ATE453649T1 - Verfahren zur herstellung von trialkylgallium - Google Patents
Verfahren zur herstellung von trialkylgalliumInfo
- Publication number
- ATE453649T1 ATE453649T1 AT06023755T AT06023755T ATE453649T1 AT E453649 T1 ATE453649 T1 AT E453649T1 AT 06023755 T AT06023755 T AT 06023755T AT 06023755 T AT06023755 T AT 06023755T AT E453649 T1 ATE453649 T1 AT E453649T1
- Authority
- AT
- Austria
- Prior art keywords
- gallium
- containing compound
- producing
- group
- trialkyl
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C23C16/303—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
- H10P14/2921—Materials being crystalline insulating materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3202—Materials thereof
- H10P14/3214—Materials thereof being Group IIIA-VA semiconductors
- H10P14/3216—Nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
- H10P14/3416—Nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3442—N-type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3444—P-type
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005085048A JP4774771B2 (ja) | 2005-03-23 | 2005-03-23 | トリアルキルガリウムの製造方法 |
| JP2005085050A JP4774772B2 (ja) | 2005-03-23 | 2005-03-23 | トリアルキルガリウムの製造方法 |
| JP2005085053A JP4774774B2 (ja) | 2005-03-23 | 2005-03-23 | トリアルキルガリウムの製造方法 |
| JP2005085047A JP4774770B2 (ja) | 2005-03-23 | 2005-03-23 | トリアルキルガリウムの製造方法 |
| JP2005085052A JP4774773B2 (ja) | 2005-03-23 | 2005-03-23 | トリアルキルガリウムの製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE453649T1 true ATE453649T1 (de) | 2010-01-15 |
Family
ID=36605368
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06023755T ATE453649T1 (de) | 2005-03-23 | 2006-03-23 | Verfahren zur herstellung von trialkylgallium |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7667063B2 (de) |
| EP (3) | EP1705719B1 (de) |
| AT (1) | ATE453649T1 (de) |
| DE (2) | DE602006011402D1 (de) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4821007B2 (ja) * | 2007-03-14 | 2011-11-24 | 国立大学法人大阪大学 | Iii族元素窒化物結晶の製造方法およびiii族元素窒化物結晶 |
| DE102007056643B3 (de) * | 2007-11-24 | 2009-06-04 | Leuze Electronic Gmbh & Co Kg | Optischer Sensor |
| CN102020669B (zh) * | 2010-12-22 | 2013-01-09 | 江苏南大光电材料股份有限公司 | 工业化制备三甲基镓的方法 |
| CN102020670B (zh) * | 2010-12-22 | 2013-01-09 | 江苏南大光电材料股份有限公司 | 工业化制备三乙基镓的方法 |
| CN102127102B (zh) * | 2011-02-15 | 2014-01-15 | 江苏南大光电材料股份有限公司 | 三甲基铟的纯化装置 |
| WO2012150229A1 (en) * | 2011-05-03 | 2012-11-08 | Akzo Nobel Chemicals International B.V. | Process for the preparation of trialkyl gallium |
| TWI632149B (zh) | 2011-11-28 | 2018-08-11 | 烏明克股份有限兩合公司 | 第iii a族金屬的三烷基化合物之製法 |
| CN102503969B (zh) * | 2011-11-30 | 2016-01-27 | 苏州普耀光电材料有限公司 | 一步法制备高纯三甲基镓的方法 |
| CN102503968B (zh) * | 2011-11-30 | 2015-11-18 | 苏州普耀光电材料有限公司 | 一步法制备高纯三乙基镓的方法 |
| JP6206987B2 (ja) * | 2012-05-11 | 2017-10-04 | メディカス バイオサイエンシーズ,エルエルシー | 網膜剥離の処置のための生体適合性ヒドロゲル製剤 |
| WO2014078263A1 (en) * | 2012-11-14 | 2014-05-22 | Dow Global Technologies Llc | Methods of producing trimethylgallium |
| WO2014093419A1 (en) | 2012-12-12 | 2014-06-19 | Dow Global Technologies Llc | Production of tri-alkyl compounds of group 3a metals |
| CN103204864B (zh) * | 2013-03-21 | 2015-08-26 | 苏州普耀光电材料有限公司 | 一种高纯三甲基铟的制备方法 |
| KR101503491B1 (ko) | 2013-04-05 | 2015-03-18 | (주)마이크로켐 | 고수율을 갖는 트리메틸갈륨의 제조방법 |
| CN103333184A (zh) * | 2013-07-05 | 2013-10-02 | 江苏南大光电材料股份有限公司 | 高效低成本生产三甲基镓的方法 |
| CN106146540A (zh) * | 2015-03-26 | 2016-11-23 | 清远先导材料有限公司 | 一种三乙基镓的生产方法 |
| US10787466B2 (en) | 2018-04-11 | 2020-09-29 | Inpria Corporation | Monoalkyl tin compounds with low polyalkyl contamination, their compositions and methods |
| US11673903B2 (en) | 2018-04-11 | 2023-06-13 | Inpria Corporation | Monoalkyl tin compounds with low polyalkyl contamination, their compositions and methods |
| TWI796816B (zh) | 2018-06-21 | 2023-03-21 | 美商英培雅股份有限公司 | 單烷基錫烷氧化物的穩定溶液及其水解與縮合產物 |
| US11498934B2 (en) | 2019-01-30 | 2022-11-15 | Inpria Corporation | Monoalkyl tin trialkoxides and/or monoalkyl tin triamides with particulate contamination and corresponding methods |
| US11966158B2 (en) | 2019-01-30 | 2024-04-23 | Inpria Corporation | Monoalkyl tin trialkoxides and/or monoalkyl tin triamides with low metal contamination and/or particulate contamination, and corresponding methods |
| CN111116618B (zh) * | 2019-12-20 | 2022-06-21 | 南京奥格美化学研究所有限公司 | 制备烷基金属化合物的方法 |
| KR20230053592A (ko) | 2020-08-20 | 2023-04-21 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 성막방법 및 원료용액 |
| US12072626B2 (en) | 2021-02-19 | 2024-08-27 | Inpria Corporation | Organometallic radiation patternable coatings with low defectivity and corresponding methods |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE231568C (de) * | 1909-12-07 | |||
| US3187061A (en) * | 1962-06-13 | 1965-06-01 | Cincinnati Milling Machine Co | Organomagnesium complexes having enhanced storage stability |
| SU325847A1 (ru) | 1970-01-26 | 1974-01-05 | Л. И. Захаркин, Ю. В. Юшков, В. В. Гавриленко, Л. С. Иванов, | Способ получения галлийтриалкилов |
| SU388563A1 (ru) | 1971-06-04 | 1976-04-05 | Предприятие П/Я Х-5476 | Способ получени алкильных производ-ных галли |
| GB2123423B (en) | 1982-06-29 | 1985-11-27 | Secr Defence | Purification of trialkyl gallium |
| GB8316605D0 (en) * | 1983-06-17 | 1983-07-20 | Secr Defence | Preparation of metal alkyls |
| DD231568A1 (de) | 1984-12-21 | 1986-01-02 | Tech Hochschule C Schorlemmer | Verfahren zur herstellung von hochreinen galliumfrialkylen |
| JPS62153293A (ja) | 1985-12-26 | 1987-07-08 | Sumitomo Chem Co Ltd | トリエチルガリウムの製造方法 |
| JPH01301684A (ja) | 1988-05-30 | 1989-12-05 | Nippon Mining Co Ltd | 有機金属化合物の製造方法 |
| US4904616A (en) * | 1988-07-25 | 1990-02-27 | Air Products And Chemicals, Inc. | Method of depositing arsine, antimony and phosphine substitutes |
| JP2654687B2 (ja) * | 1989-05-17 | 1997-09-17 | 東燃株式会社 | オレフイン重合用触媒成分 |
| JPH03127795A (ja) | 1989-10-09 | 1991-05-30 | Nippon Mining Co Ltd | アルキル金属化合物の製造方法 |
| JPH03123784A (ja) | 1989-10-09 | 1991-05-27 | Nippon Mining Co Ltd | トリメチルガリウムの製造方法 |
| JPH0446138A (ja) | 1990-06-12 | 1992-02-17 | Hitachi Chem Co Ltd | アルデヒド基を有する芳香族基置換アルカン酸誘導体及びその製造法 |
| US5248800A (en) * | 1991-11-19 | 1993-09-28 | Shell Research Limited | Process for the preparation of trialkyl gallium compounds |
| US6462361B1 (en) * | 1995-12-27 | 2002-10-08 | Showa Denko K.K. | GaInP epitaxial stacking structure and fabrication method thereof, and a FET transistor using this structure |
| US6124500A (en) | 1998-03-09 | 2000-09-26 | Rohm And Haas Company | Process for synthesizing benzoic acids |
| JP3977919B2 (ja) | 1998-04-24 | 2007-09-19 | 株式会社カネカ | グリニヤール試薬溶液又はその安定化法 |
| JP2001072630A (ja) | 1999-09-07 | 2001-03-21 | Mitsubishi Chemicals Corp | ハロヒドリンの製造方法 |
| JP2003055099A (ja) | 2001-08-22 | 2003-02-26 | Nichia Chem Ind Ltd | 窒化ガリウム系化合物半導体基板の製造方法及び窒化ガリウム系化合物半導体基板 |
| JP2003335727A (ja) | 2002-05-16 | 2003-11-28 | Dainippon Ink & Chem Inc | エステル化合物の製造方法 |
-
2006
- 2006-03-22 US US11/385,687 patent/US7667063B2/en not_active Expired - Lifetime
- 2006-03-23 DE DE602006011402T patent/DE602006011402D1/de not_active Expired - Lifetime
- 2006-03-23 DE DE602006018814T patent/DE602006018814D1/de not_active Expired - Lifetime
- 2006-03-23 EP EP06005982A patent/EP1705719B1/de not_active Ceased
- 2006-03-23 AT AT06023755T patent/ATE453649T1/de not_active IP Right Cessation
- 2006-03-23 EP EP07022179A patent/EP1903618B1/de not_active Ceased
- 2006-03-23 EP EP06023755A patent/EP1755175B1/de not_active Ceased
-
2009
- 2009-10-01 US US12/571,588 patent/US8278470B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP1903618A1 (de) | 2008-03-26 |
| EP1705719B1 (de) | 2010-12-15 |
| US7667063B2 (en) | 2010-02-23 |
| EP1903618B1 (de) | 2012-01-04 |
| EP1755175A1 (de) | 2007-02-21 |
| US20060214161A1 (en) | 2006-09-28 |
| DE602006011402D1 (de) | 2010-02-11 |
| EP1705719A1 (de) | 2006-09-27 |
| US20100013055A1 (en) | 2010-01-21 |
| US8278470B2 (en) | 2012-10-02 |
| EP1755175B1 (de) | 2009-12-30 |
| DE602006018814D1 (de) | 2011-01-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |