A1/en unknown
- 1998-12-15 SG SG200100215A patent/SG87916A1/en unknown
- 1998-12-16 TW TW87120972A patent/TW429464B/zh not_active IP Right Cessation
- 1998-12-18 AT AT98310462T patent/ATE281909T1/de not_active IP Right Cessation
- 1998-12-18 DE DE1998627459 patent/DE69827459T2/de not_active Expired - Lifetime
- 1998-12-18 EP EP19980310462 patent/EP0925888B1/de not_active Expired - Lifetime
- 1998-12-24 AU AU98190/98A patent/AU717785B2/en not_active Ceased
- 1998-12-26 KR KR10-1998-0058984A patent/KR100366722B1/ko not_active Expired - Fee Related
-
2002
- 2002-05-20 US US10/151,527 patent/US6521078B2/en not_active Expired - Fee Related
- 2002-12-12 US US10/318,231 patent/US6860963B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20030102082A1 (en) | 2003-06-05 |
| EP0925888A1 (de) | 1999-06-30 |
| SG70141A1 (en) | 2000-01-25 |
| TW429464B (en) | 2001-04-11 |
| KR19990063512A (ko) | 1999-07-26 |
| US6521078B2 (en) | 2003-02-18 |
| AU717785B2 (en) | 2000-03-30 |
| US20020134504A1 (en) | 2002-09-26 |
| KR100366722B1 (ko) | 2003-02-19 |
| US6418999B1 (en) | 2002-07-16 |
| EP0925888B1 (de) | 2004-11-10 |
| DE69827459D1 (de) | 2004-12-16 |
| SG87916A1 (en) | 2002-04-16 |
| AU9819098A (en) | 1999-08-26 |
| US6860963B2 (en) | 2005-03-01 |
| DE69827459T2 (de) | 2005-10-20 |
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| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |