ATE453649T1 - Verfahren zur herstellung von trialkylgallium - Google Patents

Verfahren zur herstellung von trialkylgallium

Info

Publication number
ATE453649T1
ATE453649T1 AT06023755T AT06023755T ATE453649T1 AT E453649 T1 ATE453649 T1 AT E453649T1 AT 06023755 T AT06023755 T AT 06023755T AT 06023755 T AT06023755 T AT 06023755T AT E453649 T1 ATE453649 T1 AT E453649T1
Authority
AT
Austria
Prior art keywords
gallium
containing compound
producing
group
trialkyl
Prior art date
Application number
AT06023755T
Other languages
English (en)
Inventor
Hisayoshi Yanagihara
Atau Ioku
Takatoshi Mori
Hikari Mitsui
Original Assignee
Nichia Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2005085048A external-priority patent/JP4774771B2/ja
Priority claimed from JP2005085050A external-priority patent/JP4774772B2/ja
Priority claimed from JP2005085053A external-priority patent/JP4774774B2/ja
Priority claimed from JP2005085047A external-priority patent/JP4774770B2/ja
Priority claimed from JP2005085052A external-priority patent/JP4774773B2/ja
Application filed by Nichia Corp filed Critical Nichia Corp
Application granted granted Critical
Publication of ATE453649T1 publication Critical patent/ATE453649T1/de

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/301AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C23C16/303Nitrides
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F5/00Compounds containing elements of Groups 3 or 13 of the Periodic Table
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2921Materials being crystalline insulating materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202Materials thereof
    • H10P14/3214Materials thereof being Group IIIA-VA semiconductors
    • H10P14/3216Nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3414Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
    • H10P14/3416Nitrides
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3438Doping during depositing
    • H10P14/3441Conductivity type
    • H10P14/3442N-type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3438Doping during depositing
    • H10P14/3441Conductivity type
    • H10P14/3444P-type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
AT06023755T 2005-03-23 2006-03-23 Verfahren zur herstellung von trialkylgallium ATE453649T1 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2005085048A JP4774771B2 (ja) 2005-03-23 2005-03-23 トリアルキルガリウムの製造方法
JP2005085050A JP4774772B2 (ja) 2005-03-23 2005-03-23 トリアルキルガリウムの製造方法
JP2005085053A JP4774774B2 (ja) 2005-03-23 2005-03-23 トリアルキルガリウムの製造方法
JP2005085047A JP4774770B2 (ja) 2005-03-23 2005-03-23 トリアルキルガリウムの製造方法
JP2005085052A JP4774773B2 (ja) 2005-03-23 2005-03-23 トリアルキルガリウムの製造方法

Publications (1)

Publication Number Publication Date
ATE453649T1 true ATE453649T1 (de) 2010-01-15

Family

ID=36605368

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06023755T ATE453649T1 (de) 2005-03-23 2006-03-23 Verfahren zur herstellung von trialkylgallium

Country Status (4)

Country Link
US (2) US7667063B2 (de)
EP (3) EP1705719B1 (de)
AT (1) ATE453649T1 (de)
DE (2) DE602006011402D1 (de)

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JP4821007B2 (ja) * 2007-03-14 2011-11-24 国立大学法人大阪大学 Iii族元素窒化物結晶の製造方法およびiii族元素窒化物結晶
DE102007056643B3 (de) * 2007-11-24 2009-06-04 Leuze Electronic Gmbh & Co Kg Optischer Sensor
CN102020669B (zh) * 2010-12-22 2013-01-09 江苏南大光电材料股份有限公司 工业化制备三甲基镓的方法
CN102020670B (zh) * 2010-12-22 2013-01-09 江苏南大光电材料股份有限公司 工业化制备三乙基镓的方法
CN102127102B (zh) * 2011-02-15 2014-01-15 江苏南大光电材料股份有限公司 三甲基铟的纯化装置
WO2012150229A1 (en) * 2011-05-03 2012-11-08 Akzo Nobel Chemicals International B.V. Process for the preparation of trialkyl gallium
TWI632149B (zh) 2011-11-28 2018-08-11 烏明克股份有限兩合公司 第iii a族金屬的三烷基化合物之製法
CN102503969B (zh) * 2011-11-30 2016-01-27 苏州普耀光电材料有限公司 一步法制备高纯三甲基镓的方法
CN102503968B (zh) * 2011-11-30 2015-11-18 苏州普耀光电材料有限公司 一步法制备高纯三乙基镓的方法
JP6206987B2 (ja) * 2012-05-11 2017-10-04 メディカス バイオサイエンシーズ,エルエルシー 網膜剥離の処置のための生体適合性ヒドロゲル製剤
WO2014078263A1 (en) * 2012-11-14 2014-05-22 Dow Global Technologies Llc Methods of producing trimethylgallium
WO2014093419A1 (en) 2012-12-12 2014-06-19 Dow Global Technologies Llc Production of tri-alkyl compounds of group 3a metals
CN103204864B (zh) * 2013-03-21 2015-08-26 苏州普耀光电材料有限公司 一种高纯三甲基铟的制备方法
KR101503491B1 (ko) 2013-04-05 2015-03-18 (주)마이크로켐 고수율을 갖는 트리메틸갈륨의 제조방법
CN103333184A (zh) * 2013-07-05 2013-10-02 江苏南大光电材料股份有限公司 高效低成本生产三甲基镓的方法
CN106146540A (zh) * 2015-03-26 2016-11-23 清远先导材料有限公司 一种三乙基镓的生产方法
US10787466B2 (en) 2018-04-11 2020-09-29 Inpria Corporation Monoalkyl tin compounds with low polyalkyl contamination, their compositions and methods
US11673903B2 (en) 2018-04-11 2023-06-13 Inpria Corporation Monoalkyl tin compounds with low polyalkyl contamination, their compositions and methods
TWI796816B (zh) 2018-06-21 2023-03-21 美商英培雅股份有限公司 單烷基錫烷氧化物的穩定溶液及其水解與縮合產物
US11498934B2 (en) 2019-01-30 2022-11-15 Inpria Corporation Monoalkyl tin trialkoxides and/or monoalkyl tin triamides with particulate contamination and corresponding methods
US11966158B2 (en) 2019-01-30 2024-04-23 Inpria Corporation Monoalkyl tin trialkoxides and/or monoalkyl tin triamides with low metal contamination and/or particulate contamination, and corresponding methods
CN111116618B (zh) * 2019-12-20 2022-06-21 南京奥格美化学研究所有限公司 制备烷基金属化合物的方法
KR20230053592A (ko) 2020-08-20 2023-04-21 신에쓰 가가꾸 고교 가부시끼가이샤 성막방법 및 원료용액
US12072626B2 (en) 2021-02-19 2024-08-27 Inpria Corporation Organometallic radiation patternable coatings with low defectivity and corresponding methods

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Also Published As

Publication number Publication date
EP1903618A1 (de) 2008-03-26
EP1705719B1 (de) 2010-12-15
US7667063B2 (en) 2010-02-23
EP1903618B1 (de) 2012-01-04
EP1755175A1 (de) 2007-02-21
US20060214161A1 (en) 2006-09-28
DE602006011402D1 (de) 2010-02-11
EP1705719A1 (de) 2006-09-27
US20100013055A1 (en) 2010-01-21
US8278470B2 (en) 2012-10-02
EP1755175B1 (de) 2009-12-30
DE602006018814D1 (de) 2011-01-27

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