JPH0314911B2 - - Google Patents

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Publication number
JPH0314911B2
JPH0314911B2 JP33043187A JP33043187A JPH0314911B2 JP H0314911 B2 JPH0314911 B2 JP H0314911B2 JP 33043187 A JP33043187 A JP 33043187A JP 33043187 A JP33043187 A JP 33043187A JP H0314911 B2 JPH0314911 B2 JP H0314911B2
Authority
JP
Japan
Prior art keywords
plated
plating
tank
conveying means
anode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP33043187A
Other languages
Japanese (ja)
Other versions
JPH01172590A (en
Inventor
Tetsuya Hojo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
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Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP33043187A priority Critical patent/JPH01172590A/en
Publication of JPH01172590A publication Critical patent/JPH01172590A/en
Publication of JPH0314911B2 publication Critical patent/JPH0314911B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】[Detailed description of the invention]

イ 発明の目的 a 産業上の利用分野 本発明は、例えばICリードフレーム・プリン
ト基板の如き板状物や、あるいは棒状物のような
被メツキ物に、半田・錫・銀・銅その他の金属を
全面メツキするための装置に関するものである。 b 従来の技術 上記の如き板状物や棒状物等の被メツキ物へ全
面メツキを施す従来手段としては、ラツキング法
が一般的である。これは、例えば「メツキマニア
ル」(友野理平著、株式会社オーム社、昭和46年
10月25日発行)の第57頁乃至第78頁に記載の如
く、引掛け用部をもつラツク(治具)に、板状や
棒状の被メツキ物を陰極部に接触させながら引掛
け吊して、メツキ液中で電解処理するものであ
る。また特にICリードフレームへの内装全面メ
ツキや樹脂モールド後の外装メツキ、あるいはプ
リント基板へ全面銅メツキ等をする場合には、量
産のためラツク1つに多数枚を引掛けて処理され
ることが一般的である。 c 発明が解決しようとする問題点 板状物や棒状物等の被メツキ物への全面メツキ
を、上記従来のラツキング法により行つた場合に
は、次の如き問題点がある。 (i) メツキにおけるいわゆるエツジ現象により、
被メツキ物の側部寄りほどメツキが付きやす
い。したがつて、ラツクに引掛けた多数枚の被
メツキ物を全体的に見た場合、その中で側部寄
りに引掛けた被メツキ物ほどメツキ厚が大き
く、中央部寄りに引掛けたものほどメツキ厚が
小さくなる。また被メツキ物単体を見た場合に
も、上記全体的な差程ではないが、やはりその
側縁寄り部分ほどメツキ厚が大きく、中央部寄
りほどメツキ厚が小さくなつている。この現象
は、陽極との間に遮蔽板を設けたとしても、そ
の隙間部分においてやはりメツキ膜厚に差が生
じる。このメツキ厚のバラツキは、特に高精度
を要求されるICリードフレームやプリント基
板では到底許容されず、不合格となつてしまう
場合が多い。 (ii) 被メツキ物の長さ、幅等によつて、ラツクの
大きさ・陰極接点の位置・形状等を変える必要
があり、専用のラツクまたは接点を用意し、そ
れを交換する手間がかかつた。また被メツキ物
であるICリードフレームやプリント基板を、
ラツクに多数枚自動ラツキングすることは難し
い。さらに処理槽の構造から、液交換・撹拌が
難しく低電流密度になつしまい、メツキの高速
化が不可能または困難であつた。 本発明は、上記従来の全面メツキ手段が持つ間
題点を解決しようとするものである。即ち本発明
の目的は、被メツキ物へのメツキ膜厚が均一にな
るとともに、専用ラツクが不要で治具による被メ
ツキ物保持の自動化が可能となり、かつ高速メツ
キ処理を図れるような、全面メツキ装置を提供す
ることにある。 ロ 発明の構成 a 問題点を解決するための手段 本発明の全面メツキ装置は、メツキ槽2内に、
内部を水平状に移動可能な無端状搬送手段4を設
け、該搬送手段4外周に、被メツキ物1を横長垂
直状で保持可能は保持治具5を連続状に設け、陰
極接点7を無端状として、上記保持治具5上側に
ある搬送部分6内を共に移動可能に設け、搬送部
分6両側に、その移動方向に一定間隔で陽極用開
口部9,9をもつ遮蔽板10,10と、各陽極用
開口部9,9外側に被メツキ物1両側面へ平行状
の陽極11,11とを設け、かつ上記搬送手段4
を、被メツキ物1の長手方向中央部が遮蔽板1
0,10の陽極用開口部9,9位置にきたとき、
一定時間停止する間欠運動可能に設けてなるもの
である。 上記構成をもう少し詳説する。 端無状搬送手段4は例えばローラチエン式の無
端状のものとし、メツキ槽2内の前後に設けた横
軸で回転するホイル12により、水平状に移行さ
せて搬送路8を形成してある。そして該搬送手段
4は、被メツキ物1の長手方向中央部が遮蔽板1
0,10の陽極用開口部9,9位置にきたとき、
一定時間停止する間欠運動可能なものとしてお
く。またその間欠運動は、被メツキ物1全面のメ
ツキ膜厚分布を所望の状態に調節するため、被メ
ツキ物1が遮蔽板10,10間を通過する時間
と、陽極用開口部9,9で一時停止する時間と
を、適正に調節可能としておく。 被メツキ物1の保持治具5は、被メツキ物1を
横長垂直状に保持可能な枠型状、例えば正面から
見て半円状で(第1図参照)、側面から見てくの
字状と逆くの字状の枠材を上下部が狭くなるよう
に並設した枠型状で(第3図参照)、上記搬送手
段4外周に連続状に設けてある。 無端状陰極接点7は、例えばチエン式の無端状
とし、上記保持治具5上側の搬送部分6内を共に
移動可能としておく。 遮蔽板10,10は上記の如く、搬送路8を間
にして両側に並設してあるが、該両側遮蔽板1
0,10には搬送方向即ち搬送路8に沿つて一定
間隔に、陽極用開口部9,9を形成してある。該
開口部9,9の一定間隔は、少なくとも被メツキ
物1の横幅より大きいものにしておけばよい。 陽極11,11は、上記遮蔽板10,10の各
両開口部9,9外側に、被メツキ物1の両側面と
平行状に設けてあるが、例えば図示例の如くチツ
プ状にしてチタン製のアノードケース内に収容し
たもの、あるいは板状としてもよい。 なお、また被メツキ物1の種類によつては、メ
ツキ膜厚がそれほど均一性を要求されぬものもあ
るので、その場合のために搬送手段4は、連続移
動も可能にしておけばよい。 図において、3は接点剥蔽槽であり、例えば第
1図・第3図で示す如くメツキ槽2の下部に配置
し、かつ該剥離槽3内には、電解剥離液としてメ
ツキ液または光沢剤等を除いたメツキ液の一部の
成分を利用した剥離液を入れておくのがよい。 また上記無端状陰極接点7は、メツキ槽2の前
寄り位置で搬送手段4と保持治具5がリターン時
に、第1図で示す如く、該陰極接点7だけさらに
前方へ進めて保持治具5から分離させ、前壁13
からメツキ槽2外へ導びき、かつロール17を介
して剥離槽3の液中を通過させ、その後に後壁1
4から再びメツキ槽2内へ戻る如く、循環移動可
能にしておくことが望ましい。 15,15は液切り板、16,16は遮蔽板間
におけるメツキ液撹拌用の循環パイプである。 b 作 用 本発明の作用状態は次の如くである。 メツキ液を入れたメツキ槽2内の電極に通電す
るとともに、間欠運動可能な搬送手段4を駆動さ
せておき、短尺の被メツキ物1を等間隔で順次に
送り込む。被メツキ物1は、搬送手段4外周に設
けた保持治具5の上側にある搬送部分6内で、該
保持治具5とともに移動する無端状の陰極接点7
上に、横長垂直状で等間隔に保持される。 搬送手段4の移動により、保持治具5上側の搬
送部分6内の被メツキ物1はメツキ槽2の後部か
ら前部に向けて水平状の搬送路8上を搬送される
が、その際無端状陰極接点7も、上記の如く被メ
ツキ物1に接触しながら保持治具5と共に移動し
ている。 被メツキ物1が移動する搬送路8両側には、一
定間隔で陽極用開口部9,9をもつ遮蔽板10,
10と、各陽極用開口部9,9外側に平行状に陽
極11,11が設けてある。被メツキ物1には、
該搬送路8上を移動中にメツキ膜が形成される
が、遮蔽板10,10間を通過時にはエツジ現象
により、被メツキ物1の側縁寄り部分ほどメツキ
が折出し易いので、その部分のメツキ膜が厚くな
りがちである。 しかし本発明では搬送手段4が、搬送されてき
た被メツキ物1の中央部が上記陽極用開口部9,
9に対応する位置に来た時点で、間欠移動で一定
時間停止するようにしてある。そのため該停止時
中には、上記遮蔽板10,10間を通過時とは逆
に、陽極11,11と対応する位置の被メツキ物
1中央部で、側縁寄り部分よりもメツキが折出し
易く、メツキ膜が厚く形成される。 それゆえ、被メツキ物1が上記の如くメツキ槽
2内を移動中に、何箇所かの陽極用開口部9,9
を一定時間停止しながら通過することにより、被
メツキ物1中央部にはメツキ膜形成が充分に繰り
返される。その結果、該被メツキ物1がメツキ槽
2内を移動し終わる段階では、被メツキ物1上の
メツキ膜は、中央部も側縁寄り部分もほぼ均一な
膜厚に形成されることになる。 さらに本発明では陽極11,11を、搬送路8
両側の陽極用開口部9,9外側に、保持治具5内
の被メツキ物1両側面と平行状に設けてある。そ
のため陽極11,11と陰極接点7との極間距離
が短い場合にも、被メツキ物1と陽極11,11
との最短距離は、被メツキ物1の各部の高さにお
いて近似する。そのため被メツキ物1の高さ方向
のメツキ膜厚も、均一化し易くなつている。 なお、無端状陰極接点7および接点剥離槽3
を、上記の如く第1図・第3図で示すような構成
にしてある場合には、上記作動状態中に陰極接点
7は、メツキ槽2前部寄りで搬送手段4がリター
ン時に搬送手段4や保持治具5から分離し、メツ
キ槽2外に出て接点剥離槽3内を通過し、メツキ
槽2へ戻るという循環移動をする。この接点剥離
槽3内の通過により、陰極接点7に電着のメツキ
は、該剥離槽3内の電解剥離液にて剥離される。 その際、剥離槽3内を通過するのは単に陰極接
点7だけで、搬送手段4や保持治具5はメツキ槽
2内だけの移動であるから、メツキ液の持ち出
し・持ち込み量はきわめて少なくなつている。ま
た該剥離槽3内の剥離液は、メツキ液またはメツ
キ液を成分とする電解剥離液としてある。そのた
めメツキ液が、陰極接点7により該剥離槽3へ持
ち込まれたとしも、メツキ液と同質の電解剥離液
は変質しないし、逆に剥離液のメツキ槽2への持
ち込みも何ら問題とならない。また陰極接点7を
電解剥離後に水洗する必要もなくなつている。 c 実施例 本発明の効果を確認するため、実施例としての
第1図ないし第5図で示す全面メツキ装置を用い
て、次の条件で実験を行つた。メツキ液9:1半
田スロツトレツトKB浴(西独マツクスシユレー
ター社製)、電波密度5A/dm2、浴温20C、設定
膜厚値7μm、極間距離40〜50mm、被メツキ物IC
リードフレーム(Dip28ピン220×45mm、Flat84
ピン188×55mm)、遮蔽板長さ600mm、時間3.5分
(内容停止時間35秒、各移動時間52.5秒)とし、
膜厚測定機蛍光X線膜厚測定機(セイコー社製
SFT−158型)で被メツキ物1各部の膜厚を測定
した。それを、従来のラツキング法により同じ条
件でメツキしたものを比較すると以下の表のよう
になる。
B. Purpose of the invention a. Industrial application field The present invention is directed to applying solder, tin, silver, copper, or other metals to plate-like objects such as IC lead frames and printed circuit boards, or objects to be plated such as rod-like objects. This relates to a device for plating the entire surface. b. Prior Art A rasping method is generally used as a conventional means for applying full-surface plating to an object to be plated, such as a plate-like object or a rod-like object as described above. This is, for example, ``Metsukimanial'' (written by Rihei Tomono, published by Ohmsha Co., Ltd. in 1972).
As described on pages 57 to 78 of the issue published on October 25th, a plate-shaped or rod-shaped object to be plated is hung on a rack (jig) that has a hooking part while being in contact with the cathode part. Then, electrolytic treatment is performed in a plating solution. In addition, especially when plating the entire interior of an IC lead frame, plating the exterior after resin molding, or plating the entire surface of a printed circuit board with copper, it is easy to process a large number of sheets by hooking them into one for mass production. Common. c. Problems to be Solved by the Invention When the entire surface of an object to be plated, such as a plate-shaped object or a rod-shaped object, is plated by the above-mentioned conventional rasping method, the following problems arise. (i) Due to the so-called edge phenomenon in Metsuki,
The closer to the side of the object to be plated, the more likely it is to be plated. Therefore, when we look at a large number of objects to be plated that are easily hooked, we can see that the more the objects are hooked toward the sides, the thicker the plating will be. The plating thickness becomes smaller as the thickness increases. Also, when looking at a single object to be plated, the plating thickness is larger toward the side edges, and smaller toward the center, although this is not the same overall difference as described above. Even if a shielding plate is provided between the anode and the anode, this phenomenon still causes a difference in the plating film thickness in the gap between the shielding plate and the anode. This variation in plating thickness is simply unacceptable, especially in IC lead frames and printed circuit boards that require high precision, and often results in rejection. (ii) It is necessary to change the size of the rack and the position and shape of the cathode contact depending on the length, width, etc. of the object to be plated, and it is time consuming to prepare a dedicated rack or contact and replace it. It was. In addition, IC lead frames and printed circuit boards that are to be plated are
It is difficult to automatically rack a large number of sheets easily. Furthermore, the structure of the treatment tank makes it difficult to exchange and stir the liquid, resulting in a low current density, making it impossible or difficult to increase the plating speed. The present invention aims to solve the problems associated with the above-mentioned conventional full surface plating means. In other words, the object of the present invention is to provide a method for full-surface plating that makes the thickness of the plating film uniform on the object to be plated, eliminates the need for a dedicated rack, enables automation of holding the object with a jig, and enables high-speed plating processing. The goal is to provide equipment. B. Arrangement of the Invention a Means for Solving the Problems The entire surface plating device of the present invention has a plating tank 2 containing:
An endless conveying means 4 that can move horizontally inside is provided, and a holding jig 5 capable of holding the object 1 to be plated in a horizontally long vertical shape is continuously provided on the outer periphery of the conveying means 4, and a cathode contact 7 is provided endlessly. Shielding plates 10, 10 are provided movably in the conveying part 6 above the holding jig 5, and have anode openings 9, 9 on both sides of the conveying part 6 at regular intervals in the direction of movement. , parallel anodes 11, 11 are provided outside the respective anode openings 9, 9 on both sides of the object to be plated, and the conveying means 4
, the longitudinal center of the object 1 to be plated is the shielding plate 1
When it comes to the 0, 10 anode opening 9, 9 position,
It is designed to allow intermittent movement that stops for a certain period of time. The above configuration will be explained in more detail. The endless conveyance means 4 is, for example, an endless roller chain type, and is moved horizontally to form a conveyance path 8 by means of foils 12 provided at the front and rear of the plating tank 2 and rotating on a horizontal axis. The conveying means 4 is arranged such that the longitudinal center portion of the object 1 is connected to the shielding plate 1.
When it comes to the 0, 10 anode opening 9, 9 position,
It should be possible to perform intermittent motion that stops for a certain period of time. In addition, the intermittent movement is determined by the time it takes for the object to be plated to pass between the shielding plates 10 and 10, and the time it takes for the object to be plated to pass between the shielding plates 10 and 10, in order to adjust the plating film thickness distribution over the entire surface of the object to be plated to a desired state. To make it possible to appropriately adjust the pause time. The holding jig 5 for the object to be plated 1 has a frame shape capable of holding the object to be plated 1 horizontally and vertically, for example, a semicircular shape when viewed from the front (see Fig. 1), and a dogleg shape when viewed from the side. It has a frame shape in which frame members in the shape of an inverted dogleg are arranged side by side so that the top and bottom are narrow (see FIG. 3), and are continuously provided around the outer periphery of the conveying means 4. The endless cathode contact 7 is, for example, chain-type endless, and is movable together within the transport portion 6 above the holding jig 5. As described above, the shielding plates 10, 10 are arranged in parallel on both sides with the conveyance path 8 in between.
0 and 10, anode openings 9 and 9 are formed at regular intervals along the conveyance direction, that is, along the conveyance path 8. The constant interval between the openings 9, 9 may be made larger than at least the width of the object 1 to be plated. The anodes 11, 11 are provided outside the respective openings 9, 9 of the shielding plates 10, 10 in parallel with both side surfaces of the object 1 to be plated. It may be housed in an anode case or may be shaped like a plate. Furthermore, depending on the type of the object 1 to be plated, the thickness of the plating film may not be required to be so uniform, so the conveyance means 4 may be configured to be capable of continuous movement for that case. In the figure, reference numeral 3 denotes a contact stripping tank, which is placed at the bottom of the plating tank 2 as shown in FIGS. It is a good idea to add a stripping solution that uses some of the ingredients of the plating solution, excluding the above. Further, when the conveying means 4 and the holding jig 5 are returned to the front position of the plating tank 2, the endless cathode contact 7 is moved further forward by the holding jig 5, as shown in FIG. separated from the front wall 13
The liquid is guided to the outside of the plating tank 2 and passed through the peeling tank 3 via the roll 17, and then the rear wall 1
It is desirable to be able to circulate the plating tank 2 from the plating tank 4 to the plating tank 2 again. Reference numerals 15 and 15 indicate liquid drain plates, and reference numerals 16 and 16 indicate circulation pipes for stirring the plating liquid between the shielding plates. b. Function The working state of the present invention is as follows. Electrodes in a plating tank 2 containing a plating solution are energized, and a conveying means 4 capable of intermittent movement is driven to sequentially send short objects 1 to be plated at equal intervals. The object to be plated 1 is transported within a conveying section 6 located above a holding jig 5 provided on the outer periphery of the conveying means 4, and an endless cathode contact 7 that moves together with the holding jig 5.
They are held horizontally and vertically at equal intervals on the top. By the movement of the conveyance means 4, the object to be plated 1 in the conveyance section 6 above the holding jig 5 is conveyed on the horizontal conveyance path 8 from the rear to the front of the plating tank 2. The shaped cathode contact 7 is also moving together with the holding jig 5 while contacting the object 1 to be plated as described above. On both sides of the conveyance path 8 along which the object to be plated 1 moves, there are shielding plates 10 having anode openings 9 at regular intervals.
10, and anodes 11, 11 are provided in parallel on the outside of each anode opening 9, 9. For the object to be plated 1,
A plating film is formed while moving on the conveyance path 8, but when passing between the shielding plates 10, 10, the plating is more likely to break out near the side edges of the object 1 due to the edge phenomenon. The plating film tends to become thick. However, in the present invention, the conveying means 4 is arranged so that the central part of the object to be plated 1 that has been conveyed is connected to the anode opening 9,
When it reaches the position corresponding to 9, it is made to stop for a certain period of time by intermittent movement. Therefore, during the stoppage, the plating is more likely to break out in the central part of the object to be plated 1 at the position corresponding to the anodes 11, 11 than in the part closer to the side edges, contrary to when it passes between the shielding plates 10, 10. It is easy to form a thick plating film. Therefore, while the object 1 to be plated is moving in the plating tank 2 as described above, the anode openings 9, 9
By passing through the plate while stopping for a certain period of time, the plating film is sufficiently repeatedly formed on the central part of the object 1 to be plated. As a result, at the stage when the object 1 to be plated has finished moving in the plating tank 2, the plating film on the object 1 to be plated will have a substantially uniform thickness both in the center and near the side edges. . Furthermore, in the present invention, the anodes 11, 11 are
The openings 9 for anodes on both sides are provided on the outside of the anode openings 9, 9 in parallel with both side surfaces of the object to be plated 1 in the holding jig 5. Therefore, even when the distance between the anodes 11, 11 and the cathode contact 7 is short, the object to be plated and the anodes 11, 11
The shortest distance to the plating object 1 is approximated by the height of each part of the object 1 to be plated. Therefore, the thickness of the plating film in the height direction of the object 1 to be plated is also easily made uniform. In addition, the endless cathode contact 7 and the contact stripping tank 3
If the configuration is as shown in FIGS. 1 and 3 as described above, the cathode contact 7 is placed close to the front of the plating tank 2 during the above-mentioned operating state, and when the conveying means 4 returns, the conveying means 4 It is separated from the plating tank 2 and the holding jig 5, goes out of the plating tank 2, passes through the contact stripping tank 3, and returns to the plating tank 2. By passing through the contact stripping tank 3, the electrodeposited plating on the cathode contact 7 is removed by the electrolytic stripping solution in the stripping tank 3. At this time, only the cathode contact 7 passes through the stripping tank 3, and the conveyance means 4 and holding jig 5 only move within the plating tank 2, so the amount of plating solution taken out and brought in is extremely small. ing. The stripping solution in the stripping tank 3 is a plating solution or an electrolytic stripping solution containing a plating solution as a component. Therefore, even if the plating solution is brought into the stripping tank 3 through the cathode contact 7, the electrolytic stripping solution, which is the same as the plating solution, will not change in quality, and conversely, bringing the stripping solution into the plating tank 2 will not cause any problems. Furthermore, it is no longer necessary to wash the cathode contact 7 with water after electrolytic stripping. c. Example In order to confirm the effects of the present invention, an experiment was conducted under the following conditions using the entire surface plating apparatus shown in FIGS. 1 to 5 as an example. Plating solution 9:1 solder slott KB bath (manufactured by Maxx Schulator, West Germany), radio wave density 5A/dm 2 , bath temperature 20C, set film thickness value 7 μm, distance between electrodes 40 to 50 mm, IC to be plated
Lead frame (Dip28 pin 220×45mm, Flat84
(pin 188 x 55 mm), shielding plate length 600 mm, time 3.5 minutes (content stop time 35 seconds, each movement time 52.5 seconds),
Film thickness measuring machine Fluorescent X-ray film thickness measuring machine (manufactured by Seiko)
The film thickness of each part of the object to be plated 1 was measured using a model SFT-158. The table below shows a comparison of those plated under the same conditions using the conventional racking method.

【表】【table】

【表】 上表で明らかな如く、本発明により全面メツキ
した場合には、最大膜厚と最小膜厚との差が従来
のラツキング法によるものと比べて、きわめて小
さくなること分かる。 ハ 発明の効果 以上で明らかな如く、本発明の全面メツキ装置
は、次の如き効果を奏する。 a 被メツキ物のメツキ膜厚を均一にできる。 即ち、従来行われていたラツキング法では、
エツジ現象により、被メツキ物の側縁寄りほど
メツキが折出し易く、膜厚が中央部よりも厚く
なり、このメツキ厚のバラツキは、特に高精度
を要求されるICリードフレームやプリント基
板では許容されず、不合格となる場合が多かつ
た。しかし本発明では、上記の如くメツキ槽内
の搬送路両側に、等間隔で陽極用開口部を持つ
遮蔽板を設け、その間を被メツキ物の中央部が
開口部に対応する位置にきた際に、一定時間停
止するよう間欠搬送させてある。それゆえ、被
メツキ物の中央部にもメツキが折出し易く、側
縁部寄りと同様なメツキ膜厚となる。さらに本
発明では陽極を、搬送路両側の陽極用開口部外
側に、保持治具内の被メツキ物両側面と平行状
に設けてあるので、陽極と陰極との極間距離が
短い場合にも、被メツキ物と陽極との最短距離
は、被メツキ物・の高さの各位置で近似する。
それゆえ、被メツキ物・の高さ方向の各位置
で、メツキ膜厚が均一化し易くなつている。し
たがつて本発明では、被メツキ物の全面にわた
つて、ほぼ均一なメツキ膜厚を形成できるもの
である。 b 被メツキ物の長さ・幅その他の形状によつ
て、ラツクの大きさ・陰極接点の位置・形状等
を変えなくてもよいし、また高速メツキ処理が
できる。 即ち、従来のラツキング法では、被メツキ物
の長さ・幅等に応じた専用のラツクおよび接点
を用意し、かつ被メツキ物に応じてそれを交換
する手間がかかり、作業性がよくなかつた。メ
ツキ槽の構造上から、液の高速撹拌が難しく低
電流密度になつていた。 これに対して本発明では、間欠移動している
保持治具へは、被メツキ物を投入して自動的に
係合・保持可能で、被メツキ物の長さ・幅等に
関係なく行える。またメツキ槽内を、被メツキ
物の長手方向(搬送方向)に平行状に、全体的
に撹拌できるので、高速撹拌・高電流密度が可
能となり、メツキの高速化を図ることができ
る。 c なお図示例のメツキ装置のように、無端状陰
極接点のみをメツキ槽の後部から出し、メツキ
液またはメツキ液を成分とする電解剥離液中を
通過する如く循環移動させた場合には、メツキ
槽と接点・治具剥離槽との間の移動時に、メツ
キ液の持ち出し持ち込みをきわめて少なくでき
る。 即ち、従来のラツキング法では、処理液が被
メツキ物とラツクの両方に付着して移動する。
そのため、隣接の処理槽との間で処理液の汲み
出し・持ち込みが多く、非経済的であるととも
にメツキの品質を悪くし、かつ処理時間も長く
している。 それに対して図示例のメツキ装置では、メツ
キ槽から次槽への移動は単に陰極接点だけであ
り、搬送手段や治具はメツキ槽内だけでの循環
移動である。そのためメツキ液の持ち出し・持
ち込みの量はきわめて少ない。また陰極接点に
よるメツキ液の持ち出し・持ち込みも、接点剥
離槽内の剥離液を、メツキ液またはメツキ液を
成分とする電解剥離液としてあると、陰極接点
によりメツキ液が持ち込まれても、メツキ液と
電解剥離液とが同質のため変質がない。したが
つて陰極接点を電解剥離後に水洗する必要がな
いし、経済的であるとともに、メツキの品質が
良くなり、かつ処理時間も短縮できることにな
る。
[Table] As is clear from the above table, when the entire surface is plated according to the present invention, the difference between the maximum film thickness and the minimum film thickness becomes extremely small compared to when the conventional rasping method is used. C. Effects of the Invention As is clear from the above, the entire surface plating device of the present invention has the following effects. a. The thickness of the plating film on the object to be plated can be made uniform. In other words, in the conventional rucking method,
Due to the edge phenomenon, the plating tends to break out closer to the side edges of the plated object, making the film thicker than the center. This variation in plating thickness is particularly acceptable for IC lead frames and printed circuit boards that require high precision. There were many cases where the test was not completed and the test was rejected. However, in the present invention, as described above, shielding plates having anode openings are provided at equal intervals on both sides of the conveyance path in the plating tank, and when the central part of the object to be plated comes to the position corresponding to the openings, , and is transported intermittently so as to stop for a certain period of time. Therefore, plating is likely to occur in the center of the object to be plated, resulting in a plating film thickness similar to that near the side edges. Furthermore, in the present invention, the anodes are provided outside the anode openings on both sides of the conveyance path and parallel to both sides of the object to be plated in the holding jig, so even when the distance between the anode and the cathode is short. The shortest distance between the object to be plated and the anode is approximated at each height of the object to be plated.
Therefore, the thickness of the plating film can be easily made uniform at each position in the height direction of the object to be plated. Therefore, in the present invention, a substantially uniform plating film thickness can be formed over the entire surface of the object to be plated. b. Depending on the length, width, and other shapes of the object to be plated, there is no need to change the size of the rack, the position and shape of the cathode contact, and high-speed plating processing can be performed. In other words, in the conventional racking method, it takes time and effort to prepare special racks and contacts according to the length and width of the object to be plated, and to replace them depending on the object to be plated, resulting in poor workability. . Due to the structure of the plating tank, it was difficult to stir the liquid at high speed, resulting in a low current density. On the other hand, in the present invention, the object to be plated can be thrown into the holding jig which is intermittently moving, and the object to be plated can be automatically engaged and held, regardless of the length, width, etc. of the object to be plated. Furthermore, since the inside of the plating tank can be stirred as a whole parallel to the longitudinal direction (transportation direction) of the objects to be plated, high-speed stirring and high current density are possible, and high-speed plating can be achieved. c In addition, as in the plating device shown in the figure, if only the endless cathode contact is taken out from the rear of the plating tank and circulated through the plating solution or an electrolytic stripping solution containing the plating solution as a component, the plating will not occur. When moving between the tank and the contact/jig stripping tank, the amount of plating liquid carried out can be extremely reduced. That is, in the conventional racking method, the processing liquid adheres to both the object to be plated and the rack and moves.
Therefore, a lot of processing liquid is pumped out and brought in between adjacent processing tanks, which is uneconomical, deteriorates the quality of the plating, and lengthens the processing time. In contrast, in the illustrated plating apparatus, only the cathode contact is moved from one plating tank to the next, and the conveying means and jig are circulated only within the plating tank. Therefore, the amount of Metsuki liquid taken out and brought in is extremely small. In addition, if the stripping solution in the contact stripping tank is a plating solution or an electrolytic stripping solution containing plating solution as a component, even if the plating solution is brought in by the cathode contact, the plating solution will not be removed. There is no deterioration because the and electrolytic stripper are of the same quality. Therefore, there is no need to wash the cathode contact with water after electrolytic stripping, which is economical, improves the quality of plating, and shortens processing time.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明の実施例を示すもので、第1図はメ
ツキ装置の要部の縦断正面図、第2図は遮蔽板と
陽極用開口部と陽極との位置関係を示す一部の斜
視図、第3図は第1図の−断面図、第4図は
被メツキ物が移動時の遮蔽板との位置関係を示す
概略平面図、第5図は被メツキ物が一旦停止時の
陽極用開口部との位置関係を示す概略平面図であ
る。 図面符号、1……被メツキ物、2……メツキ
槽、4……搬送手段、5……保持治具、6……搬
送部分、7……陰極接点、8……搬送路、9……
開口部、10……遮蔽板、11……陽極。
The figures show an embodiment of the present invention, and FIG. 1 is a longitudinal sectional front view of the main parts of the plating device, and FIG. 2 is a partial perspective view showing the positional relationship between the shielding plate, the anode opening, and the anode. , Fig. 3 is a cross-sectional view of Fig. 1, Fig. 4 is a schematic plan view showing the positional relationship with the shielding plate when the object to be plated is moving, and Fig. 5 is a diagram for the anode when the object to be plated is temporarily stopped. FIG. 3 is a schematic plan view showing the positional relationship with the opening. Drawing code, 1... object to be plated, 2... plating tank, 4... conveying means, 5... holding jig, 6... conveying part, 7... cathode contact, 8... conveying path, 9...
Opening, 10...shielding plate, 11... anode.

Claims (1)

【特許請求の範囲】[Claims] 1 メツキ槽2内に、内部を水平状に移動可能な
無端状搬送手段4を設け、該搬送手段4外周に、
被メツキ物1を横長垂直状で保持可能な保持治具
5を連続状に設け、陰極接点7を無端状として、
上記保持治具5上側にある搬送部分6内を共に移
動可能に設け、搬送部分6両側に、その移動方向
に一定間隔で陽極用開口部9,9をもつ遮蔽板1
0,10と、各陽極用開口部9,9外側に被メツ
キ物1両側面へ平行状の陽極11,11とを設
け、かつ上記搬送手段4を、被メツキ物1の長手
方向中央部が遮蔽板10,10の陽極用開口部
9,9位置にきたとき、一定時間停止する間欠運
動可能に設けたことを特徴とする、全面メツキ装
置。
1. In the plating tank 2, an endless conveying means 4 that can move horizontally inside is provided, and on the outer periphery of the conveying means 4,
A holding jig 5 capable of holding the object 1 to be plated in a horizontally long vertical shape is provided continuously, and the cathode contact 7 is endless.
A shielding plate 1 is provided movably within the transport section 6 above the holding jig 5 and has anode openings 9, 9 on both sides of the transport section 6 at regular intervals in the direction of movement.
0 and 10, and parallel anodes 11 and 11 are provided outside the respective anode openings 9 and 9 to both sides of the object to be plated, and the conveying means 4 is connected to the object to be plated so that the central part in the longitudinal direction of the object to be plated is A full-surface plating device characterized in that it is capable of intermittent movement, stopping for a certain period of time when the anode openings 9, 9 of the shielding plates 10, 10 are reached.
JP33043187A 1987-12-25 1987-12-25 Method and device for full plating Granted JPH01172590A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33043187A JPH01172590A (en) 1987-12-25 1987-12-25 Method and device for full plating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33043187A JPH01172590A (en) 1987-12-25 1987-12-25 Method and device for full plating

Publications (2)

Publication Number Publication Date
JPH01172590A JPH01172590A (en) 1989-07-07
JPH0314911B2 true JPH0314911B2 (en) 1991-02-27

Family

ID=18232539

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33043187A Granted JPH01172590A (en) 1987-12-25 1987-12-25 Method and device for full plating

Country Status (1)

Country Link
JP (1) JPH01172590A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06146100A (en) * 1992-11-11 1994-05-27 Sumitomo Metal Mining Co Ltd Partial plating stripping device

Also Published As

Publication number Publication date
JPH01172590A (en) 1989-07-07

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