ATE464694T1 - Vorrichtung und verfahren zum automatischen selbstkalibrieren einer duty-cycle-schaltung für maximale chipleistungsfähigkeit - Google Patents

Vorrichtung und verfahren zum automatischen selbstkalibrieren einer duty-cycle-schaltung für maximale chipleistungsfähigkeit

Info

Publication number
ATE464694T1
ATE464694T1 AT06806822T AT06806822T ATE464694T1 AT E464694 T1 ATE464694 T1 AT E464694T1 AT 06806822 T AT06806822 T AT 06806822T AT 06806822 T AT06806822 T AT 06806822T AT E464694 T1 ATE464694 T1 AT E464694T1
Authority
AT
Austria
Prior art keywords
dcc
circuit
built
duty cycle
setting
Prior art date
Application number
AT06806822T
Other languages
English (en)
Inventor
Eskinder Hailu
David Boerstler
Jieming Qi
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE464694T1 publication Critical patent/ATE464694T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
    • H03K5/1565—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern the output pulses having a constant duty cycle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc-Dc Converters (AREA)
  • Pulse Circuits (AREA)
AT06806822T 2005-10-04 2006-09-26 Vorrichtung und verfahren zum automatischen selbstkalibrieren einer duty-cycle-schaltung für maximale chipleistungsfähigkeit ATE464694T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/242,677 US7322001B2 (en) 2005-10-04 2005-10-04 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance
PCT/EP2006/066739 WO2007039516A1 (en) 2005-10-04 2006-09-26 Apparatus and method for automatically self-calibrating a duty cycle circuit for maximum chip performance

Publications (1)

Publication Number Publication Date
ATE464694T1 true ATE464694T1 (de) 2010-04-15

Family

ID=37460149

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06806822T ATE464694T1 (de) 2005-10-04 2006-09-26 Vorrichtung und verfahren zum automatischen selbstkalibrieren einer duty-cycle-schaltung für maximale chipleistungsfähigkeit

Country Status (8)

Country Link
US (2) US7322001B2 (de)
EP (1) EP1932235B1 (de)
JP (1) JP4629778B2 (de)
KR (1) KR101020394B1 (de)
CN (1) CN101278481B (de)
AT (1) ATE464694T1 (de)
DE (1) DE602006013667D1 (de)
WO (1) WO2007039516A1 (de)

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US20090128206A1 (en) * 2007-11-20 2009-05-21 Boerstler David W Apparatus and Method for Obtaining Desired Phase Locked Loop Duty Cycle without Pre-Scaler
US8381143B2 (en) * 2008-05-29 2013-02-19 International Business Machines Corporation Structure for a duty cycle correction circuit
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KR100933805B1 (ko) * 2008-06-30 2009-12-24 주식회사 하이닉스반도체 듀티비 보정회로 및 그를 포함하는 지연고정루프회로
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CN102035508B (zh) * 2010-05-28 2016-01-20 上海华虹宏力半导体制造有限公司 一种时钟产生电路
KR20130086423A (ko) * 2012-01-25 2013-08-02 삼성전자주식회사 데이터 스트로브 신호의 듀티비 보정 방법
US9484894B2 (en) 2012-07-09 2016-11-01 International Business Machines Corporation Self-adjusting duty cycle tuner
US9319030B2 (en) 2013-12-12 2016-04-19 International Business Machines Corporation Integrated circuit failure prediction using clock duty cycle recording and analysis
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GB2539459A (en) * 2015-06-16 2016-12-21 Nordic Semiconductor Asa Waveform generation
CN107196656B (zh) * 2016-03-15 2020-11-06 联发科技（新加坡）私人有限公司 一种信号校准电路及信号校准方法
CN112204664B (zh) 2018-05-29 2024-04-02 美光科技公司 用于设置用于改进时钟工作循环的工作循环调整器的设备及方法
US10715127B2 (en) 2018-11-21 2020-07-14 Micron Technology, Inc. Apparatuses and methods for using look-ahead duty cycle correction to determine duty cycle adjustment values while a semiconductor device remains in operation
US11189334B2 (en) 2018-11-21 2021-11-30 Micron Technology, Inc. Apparatuses and methods for a multi-bit duty cycle monitor
CN113075531A (zh) * 2021-03-24 2021-07-06 上海华虹宏力半导体制造有限公司 芯片的测试方法

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Also Published As

Publication number Publication date
US20070079197A1 (en) 2007-04-05
CN101278481B (zh) 2012-06-27
KR101020394B1 (ko) 2011-03-09
CN101278481A (zh) 2008-10-01
EP1932235A1 (de) 2008-06-18
WO2007039516A1 (en) 2007-04-12
JP4629778B2 (ja) 2011-02-09
US7360135B2 (en) 2008-04-15
US7322001B2 (en) 2008-01-22
EP1932235B1 (de) 2010-04-14
US20070300113A1 (en) 2007-12-27
DE602006013667D1 (de) 2010-05-27
KR20080056186A (ko) 2008-06-20
JP2009510793A (ja) 2009-03-12

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