JP2917877B2 - 基準電流発生回路 - Google Patents
基準電流発生回路Info
- Publication number
- JP2917877B2 JP2917877B2 JP7289318A JP28931895A JP2917877B2 JP 2917877 B2 JP2917877 B2 JP 2917877B2 JP 7289318 A JP7289318 A JP 7289318A JP 28931895 A JP28931895 A JP 28931895A JP 2917877 B2 JP2917877 B2 JP 2917877B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- output
- ladder resistor
- reference voltage
- generating circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009966 trimming Methods 0.000 claims description 9
- 239000000284 extract Substances 0.000 claims 1
- 238000005065 mining Methods 0.000 claims 1
- 101100343585 Arabidopsis thaliana LNG1 gene Proteins 0.000 description 8
- 101150110861 TRM2 gene Proteins 0.000 description 8
- 108010086600 N(2),N(2)-dimethylguanosine-26-methyltransferase Proteins 0.000 description 7
- 102100034541 tRNA (guanine(26)-N(2))-dimethyltransferase Human genes 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 101000806846 Homo sapiens DNA-(apurinic or apyrimidinic site) endonuclease Proteins 0.000 description 4
- 101000835083 Homo sapiens Tissue factor pathway inhibitor 2 Proteins 0.000 description 4
- 102100026134 Tissue factor pathway inhibitor 2 Human genes 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 101100261339 Caenorhabditis elegans trm-1 gene Proteins 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Control Of Electrical Variables (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
- Control Of Voltage And Current In General (AREA)
- Amplifiers (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7289318A JP2917877B2 (ja) | 1995-10-11 | 1995-10-11 | 基準電流発生回路 |
| US08/729,399 US6377113B1 (en) | 1995-10-11 | 1996-10-11 | Reference current generating circuit |
| KR1019960045182A KR100225825B1 (ko) | 1995-10-11 | 1996-10-11 | 기준 전류 발생 회로 |
| TW085112409A TW371372B (en) | 1995-10-11 | 1996-10-11 | A reference current generator circuit |
| EP96116361A EP0768593A3 (fr) | 1995-10-11 | 1996-10-11 | Circuit générateur de courant de référence |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7289318A JP2917877B2 (ja) | 1995-10-11 | 1995-10-11 | 基準電流発生回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH09106316A JPH09106316A (ja) | 1997-04-22 |
| JP2917877B2 true JP2917877B2 (ja) | 1999-07-12 |
Family
ID=17741645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7289318A Expired - Lifetime JP2917877B2 (ja) | 1995-10-11 | 1995-10-11 | 基準電流発生回路 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6377113B1 (fr) |
| EP (1) | EP0768593A3 (fr) |
| JP (1) | JP2917877B2 (fr) |
| KR (1) | KR100225825B1 (fr) |
| TW (1) | TW371372B (fr) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002354195A (ja) * | 2001-05-29 | 2002-12-06 | Hamamatsu Photonics Kk | 信号処理回路および固体撮像装置 |
| JP3903770B2 (ja) * | 2001-11-08 | 2007-04-11 | 日本電気株式会社 | データ線駆動回路 |
| KR100543318B1 (ko) * | 2002-10-07 | 2006-01-20 | 주식회사 하이닉스반도체 | 부스팅 전압 제어회로 |
| US6891357B2 (en) * | 2003-04-17 | 2005-05-10 | International Business Machines Corporation | Reference current generation system and method |
| US7061304B2 (en) * | 2004-01-28 | 2006-06-13 | International Business Machines Corporation | Fuse latch with compensated programmable resistive trip point |
| JP4385811B2 (ja) * | 2004-03-24 | 2009-12-16 | 株式会社デンソー | 定電流回路 |
| US8106862B2 (en) * | 2004-05-19 | 2012-01-31 | Sharp Kabushiki Kaisha | Liquid crystal display device for reducing influence of voltage drop in time-division driving, method for driving the same, liquid crystal television having the same and liquid crystal monitor having the same |
| US7296247B1 (en) * | 2004-08-17 | 2007-11-13 | Xilinx, Inc. | Method and apparatus to improve pass transistor performance |
| KR100775057B1 (ko) | 2004-12-13 | 2007-11-08 | 삼성전자주식회사 | 트랜지스터 정합 특성이 향상된 데이터 드라이브 집적회로를 구비한 디스플레이 장치 |
| JP4848689B2 (ja) * | 2005-07-11 | 2011-12-28 | セイコーエプソン株式会社 | 半導体集積回路 |
| JP2007226627A (ja) * | 2006-02-24 | 2007-09-06 | Seiko Instruments Inc | ボルテージレギュレータ |
| JP5088031B2 (ja) * | 2007-08-01 | 2012-12-05 | 富士電機株式会社 | 定電流・定電圧回路 |
| JP5318676B2 (ja) * | 2009-06-25 | 2013-10-16 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| JP2011015259A (ja) * | 2009-07-03 | 2011-01-20 | Renesas Electronics Corp | 半導体集積回路装置およびその試験方法 |
| JP2011053957A (ja) * | 2009-09-02 | 2011-03-17 | Toshiba Corp | 参照電流生成回路 |
| KR101389620B1 (ko) * | 2011-10-28 | 2014-04-29 | 에스케이하이닉스 주식회사 | 멀티 레귤레이터 회로 및 이를 구비한 집적회로 |
| JP6232925B2 (ja) * | 2013-10-28 | 2017-11-22 | 富士電機株式会社 | 入力回路 |
| US9252713B2 (en) | 2014-02-27 | 2016-02-02 | Qualcomm Incorporated | Bias circuits and methods for stacked devices |
| CN107742498B (zh) * | 2017-11-24 | 2021-02-09 | 京东方科技集团股份有限公司 | 参考电压电路、参考电压提供模组和显示装置 |
| JP2024077674A (ja) * | 2022-11-29 | 2024-06-10 | エイブリック株式会社 | 基準電流源 |
| US12566464B2 (en) * | 2023-08-21 | 2026-03-03 | Himax Imaging Limited | Power ground noise reduction system capable of reducing noise voltage interference |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5463662A (en) * | 1977-10-28 | 1979-05-22 | Nec Corp | Current supply circuit |
| US4198622A (en) * | 1978-02-21 | 1980-04-15 | National Semiconductor Corporation | Double digital-to-analog converter |
| US4354175A (en) * | 1980-05-01 | 1982-10-12 | Mostek Corporation | Analog/digital converter utilizing a single column of analog switches |
| US4331913A (en) * | 1980-10-02 | 1982-05-25 | Bell Telephone Laboratories, Incorporated | Precision negative impedance circuit with calibration |
| JPS5966725A (ja) * | 1982-10-07 | 1984-04-16 | Nippon Denso Co Ltd | 定電流回路 |
| JPS6331224A (ja) | 1986-07-24 | 1988-02-09 | Fuji Electric Co Ltd | A/d変換サンプル値の精度改善方式 |
| JPH02145012A (ja) * | 1988-11-26 | 1990-06-04 | Nec Corp | 基準電圧トリミング回路 |
| JPH03172906A (ja) * | 1989-12-01 | 1991-07-26 | Hitachi Ltd | トリミング回路 |
| JP3365804B2 (ja) * | 1993-01-12 | 2003-01-14 | 株式会社日立製作所 | 通信回線駆動回路、及びインタフェース用lsi、並びに通信端末装置 |
| JPH06243678A (ja) * | 1993-02-19 | 1994-09-02 | Hitachi Ltd | ダイナミック型ramとそのプレート電圧設定方法及び情報処理システム |
| JP3156447B2 (ja) * | 1993-06-17 | 2001-04-16 | 富士通株式会社 | 半導体集積回路 |
| JPH07170188A (ja) | 1993-12-14 | 1995-07-04 | Yamaha Corp | Daコンバータ回路 |
| US5640122A (en) * | 1994-12-16 | 1997-06-17 | Sgs-Thomson Microelectronics, Inc. | Circuit for providing a bias voltage compensated for p-channel transistor variations |
| US5568084A (en) * | 1994-12-16 | 1996-10-22 | Sgs-Thomson Microelectronics, Inc. | Circuit for providing a compensated bias voltage |
| US5504447A (en) * | 1995-06-07 | 1996-04-02 | United Memories Inc. | Transistor programmable divider circuit |
-
1995
- 1995-10-11 JP JP7289318A patent/JP2917877B2/ja not_active Expired - Lifetime
-
1996
- 1996-10-11 EP EP96116361A patent/EP0768593A3/fr not_active Withdrawn
- 1996-10-11 KR KR1019960045182A patent/KR100225825B1/ko not_active Expired - Fee Related
- 1996-10-11 TW TW085112409A patent/TW371372B/zh active
- 1996-10-11 US US08/729,399 patent/US6377113B1/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6377113B1 (en) | 2002-04-23 |
| KR100225825B1 (ko) | 1999-10-15 |
| KR970023370A (ko) | 1997-05-30 |
| TW371372B (en) | 1999-10-01 |
| EP0768593A3 (fr) | 1998-01-21 |
| JPH09106316A (ja) | 1997-04-22 |
| EP0768593A2 (fr) | 1997-04-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 19990323 |